Search results for "substrate"

showing 10 items of 1018 documents

Raman signal reveals the rhombohedral crystallographic structure in ultra-thin layers of bismuth thermally evaporated on amorphous substrate

2021

Under the challenge of growing a single bilayer of Bi oriented in the (111) crystallographic direction over amorphous substrates, we have studied different thicknesses of Bi thermally evaporated onto silicon oxide in order to shed light on the dominant atomic structures and their oxidation. We have employed atomic force microscope, X-ray diffraction, and scanning electron microscope approaches to demonstrate that Bi is crystalline and oriented in the (111) direction for thicknesses over 20 nm. Surprisingly, Raman spectroscopy indicates that the rhombohedral structure is preserved even for ultra-thin layers of Bi, down to $\sim 5$ nm. Moreover, the signals also reveal that bismuth films expo…

Materials scienceXRDFOS: Physical scienceschemistry.chemical_element02 engineering and technologySubstrate (electronics)Crystal structure01 natural sciencesBismuthsymbols.namesakeFísica AplicadaMesoscale and Nanoscale Physics (cond-mat.mes-hall)0103 physical sciencesGeneral Materials Science010306 general physicsRamanCondensed Matter - Materials ScienceThin layersCondensed Matter - Mesoscale and Nanoscale PhysicsMechanical EngineeringThermal evaporationMaterials Science (cond-mat.mtrl-sci)Trigonal crystal system021001 nanoscience & nanotechnologyCondensed Matter PhysicsEngineering physicsAmorphous solidchemistryMechanics of MaterialsBisymbolsChristian ministry0210 nano-technologyRaman spectroscopyUltra-thin layer
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Deposition and characterization of ZnO thin films on GaAs and Pt/GaAs substrates

2020

Abstract This work reports the deposition and characterization of piezoelectric ZnO thin films on semi-insulating GaAs substrates for the fabrication of bulk acoustic waves sensors. ZnO films are deposited at 350 °C and low deposition rate using reactive radio frequency magnetron sputtering. The use of a Pt bottom electrode, between ZnO and GaAs, with and without Ti buffer layer, as well as the effect of the substrate crystallographic orientation are investigated. The characterization of the deposited films is performed to determine the optimal parameters for obtaining high-quality films and ZnO residual conductivity. ZnO films are textured along the c-axis for all GaAs cuts. The highest st…

Materials sciencebusiness.industry02 engineering and technologySubstrate (electronics)Conductivity010402 general chemistry021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciences0104 chemical sciencesResidual stressSurface roughnessOptoelectronicsGeneral Materials ScienceTexture (crystalline)Thin film0210 nano-technologybusinessLayer (electronics)Deposition (law)Materials Chemistry and Physics
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Epitaxial thin films of intermetallic compounds

2002

Publisher Summary The potential of epitaxial thin films of intermetallic compounds in basic and applied research is emerging. Although the growth of semiconductor heterostructures and compounds based on molecular beam epitaxy (MBE) and related methods has come through a 30-year history of ongoing refinement and sophistication, still much has to be learned concerning the growth and characterization of even moderately complex metallic thin film structures. MBE represents a well-defined crystallization technique based on the reactions among molecular or atomic beams of the constituent elements on a substrate or template at elevated temperatures in an ultrahigh vacuum (UHV) environment. Owing t…

Materials sciencebusiness.industryAlloyIntermetallicNanotechnologySubstrate (electronics)engineering.materialEpitaxySemiconductorElectron diffractionengineeringOptoelectronicsThin filmbusinessMolecular beam epitaxy
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Wearable Amplifier-Photodetector System Based on PMMA/Perovskite Waveguides Integrated on a Wearable Nanocellulose Substrate

2018

Materials sciencebusiness.industryAmplifierOptoelectronicsWearable computerPhotodetectorSubstrate (printing)businessPerovskite (structure)NanocelluloseProceedings of the nanoGe Fall Meeting 2018
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Origin of the substrate current after soft-breakdown in thin oxide n-MOSFETs

1999

In this paper is presented an experimental investigation on the origin of the substrate current after soft-breakdown in n-MOSFETs with 4.5 nm-thick oxide. At lower voltages this current shows a plateau that can be explained with the generation of hole-electron pairs in the space charge region and at the Si-SiO2 interface, and to carrier diffusion between the channel and the substrate. At higher voltages the substrate current steeply increases with voltage, due to trap-assisted tunneling from the substrate valence band to the gate conduction band, which becomes possible for gate voltages higher than the threshold voltage. Measurements on several devices at dark and in the presence of light, …

Materials sciencebusiness.industryAnalytical chemistryTime-dependent gate oxide breakdownSubstrate (electronics)Condensed Matter::Mesoscopic Systems and Quantum Hall EffectSpace chargeSettore ING-INF/01 - ElettronicaThreshold voltageEngineering (all)Depletion regionMOSFETOptoelectronicsElectric currentbusinessVoltage
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Optical properties of thin metal films with nanohole arrays on porous alumina–aluminum structures

