Search results for "near-field"

showing 10 items of 101 documents

Extraordinary tuning of a nanocavity by a near-field probe

2011

Abstract We report here an experimental observation of an extraordinary near-field interaction between a local probe and a small-volume solid-state nanocavity. We directly compare the normally observed near-field interaction regime driven by the perturbation theory and then report the extraordinary interaction regime. Subsequently, we show that the cavity can take up to 2 min to recover from this interaction after removing the probe and that leads to an extraordinary blue-shift of the cavity resonance wavelength (∼15 nm) which depends on the probe motion above the cavity and not the position. The reasons for this effect are not fully understood yet but we try to give some explanations.

Anomalous regimeSilicon photonicsPhysics::OpticsNear and far fieldNear-field opticsTuningPhotonic crystalsOpticsPosition (vector)Atomic and Molecular PhysicsElectronicNanotechnologyOptical and Magnetic MaterialsPerturbation theoryExtraordinary regimeElectrical and Electronic EngineeringOptomechanicsComputingMilieux_MISCELLANEOUSPhotonic crystalPhysicsSilicon photonicsbusiness.industryNear-field opticsCondensed Matter PhysicsAtomic and Molecular Physics and OpticsOptomechanicsElectronic Optical and Magnetic MaterialsWavelengthHardware and ArchitectureQuantum electrodynamicsAnomalous regime; Extraordinary regime; Microcavity; Nanotechnology; Near-field optics; Optomechanics; Photonic crystals; Silicon photonics; Tuning; Electronic Optical and Magnetic Materials; Atomic and Molecular Physics and Optics; Condensed Matter Physics; Hardware and Architecture; Electrical and Electronic Engineeringand OpticsbusinessMicrocavity
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Pas de titre en anglais

2010

Within the quick nano-fabrication techniques evolution and the increasing needs in low space and energy opto-electronic functions on-chip integration, studies and control of electromagnetic resonances of sub-micrometric objects are crucial issues. One aim of this work was then to improve our knowledge of the light-matter interaction. To this end, optical near-field experiments and complementary numerical development of models have been performed to study electromagnetic resonances due to light-matter interaction in sub-micrometric resonators. As an introduction, the first part of the manuscript presents the main phenomena involved in near-field optical microscopy and the used SNOM operation…

Bistability modulationPlasmoniqueRésonanceNon-linear effectsEffets non-linéairesModulation de bistabilité[ PHYS.COND.CM-GEN ] Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other]Brewster anglePlasmonicMicro-cavityPassive and active near-field optic (SNOM)Modes propresMicro-cavitésChamp proche optique passif et actif (SNOM)Angle de Brewster[PHYS.COND.CM-GEN] Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other][PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other]Film minceThin filmEigenmodes
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Towards the origin of the shear force in near-field microscopy

2001

The shear force from a gold or a graphite sample acting on an approaching near-field optical probe is studied in detail. The adiabatic and dissipative contributions to the force are clearly distinguished by monitoring the amplitude as well as the phase of the tip vibration when the tip approaches the surfaces. We also take into account that not only the damping and the resonance frequency but also the mass of the system changes when the tip approaches the surface. The relative strength of the contributions to the force varies differently but characteristically with the distance of the two samples, starting at a much larger distance in the case of graphite. The adiabatic contribution is lar…

Condensed matter physicsbusiness.industryChemistryElectrostatic force microscopeShear forceGeneral EngineeringGeneral Physics and AstronomyAtomic force acoustic microscopyConductive atomic force microscopyOpticsAmplitudeNear-field scanning optical microscopeAdiabatic processbusinessNon-contact atomic force microscopy
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Theoretical study of an absorbing sample in infrared near-field spectromicroscopy

2004

Abstract This paper is devoted to study the near-field spectrometry in the infrared spectral range. To understand the behavior of the infrared light diffracted by an object, numerical calculations have been carried out with Fourier Modale (FM) method within R-matrix algorithm. We consider the case of three-dimensional system including a translational symmetry in one direction, where is included an homogenous layer in which is buried an absorbing object. Using an optical near-field analysis and by calculating the electric field intensity distribution, both of the thickness effect and the lateral size of the absorbing sample are investigated. It is found that the distribution of the intensity…

DiffractionMaterials scienceInfraredbusiness.industryNear-field opticsNear and far fieldAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsOpticsDistortionElectric fieldNear-field scanning optical microscopeElectrical and Electronic EngineeringPhysical and Theoretical ChemistrybusinessAbsorption (electromagnetic radiation)Optics Communications
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SNOM study of ferroelectric domains in doped LiNbO3 crystals

