Search results for "thin film"
showing 10 items of 1200 documents
Amplified spontaneous emission in thin films of quasi-2D BA3MA3Pb5Br16 lead halide perovskites
2021
Quasi-2D (two-dimensional) hybrid perovskites are emerging as a new class of materials with high photoluminescence yield and improved stability compared to their three-dimensional (3D) counterparts. Nevertheless, despite their outstanding emission properties, few studies have been reported on amplified spontaneous emission (ASE) and a thorough understanding of the photophysics of these layered materials is still lacking. In this work, we investigate the ASE properties of multilayered quasi-2D BA3MA3Pb5Br16 films through the dependence of the photoluminescence on temperature and provide a novel insight into the emission processes of quasi-2D lead bromide perovskites. We demonstrate that the …
Low vacuum photo electron emitting thin films
2009
Impact ionisation is a standard procedure to ionise gaseous or vaporisable substances in organic mass spectrometry. In this work, a "softer" ionisation is introduced which seems to be an alternative ion source for reducing collision between substance molecules and the hot internal walls of the box. Through collision mainly found in impact ionisation sources, fragments are built especially from thermally sensitive substances falsifying the spectra. We present here photoelectron emitting materials for the soft ionisation using semiconducting compounds, galliumn nitride (GaN), and a representative of the borides, lanthanum hexaboride (LaB 6 ). They are evaluated by photoelectron spectroscopic …
Soret emission from water-soluble porphyrin thin films: effect on the electroluminescence response
2009
The emission properties of TSPP [tetrakis(4-sulfonatophenyl) porphyrin] and TMPyP [tetrakis(4-methylpyridyl) porphyrin] in thin films, prepared both by the Langmuir–Blodgett technique and the spin-coating method, have been investigated. Surprisingly, in most of the samples analyzed, the emission spectra do not show the usual two bands typical of porphyrins (in the region 650–750 nm), and depend strongly on the excitation energy. The origin of a new emission band detected at ∼480–500 nm is discussed in terms of the nature of the porphyrin aggregates. Moreover, we demonstrate that the presence or absence of this band in the fluorescence spectrum is directly related to the generation of electr…
Amorphous TiO2 in LP-OMCVD TiNxOy thin films revealed by XPS
2001
Abstract TiN(O)–TiO 2 thin films were prepared on Si(1 0 0) by the low pressure organo metallic chemical vapor deposition (LP-OMCVD) method, using ammonia and titanium isopropoxide as precursors. In order to complete previous characterizations, an Ar + bombardment/XPS coupled study was carried out. This method is based on the fact that the behavior of a compound towards an ion bombardment is a function of its composition. In particular, Ar + bombardment of TiO 2 (whatever its form) leads to a preferential sputtering of oxygen atoms with subsequent reduction of titanium and formation of Ti 3+ and Ti 2+ easily detectable by XPS from a significant broadening of the Ti 2p lines. In the opposite…
Evaluation of Thin Film Microextraction for trace elemental analysis of liquid samples using LIBS detection
2021
An analytical methodology based in the combination of Thin Film Microextraction with Laser-induced Breakdown Spectroscopy (TFME-LIBS) was investigated, for the first time, for detection of Cu, Cr, Ni and Pb in aqueous solutions. In this methodology, the analytes were extracted in a thin film of adsorbent material deposited on a solid support, which was introduced in the sample to analyse. After extraction, the analytes retained in the adsorbent were analysed by LIBS. In order to obtain adsorbent films useful for the microextraction step, two different experimental procedures for film generation, denoted as Drop Casting Deposition and Mould Deposition, were evaluated. In both cases, graphene…
Structure and properties of GaNxOy films grown by nitridation of GaAs (100) substrates
2004
GaAs (100) substrates have been heat-treated in a metal-organic chemical vapor deposition reactor under flows of NH 3 and an oxygen organo-metallic precursor at temperatures between 650°C and 750°C. Yellowish films formed at the surface of all the samples. Gallium, nitrogen and oxygen were detected by EDX analysis of the films. The oxygen content was estimated in the range of at 5-10 at% depending on the heat-treatment temperature. X-ray diffraction and HRTEM results indicate that the structure of the films corresponds to the hexagonal wurtzite phase of GaN with an expanded unit cell. Raman spectra show hands corresponding to the Raman active GaN modes as well as disorder-activated broad ba…
Defektanalyse von a-C- und CNx-Schichten mittels Röntgen-Photoemissions-Elektronenmikroskopie (X-PEEM)Characterization of stoichiometric defects in d…
2001
Amorphe Kohlenstoff- und Kohlenstoffnitridschichten werden vielseitig als Schutzschichten in der Industrie verwandt. Insbesondere werden in der Magnetfestplattenspeicherindustrie verschleisfeste sauerstoffundurchlassige Schutzschichten von wenigen Nanometern Dicke benotigt. Rontgen-Photoemissions-Elektronenmikroskopie (X-PEEM) stellt eine Analysetechnik zur Charakterisierung u.a. von Kohlenstoffschutzschichten dar, da sich Informationen uber die lokale Bindungsumgebung aus der Rontgenabsorptions-Nahkantenstruktur (XANES) gewinnen lassen. CVD-DLC- sowie a-C- und CNx-Schichten wurden analysiert. Fur die a-C-Schichten auf Si (100) wurde der Anteil sp2-hybridisierter Atome bestimmt und mit den …
Reactive direct current magnetron sputtered TiO2 thin films with amorphous to crystalline structures.
2008
International audience; TiO2 thin films were deposited on soda–lime glass substrates by reactive direct current magnetron sputtering in a mixture of pure argon and oxygen. The influence of both the deposition time, td, and the post-annealing treatments on the films morphology, composition and structure was analyzed by scanning electron microscopy, ellipsometry, X-ray photoelectrons spectroscopy, X-ray diffraction (XRD) and Raman spectroscopy. Amorphous TiO2 was obtained for the shortest deposition time, td=15 min. Increasing td up to 30 min, poorly crystallized anatase and rutile phases were formed together with amorphous TiO2, as was revealed by complementary XRD patterns and Raman spectra…
Pulsed laser growth and characterization of thin films on titanium substrates
2007
Abstract Colored layers were obtained by laser surface treatment of Ti substrates with a pulsed Nd:YAG Q-switched laser. The changes in the morphology, structure and chemical composition of the layers were studied by SEM, EDS, XPS, SIMS and Raman spectroscopy as a function of the laser fluence in the 4–60 J cm −2 . For laser fluences lower than 25 J cm −2 , the layers are colorless or yellow. Their surface is smooth, but they display cracks which increase when the fluence increases. The O/Ti ratio, determined by XPS analysis, varies from 0.7 (colorless layers) to 1.3 (yellow layer). Moreover, XPS spectra evidence non-negligible amounts of nitrogen and carbon in these layers. Raman spectra s…
Preparation of Photocatalytic Nanostructured TiO<sub>2</sub> Thin Films
2008
Photoactive films consisting of pure anatase, brookite or rutile were deposited on glass slides by a dip coating process from water dispersions or solutions obtained by using TiCl4 as the precursor. The films were characterized by X-ray diffraction, scanning electron microscopy and atomic force microscopy. The photocatalytic activity of the various samples was evaluated by using the photooxidation of 2-propanol in gas solid regime as probe reaction. Brookite and anatase films showed a good photoactivity degrading the substrate and the propanone produced during the reaction.