Search results for "thin film"

showing 10 items of 1200 documents

Mechanical and optical properties of as-grown and thermally annealed titanium dioxide from titanium tetrachloride and water by atomic layer deposition

2021

Funding Information: This work was carried out within the MECHALD project funded by Business Finland (Tekes) and is linked to the Finnish Centers of Excellence in Atomic Layer Deposition (ref. 251220) and Nuclear and Accelerator Based Physics (refs. 213503 and 251353) of the Academy of Finland. Funding Information: This work was carried out within the MECHALD project funded by Business Finland (Tekes) and is linked to the Finnish Centers of Excellence in Atomic Layer Deposition (ref. 251220 ) and Nuclear and Accelerator Based Physics (refs. 213503 and 251353 ) of the Academy of Finland. Publisher Copyright: © 2021 The use of thin-films made by atomic layer deposition (ALD) is increasing in …

optical propertiesMaterials scienceAnnealing (metallurgy)elastic modulusresidual stress02 engineering and technologyoptiset ominaisuudet01 natural sciencesStress (mechanics)Atomic layer depositionResidual stressTiO0103 physical sciencesMaterials ChemistryTiO2Composite materialThin filmElastic modulus010302 applied physicsMetals and AlloysSurfaces and Interfacesatomikerroskasvatus021001 nanoscience & nanotechnologyhardnessSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialsfysikaaliset ominaisuudetAtomic Layer DepositionALDatomic layer depositionohutkalvot0210 nano-technologytitaanidioksidiRefractive indexLayer (electronics)
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Synthesis, Optical, and Morphological Studies of ZnO Powders and Thin Films Fabricated by Wet Chemical Methods

2020

Zinc oxide nanoparticles were prepared from Zn5(CO3)2(OH)6 precursor, capped with poly(vinylpyrrolidone) (PVP), and annealed at 600 &deg

optical propertiesMaterials scienceScanning electron microscopeAnalytical chemistryNanoparticleInfrared spectroscopy02 engineering and technology010402 general chemistrylcsh:Technology01 natural sciencesArticlesymbols.namesakeMicroscopyGeneral Materials ScienceThin filmlcsh:MicroscopyThermal analysisComputingMilieux_MISCELLANEOUSlcsh:QC120-168.85[PHYS]Physics [physics][PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]lcsh:QH201-278.5lcsh:T021001 nanoscience & nanotechnology0104 chemical scienceswet chemical methodsthin filmspoly(vinylpyrrolidone)lcsh:TA1-2040Transmission electron microscopyZnOsymbolsnanoparticleslcsh:Descriptive and experimental mechanics[PHYS.PHYS.PHYS-CHEM-PH]Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph]lcsh:Electrical engineering. Electronics. Nuclear engineeringlcsh:Engineering (General). Civil engineering (General)0210 nano-technologyRaman spectroscopylcsh:TK1-9971poly(vinylpyrrolidone) optical propertiesMaterials
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Evolution of microstructure and related optical properties of ZnO grown by atomic layer deposition.

2013

A study of transmittance and photoluminescence spectra on the growth of oxygen-rich ultra-thin ZnO films prepared by atomic layer deposition is reported. The structural transition from an amorphous to a polycrystalline state is observed upon increasing the thickness. The unusual behavior of the energy gap with thickness reflected by optical properties is attributed to the improvement of the crystalline structure resulting from a decreasing concentration of point defects at the growth of grains. The spectra of UV and visible photoluminescence emissions correspond to transitions near the band-edge and defect-related transitions. Additional emissions were observed from band-tail states near th…

optical propertiesPhotoluminescenceMaterials scienceBand gapGeneral Physics and AstronomyNanotechnology02 engineering and technologylcsh:Chemical technology010402 general chemistrylcsh:Technology01 natural sciencesFull Research PaperAtomic layer depositionCondensed Matter::Materials ScienceTransmittance[CHIM]Chemical SciencesNanotechnologylcsh:TP1-1185General Materials ScienceElectrical and Electronic EngineeringThin filmlcsh:ScienceComputingMilieux_MISCELLANEOUSlcsh:Tbusiness.industry021001 nanoscience & nanotechnologyMicrostructurelcsh:QC1-9990104 chemical sciencesAmorphous solidNanosciencethin filmsatomic layer depositionZnOOptoelectronicslcsh:QphotoluminescenceCrystallite0210 nano-technologybusinesslcsh:PhysicsBeilstein journal of nanotechnology
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High pentacene transistor performance by engeneering morphology of solution processed thin films

2010

organic electronics thin film transistorsSettore CHIM/02 - Chimica Fisica
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Asymmetric hysteresis for probing Dzyalohsinskii-Moriya interaction

2016

The interfacial Dzyaloshinskii-Moriya interaction (DMI) is intimately related to the prospect of superior domain-wall dynamics and the formation of magnetic skyrmions. Although some experimental efforts have been recently proposed to quantify these interactions and the underlying physics, it is still far from trivial to address the interfacial DMI. Inspired by the reported tilt of the magnetization of the side edge of a thin film structure, we here present a quasi-static, straightforward measurement tool. By using laterally asymmetric triangular-shaped microstructures, it is demonstrated that interfacial DMI combined with an in-plane magnetic field yields a unique and significant shift in m…

perpendicular magnetic anisotropyNucleationFOS: Physical sciencesBioengineering02 engineering and technology01 natural sciencesMagnetization0103 physical sciencesMesoscale and Nanoscale Physics (cond-mat.mes-hall)General Materials Sciencechiral magnetThin film010306 general physicsPhysicsDzyaloshinskii-Moriya interactionspintronicsCondensed Matter - Materials ScienceCondensed Matter - Mesoscale and Nanoscale PhysicsSpintronicsCondensed matter physicsMechanical EngineeringSkyrmionMaterials Science (cond-mat.mtrl-sci)General Chemistry021001 nanoscience & nanotechnologyCondensed Matter PhysicsMagnetic hysteresisMagnetic fieldHysteresisnanomagnetism0210 nano-technologyasymmetric hysteresis loopNano Letters
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Thin Film CIGS Solar Cells, Photovoltaic Modules, and the Problems of Modeling