2015

A multilayer system is formed by the deposition of a 10–35 nm thin Au or Ag film with 18–25 nm diameter holes on 75–280 nm thick layers of porous anodized aluminum oxide (AAO) supported by a bulk sheet of aluminum. We present a detailed study of system parameters, which influence the optical response, including the porosity, metal layer thickness and crystallographic orientation of the Al substrate. The spectral properties are mainly governed by the interference of the reflections from the Al substrate and the thin metal film separated by the AAO layer. An enhanced plasmonic attenuation component near 650 nm for the Au films with holes can be observed when the interferometric anti-reflectio…

Materials sciencebusiness.industryAnodizingGeneral Chemical EngineeringOxidechemistry.chemical_elementNanotechnologyGeneral ChemistrySubstrate (electronics)chemistry.chemical_compoundchemistryAluminiumOptoelectronicsPorositybusinessLayer (electronics)Deposition (law)PlasmonRSC Advances
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Seedless assembly of colloidal crystals by inverted micro-fluidic pumping

2018

We propose a simple seedless approach to assemble millimeter sized monolayer single colloidal crystals with desired orientations at predetermined locations on an unstructured charged substrate. This approach utilizes the millimeter-ranged fluid flow on the bottom glass substrate induced by an ion exchange resin (IEX) fixed on top of the closed sample cell. This fluid flow increases with decreasing height of the sample cell and increasing radius R of the IEX. For a single inverted pump, millimeter sized monolayer single crystals of hexagonal close packing can be obtained. For two closely spaced (D ~ 4R) pumps, the formed crystals have a predefined orientation along the line connecting the tw…

Materials sciencebusiness.industryClose-packing of equal spheresFOS: Physical sciences02 engineering and technologyGeneral ChemistrySubstrate (electronics)RadiusCondensed Matter - Soft Condensed MatterColloidal crystal010402 general chemistry021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciences0104 chemical sciencesMonolayerFluid dynamicsSoft Condensed Matter (cond-mat.soft)OptoelectronicsMillimeter0210 nano-technologybusinessIon-exchange resinSoft Matter
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23.1: Invited Paper: Models and Experiments of Mechanical Integrity for Flexible Displays

2008

Flexible displays present a challenging problem in terms of mechanical integrity, a result of the considerable hygro-thermo-mechanical contrast between the inorganic, brittle device layers and the compliant polymer substrates. This paper reviews the main approaches to study and identify the key factors, which control the mechanical stability of this class of displays. Focus is put on the analyses of residual stress and damage under tensile loading. Novel electro-mechanical methods are used for accurate insight into critical phenomena. An important result is that the thickness and stiffness of the substrate control the critical strain for failure of the device layers.

Materials sciencebusiness.industryCritical phenomenaMechanical integrityStiffnessStructural engineeringSubstrate (printing)BrittlenessResidual stressFlexible displayUltimate tensile strengthmedicinemedicine.symptombusinessSID Symposium Digest of Technical Papers
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2021

Gold-assisted mechanical exfoliation currently represents a promising method to separate ultralarge (centimeter scale) transition metal dichalcogenide (TMD) monolayers (1L) with excellent electronic and optical properties from the parent van der Waals (vdW) crystals. The strong interaction between Au and chalcogen atoms is key to achieving this nearly perfect 1L exfoliation yield. On the other hand, it may significantly affect the doping and strain of 1L TMDs in contact with Au. In this paper, we systematically investigated the morphology, strain, doping, and electrical properties of large area 1L MoS2 exfoliated on ultraflat Au films (0.16-0.21 nm roughness) and finally transferred to an i…

Materials sciencebusiness.industryDopingHeterojunction02 engineering and technologySubstrate (electronics)Conductive atomic force microscopy010402 general chemistry021001 nanoscience & nanotechnology01 natural sciencesExfoliation joint0104 chemical sciencessymbols.namesakeMonolayersymbolsOptoelectronicsGeneral Materials ScienceElectrical measurements0210 nano-technologyRaman spectroscopybusinessACS Applied Materials & Interfaces
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Inspection of EUVL mask blank defects and patterned masks using EUV photoemission electron microscopy

2008

We report on recent developments of an "at-wavelength" full-field imaging technique for inspection of multilayer mask blank defects and patterned mask samples for extreme ultraviolet lithography (EUVL) by EUV photoemission electron microscopy (EUV-PEEM). A bump-type line defect with a width of approximately 35nm that is buried beneath Mo/Si multilayer has been detected clearly, and first inspection results obtained from a patterned TaN absorber EUVL mask sample is reported. Different image contrast of a similar width of multilayer-covered substrate line defect and on top TaN absorber square has been observed in the EUV-PEEM images, and origin of the difference in their EUV-PEEM image contra…

Materials sciencebusiness.industryExtreme ultraviolet lithographySubstrate (electronics)Condensed Matter PhysicsBlankAtomic and Molecular Physics and OpticsImage contrastSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionPhotoemission electron microscopyOpticslawOptoelectronicsElectrical and Electronic EngineeringPhotolithographyElectron microscopebusinessLine (formation)Microelectronic Engineering
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