Search results for "metrology"

showing 10 items of 96 documents

Symmetric logarithmic derivative of Fermionic Gaussian states

2018

In this article we derive a closed form expression for the symmetric logarithmic derivative of Fermionic Gaussian states. This provides a direct way of computing the quantum Fisher Information for Fermionic Gaussian states. Applications ranges from quantum Metrology with thermal states and non-equilibrium steady states with Fermionic many-body systems.

Fermionic Gaussian stateSettore FIS/02 - Fisica Teorica Modelli E Metodi Matematiciquantum geometric informationHigh Energy Physics::LatticeGaussianFOS: Physical sciencesGeneral Physics and Astronomylcsh:Astrophysicsquantum metrology; Fermionic Gaussian state; quantum geometric informationcondensed_matter_physics01 natural sciencesArticle010305 fluids & plasmassymbols.namesakeQuantum mechanicslcsh:QB460-4660103 physical sciencesThermalQuantum metrologyLogarithmic derivativelcsh:Science010306 general physicsMathematical physicsCondensed Matter::Quantum GasesPhysicsQuantum Physicsquantum metrologyQuantum fisher informationlcsh:QC1-999Range (mathematics)symbolslcsh:QClosed-form expressionQuantum Physics (quant-ph)lcsh:Physics
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Hyperspectral Texture Metrology Based on Joint Probability of Spectral and Spatial Distribution

2021

International audience; Texture characterization from the metrological point of view is addressed in order to establish a physically relevant and directly interpretable feature. In this regard, a generic formulation is proposed to simultaneously capture the spectral and spatial complexity in hyperspectral images. The feature, named relative spectral difference occurrence matrix (RSDOM) is thus constructed in a multireference, multidirectional, and multiscale context. As validation, its performance is assessed in three versatile tasks. In texture classification on HyTexiLa, content-based image retrieval (CBIR) on ICONES-HSI, and land cover classification on Salinas, RSDOM registers 98.5% acc…

Hyperspectral imagingbusiness.industryComputer scienceFeature extractionHyperspectral imagingPattern recognitionContext (language use)15. Life on landComputer Graphics and Computer-Aided DesignSupport vector machineGabor filtermetrologyJoint probability distributionFeature (computer vision)[INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV]Artificial intelligencebusinessImage retrievaltextureSoftware
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Roadmap on quantum nanotechnologies

2021

Quantum phenomena are typically observable at length and time scales smaller than those of our everyday experience, often involving individual particles or excitations. The past few decades have seen a revolution in the ability to structure matter at the nanoscale, and experiments at the single particle level have become commonplace. This has opened wide new avenues for exploring and harnessing quantum mechanical effects in condensed matter. These quantum phenomena, in turn, have the potential to revolutionize the way we communicate, compute and probe the nanoscale world. Here, we review developments in key areas of quantum research in light of the nanotechnologies that enable them, with a …

Materials scienceFOS: Physical sciencesBioengineeringnanotekniikka02 engineering and technology01 natural sciencesnanotieteet530quantum computingEveryday experience0103 physical sciencesMesoscale and Nanoscale Physics (cond-mat.mes-hall)Quantum metrologyquantum electrodynamicsGeneral Materials Scienceddc:530kvanttimekaniikkaElectrical and Electronic Engineering010306 general physicsQuantum information sciencekvanttifysiikkaQuantumQuantum tunnellingQuantum computerQuantum PhysicsnanotechnologyCondensed Matter - Mesoscale and Nanoscale PhysicsMechanical EngineeringMacroscopic quantum phenomenaObservableGeneral Chemistry021001 nanoscience & nanotechnology530 PhysikEngineering physicsquantum phenomena3. Good healthMechanics of Materials0210 nano-technologyQuantum Physics (quant-ph)Nanotechnology
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Surface Integrity

2008

This chapter provides comprehensive knowledge regarding the state and properties of both surface and subsurface layers generated during machining processes, including different associated mechanical and thermal influences. Basic models of the superficial layer and factors effecting surface integrity are presented. Decomposition of surface topography into roughness, waviness and form along with appropriate filtering methods is outlined. The characterization of surface roughness based on 2D and 3D roughness parameters as well as motif, fractal and frequency characteristics are presented. In particular, all standardized areal surface parameters are specified, and practical examples are provide…

Materials scienceMachiningWavinessSurface metrologyResidual stressSurface roughnessMechanical engineeringSurface finishStylusSurface integrity
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High Voltage Metrology with Collinear Laser Spectroscopy

2018

We present results of laser spectroscopic high voltage measurements on the 5 ppm relative uncertainty level using a pump and probe scheme on Ca+ ions. With the two-stage laser interaction and with a reference measurement we can eliminate systematic effects like differences in contact potentials of electrode materials, thermo-electric voltages, and the unknown starting potential of the ions in the ion source. Our measurements are compatible with the 5 ppm precision limits of the high voltage dividers used for comparison and demonstrate an unprecedented increase in the accuracy of laser-based high voltage measurements by a factor of 20.

