Search results for "near-field"
showing 10 items of 101 documents
Coupling evanescently low loss Silicon-on-insulator (SOI) ridge waveguides(WGs) including high Q nanocavities: For light control
2011
We have fabricated a multislotted optical nanoresonator with several spatial field distributions which are all addressable by the wavelength. The reported structure consists in an array of evanescently coupled single mode photonic crystal nanocavities. By using a scanning near-field optical microscope, we quantify the morphology of the different optical mode volumes and show that they consist in grids of light confined at the subwavelength scaleOver the last recent years, optical microcavities have proven their ability to slow down, control and even trap light inside an ultra small volume. Several approaches have led to quality factor (Q) records allowing to reach high photon life-time for …
Surface plasmon circuitry in opto-electronics
2012
This tutorial reviews the physics of surface plasmon circuitry in order to bring to the fore recently demonstrated applications of surface plasmon in optoelectronics such as on-board optical interconnects or routing in datacom networks.
<title>Study of color centers in optical fibers to be used for ITER plasma diagnostics</title>
2007
ABSTRACT The paper presents a comparative study, by off-line measurements of the irradiation induced optical attenuation in several large diameter (600 µm) optical fibers subjected to gamma-rays and neutron irradiation. The optical fiber samples fall into two categories: optical fibers with an enhanced UV transmission (high OH content core) and solarization resistant optical fibers. The irradiation conditions were as follows: a) gamma irradiation at a 60 Co source, with a dose rate of 0.33 kGy/h +/- 5%, up to the maximum total irradiation dose of 313 kGy; b) neutron irradiation (mean energy 5.2 MeV) using a deuteron beam (13 MeV) and a thick beryllium target, for a total fluence of 6x10 12 …
Observation of Light Confinement Effects with a Near-Field Optical Microscope.
1996
This Letter reports the experimental observation of light confinement effects by near-field optical microscopy. Depolarization effects giving rise to light confinement close to nanoscopic objects have been unambiguously observed in near-field optical images of subwavelength dielectric pads etched on a flat glass substrate. According to the incident polarization, this phenomenon leads to reverse contrasts in the near-field optical image of the same subwavelength objects.
Contribution à l'étude de la formation des images optiques en microscopie champ proche optique: effet de la sonde en deux dimensions
2004
This work consists in the development of a theoretical tool for the purpose to undertake numerical simulations able to take into account the coupling between the probe and the object. The first part, concerns the combination of the differential method and the algorithms T and S, to overcome numerical problems which appear in the cases where the size of system (probe - object) is more realistic. The developed global model is two-dimensional and applied in polarization TE under the normal diffraction condition. We have used the developed model to study the formation of optical image by monomodes and multimodes probes. The obtained optical images at constant height, have allowed us to study th…
Scanning optical microscopy modeling in nanoplasmonics
2012
International audience; One of the main purposes of nanoplasmonics is the miniaturization of optical and electro-optical components that could be integrable in coplanar geometry. In this context, we propose a numerical model of a polarized scanning optical microscope able to faithfully reproduce both photon luminescence and temperature distribution images associated with complex plasmonic structures. The images are computed, pixel by pixel, through a complete self-consistent scheme based on the Green dyadic functions (GDF) formalism. The basic principle consists in the numerical implementation of a realistic three-dimensional light beam acting as a virtual light tip able to probe the volume…
Resolution enhancement in quantitative phase microscopy
2019
Quantitative phase microscopy (QPM), a technique combining phase imaging and microscopy, enables visualization of the 3D topography in reflective samples, as well as the inner structure or refractive index distribution of transparent and translucent samples. Similar to other imaging modalities, QPM is constrained by the conflict between numerical aperture (NA) and field of view (FOV): an imaging system with a low NA has to be employed to maintain a large FOV. This fact severely limits the resolution in QPM up to 0.82λ/NA, λ being the illumination wavelength. Consequently, finer structures of samples cannot be resolved by using modest NA objectives in QPM. Aimed to that, many approaches, suc…
Diffractive optics for processing ultrashort light pulses
2011
In this work we combine, in principle, two disjoint optical fields, diffractive optics and ultrashort light radiation. This combination allows us to manipulate in a very unconventional manner femtosecond pulses and, on the other hand, to implement a set of novel applications. In our case we have focused our attention on material processing and biophotonics applications.
Analysis of the imaging method for assessment of the smile of laser diode bars.
2009
We study imaging systems designed to assess the smile of laser diode bars (LDBs). The magnification matrix is derived from the required sampling period and the geometries of the LDBs and the charge-coupled device (CCD) array. These image-forming systems present in-plane pure translation invariance, but in the case of anamorphic ones, lack in-plane rotation invariance. It is shown that the smile parameters of the image of the LDB are linked with the smile parameters of the LDB by simple mathematical expressions. The spatial resolution of such optical systems is estimated at approximately 1 microm for a mean wavelength of lambda approximately 800 nm. Our results suggest that, with the current…
Applications of near-field optics to the characterization of optoelectronics components
1997
In the race towards purely optical communications, the necessity of producing integrated components is linked to the requirement for the precise characteriza-tion of optoelectronic components. Near-field detection techniques meet this requirement, AFM (Atomic Force Microscopy), for instance, can provide the topography of a given sample. In conjunction with these new tools, several different kinds of near-field optical microscopes (NFOM) have appeared. They enable the characteriza-tion of the components with a resolution better than that imposed by the Rayleigh criterion. This is primarily due to the fact that they are sensitive to the evanescent waves. This document presents several areas r…