2013

Starting from the results regarding a nonvacuum technique to fabricate CIGS thin films for solar cells by means of single-step electrodeposition, we focus on the methodological problems of modeling at cell structure and photovoltaic module levels. As a matter of fact, electrodeposition is known as a practical alternative to costly vacuum-based technologies for semiconductor processing in the photovoltaic device sector, but it can lead to quite different structural and electrical properties. For this reason, a greater effort is required to ensure that the perspectives of the electrical engineer and the material scientist are given an opportunity for a closer comparison and a common language.…

photovoltaic moduleArticle SubjectComputer sciencelcsh:TJ807-830CIGS solar celllcsh:Renewable energy sourcessolar energyNanotechnologySettore ING-IND/32 - Convertitori Macchine E Azionamenti ElettriciSettore ING-INF/01 - ElettronicamodellingGeneral Materials ScienceThin filmThin-film solar cellRenewable Energy Sustainability and the Environmentbusiness.industryPhotovoltaic systemSettore ING-INF/02 - Campi ElettromagneticiGeneral ChemistrysimulationEngineering physicsCopper indium gallium selenide solar cellsAtomic and Molecular Physics and OpticsSemiconductorThin-film solar cells; CIGS solar cells; modelling; simulations; photonic structures; photovoltaic modules; solar energyCell structurephotonic structurebusiness
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CulnSe2/Zn(S,O,OH) junction on Mo foil by electrochemical and chemical route for photovoltaic applications

2014

Electrodeposition is a convenient technique for the development of low cost materials for photovoltaic (PV) device processing. Using a single step electrodeposition route, several groups have fabricated CIS (CuInSe) and CIGS (CuInGaSe) films [1]. One of the most important requirements for successful application of one-step electrodeposition film formation, is the ability to control composition of the deposited films and to develop polycrystalline microstructures with a low surface roughness and high sintered density. In this preliminary work, CIS films were produced by single bath electrodeposition finding the optimal conditions in order to achieve a dense film with high crystallinity and u…

photovoltaicSSettore ING-IND/23 - Chimica Fisica ApplicataElectrodepositionSolar CellSettore ING-INF/02 - Campi ElettromagneticiThin FilmCulnSe2Settore ING-INF/01 - ElettronicaMo foil
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Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon

2016

The scratch test method is widely used for adhesion evaluation of thin films and coatings. Usual critical load criteria designed for scratch testing of coatings were not applicable to thin atomic layer deposition (ALD) films on silicon wafers. Thus, the bases for critical load evaluation were established and the critical loads suitable for ALD coating adhesion evaluation on silicon wafers were determined in this paper as LCSi1, LCSi2, LCALD1, and LCALD2, representing the failure points of the silicon substrate and the coating delamination points of the ALD coating. The adhesion performance of the ALD Al2O3, TiO2, TiN, and TaCN+Ru coatings with a thickness range between 20 and 600 nm and dep…

piiMaterials scienceSiliconAnnealing (metallurgy)ta221chemistry.chemical_element02 engineering and technologyengineering.material01 natural sciencesAtomic layer depositionCoatingadheesio0103 physical sciencesWaferThin filmta216computer.programming_language010302 applied physicsta114MetallurgysiliconSurfaces and Interfacesatomikerroskasvatus021001 nanoscience & nanotechnologyCondensed Matter PhysicsSurfaces Coatings and Filmsadhesionthin filmschemistryscratch testScratchatomic layer depositionengineeringohutkalvot0210 nano-technologyTincomputerJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
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Aluminum tri-isopropoxide as an alternative precursor for atomic layer deposition of aluminum oxide thin films

2019

Due to the safety challenges associated with the use of trimethylaluminum as a metal precursor for the deposition of alumina, different chemicals have been investigated over the years to replace it. The authors have investigated the use of aluminum tri-isopropoxide (TIPA) as an alternative alkoxide precursor for the safe and cost-effective deposition of alumina. In this work, TIPA is used as a stable Al source for atomic layer deposition (ALD) of Al2O3 when different oxidizing agents including water, oxygen plasma, water plasma, and ozone are employed. The authors have explored the deposition of Al2O3 using TIPA in ALD systems operating in vacuum and atmospheric pressure conditions. For the…

plasma processingMaterials scienceAtmospheric pressurechemistry.chemical_elementSurfaces and InterfacesatomikerroskasvatusplasmafysiikkaCondensed Matter PhysicsSurfaces Coatings and FilmsAtomic layer depositionchemistry.chemical_compoundthin filmsX-ray photoelectron spectroscopychemistryChemical engineeringAluminiumatomic layer depositionOxidizing agentAlkoxideDeposition (phase transition)nanohiukkasetnanoparticlesThin filmJournal of Vacuum Science & Technology A
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Solution processes for plastic thin film transistors

2009

plastic electronics nanotechnology thin film transistorsSettore CHIM/02 - Chimica Fisica
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