2009

Abstract This work shows a study of the periodic ferroelectric domains formed in LiNbO3 crystals doped with rare earths by means of scanning near field optical microscopy (SNOM) technique. It has been observed periodic structures associated with ferroelectric domains with an unexpected high value of the optical contrast working under reflectance SNOM mode. From Raman-Nath diffraction patterns, a refractive index modulation of Δ n ∼ 1 0 − 4 has been calculated. These results were correlated with the ferroelectric periodic domains obtained by the SNOM technique. A light waveguide effects along the ferroelectric domains is suggested to explain the high reflectance contrast observed in SNOM exp…

DiffractionMaterials scienceOptical contrastbusiness.industryDopingNear and far fieldWaveguide (optics)Ferroelectricitylaw.inventionOpticsOptical microscopelawOptoelectronicsNear-field scanning optical microscopebusinessPhysics Procedia
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Visible light apparatus for preliminary tests of x-ray optics

2006

We report a useful visible light testing procedure for a first analysis of soft X-ray grazing incidence optics (0.1-2 keV). Although diffraction is a limit in the application of this method, great advantages are obtained by running the tests in air with direct access to modify the geometrical mounting of the individual mirror shells. We present the experimental apparatus and show the first results of the investigation of light weight optics based on plastic foil material and comparison with results obtained with an X-ray beam.

DiffractionPhysicsbusiness.industryNear-field opticsX-ray opticsLaserlaw.inventionOpticslawOptoelectronicsBeam expandergrazing incident optics laser beam expander soft x-ray test in visible lightbusinessFOIL methodBeam (structure)Visible spectrumSPIE Proceedings
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Electromagnetic Singularities and Resonances in Near-Field Optical Probes

2007

Over the last two decades scanning near-field optical microscopy (SNOM) has demonstrated its ability to provide optical resolution significantly better than the diffraction limit (<20 nm). The general principle of SNOM relies on the approach of a nanometer-sized object in the optical near-field of a sample to be studied. This nano-object (NO) is usually the extremity of a probe. Regardless of the nature of the observed SNOM signal (inelastic scattering, fluorescence, etc.), the detection of the light is achieved in the far-field regime where the NO acts as a mediator between the optical near-field and the detector. Figure 1 is a schematic illustration of the SNOM principle.

DiffractionPhysicsbusiness.industryResolution (electron density)DetectorPhysics::OpticsNear and far fieldInelastic scatteringlaw.inventionOpticsOptical microscopelawNear-field scanning optical microscopeScanning tunneling microscopebusiness
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Determinant role of the edges in defining surface plasmon propagation in stripe waveguides and tapered concentrators

2012

International audience; In this paper, we experimentally show the effect of waveguide discontinuity on the propagation of the surface plasmon in metal stripes and tapered terminations. Dual-plane leakage microscopy and near-field microscopy were performed on Au stripes with varied widths to imag29e the surface plasmon intensity distribution in real and reciprocal spaces. We unambiguously demonstrate that edge diffraction is the limiting process determining the cutoff conditions of the surface plasmon mode. Finally, we determine the optimal tapered geometry leading to the highest transmission.

DiffractionTotal internal reflectionMaterials sciencebusiness.industrySurface plasmonNanophotonicsPhysics::OpticsStatistical and Nonlinear Physics02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesSurface plasmon polaritonAtomic and Molecular Physics and Opticslaw.inventionOpticslaw0103 physical sciencesNear-field scanning optical microscope[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics010306 general physics0210 nano-technologybusinessWaveguideLocalized surface plasmon
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Sub-wavelength imaging of light confinement and propagation in SOI based photonic crystal devices

2006

A light source is coupled into photonic crystal devices and a near field optical probe is used to observe the electromagnetic field propagation and distribution at a sub-wavelength scale. Bloch modes are clearly observed.

Electromagnetic fieldMaterials sciencebusiness.industryPhotonic integrated circuitNear-field opticsFinite-difference time-domain methodPhysics::OpticsSilicon on insulatorNear and far fieldOpticsOptoelectronicsNear-field scanning optical microscopebusinessPhotonic crystal
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Computation of the field diffracted by a local surface defect: application to tip–sample interaction in the photon scanning tunneling microscope

1996

We use a method based on the Fourier transform of the electromagnetic field to compute the field diffracted by a local deformation of a plane boundary surface. We give a complete development of each step of the technique. To show the interaction that exists between the probe of a near-field optical microscope and the observed sample, we use the model of a truncated cone-shaped tip above a rectangular surface defect. We compute the electrical intensity along a line located between the tip and the local surface defect. We show the influence of the polarization of the incident wave and the effect of the position of the tip with respect to the position of the surface defect.

Electromagnetic fieldPhysicsDiffractionPhotonbusiness.industryPolarization (waves)Atomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsMagnetic fieldlaw.inventionsymbols.namesakeOpticsFourier transformlawsymbolsNear-field scanning optical microscopeComputer Vision and Pattern RecognitionScanning tunneling microscopebusinessJournal of the Optical Society of America A
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