Materials sciencebusiness.industryHigh voltageLaserIon sourcelaw.inventionIonMetrologyReference measurementlawOptoelectronicsbusinessSpectroscopyVoltage2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)
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Projected fringes for the measurement of large aluminum ingots

2010

The method of projected fringes is applied to the measurement of the surface topography of aluminum ingots with surface areas of several square meters. The measurements are performed inside the casting hall of an aluminum factory. To meet the challenges encountered in such a demanding environment, it is important to keep the equipment as simple and robust as possible. Therefore a method for locating the fringe positions with sub-pixel accuracy without using for example phase shifting techniques is applied. Also the nonlinearity of the phase when using divergent illumination is discussed. The developed measuring system is tested measuring eight different aluminum ingots, and the results agre…

Measurement methodMaterials sciencebusiness.industryApplied MathematicsPhase (waves)chemistry.chemical_elementSquare (algebra)Structured-light 3D scannerOpticschemistryAluminiumCasting (metalworking)Optical metrologybusinessInstrumentationEngineering (miscellaneous)Measurement Science and Technology
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Краткое обозрѣніе системы мѣръ и денегъ въ Китаѣ

1909

Отдельный оттиск из 2-го выпуска XXIX тома Известий Восточного Института

Metroloģija - ĶīnaМетрология - КитайSvari un mēri - ĶīnaДеньги - КитайMetrology - ChinaMoney - ChinaGeldwesen in ChinaВеса и меры - КитайWeights and measures - ChinaGrāmatas ekonomikas vēsturē:SOCIAL SCIENCES::Business and economics::Economics [Research Subject Categories]Nauda - ĶīnaВосточный институт (Владивосток Россия)Metrologie in China
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Micro-Machining

2017

This chapter provides comprehensive knowledge regarding the fabrication of micro-products and element of micro-electromechanical systems using various techniques and processes. Both well-established techniques such as micro-machining and new trends in improving micro-processes taking into account EDM, laser, FIB, LIGA and DRIE processes are overviewed. The background of micro-machining processes, including typical machining operations such as turning, milling and drilling and different construction materials, is outlined. Moreover, a special focus was made on new constructions, control systems and effective applications of micro-machining techniques. In addition, the focus was directed towa…

Microelectromechanical systemsFocus (computing)010504 meteorology & atmospheric sciencesComputer scienceSystem of measurementDiamond turning01 natural sciencesManufacturing engineering010305 fluids & plasmasMetrologyMachiningControl system0103 physical sciencesLIGA0105 earth and related environmental sciences
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Nanomanufacturing/Nanotechnology

2017

This chapter provides comprehensive knowledge regarding the fabrication of nanoproducts and element of micro-electromechanical systems using various techniques and processes. Both well-established techniques, such as nanomachining (ultra-precision) and new trends in improving nanoprocesses taking into account AFM, laser beam machining, electron beam machining processes are overviewed. The background of nanomachining processes, including typical machining operations such as turning, milling and grinding and different construction materials (metallic and nonmetallic), is outlined. The physical mechanisms responsible for the transition from brittle to ductile regime machining are explained. Mo…

Microelectromechanical systemsNanomanufacturingElectron beam machiningNanometrologyMachiningComputer scienceSystem of measurementLaser beam machiningMechanical engineeringGrinding
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Geometric quality and appearance of surfaces : local and global approaches

2012

Accounting for customers' perception of manufactured goods has become a major challenge for the industry. This process is to be established from early design to retail. Customers are nowadays more aware and detail oriented about perceived quality of products. This allows one to set not only an estimated price but also the expected quality of the product. Surface appearance analysis has therefore become a key industrial issue. Two approaches are proposed here to formalize the detection methodology and provide objective criteria for experts to evaluate surface anomalies. The first proposed approach is based on surface metrology. It consists in analyzing the measured topologies in order to bin…

Modal decomposition[SPI.OTHER]Engineering Sciences [physics]/OtherAppearance qualityQualité d'AspectMétrologie de surfacePoints aberrantsSurface MetrologyQualité d’aspectOutliers identificationDiscrete Modal DecompositionPolynomial Texture MappingsDécomposition Modale[SPI.MECA.GEME] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]
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