0000000000021445

AUTHOR

B. Garrido

showing 2 related works from this author

Optical emission fromSiO2-embedded silicon nanocrystals: A high-pressure Raman and photoluminescence study

2015

We investigate the optical properties of high-quality Si nanocrystals $(\mathrm{NCs})/\mathrm{Si}{\mathrm{O}}_{2}$ multilayers under high hydrostatic pressure with Raman scattering and photoluminescence (PL) measurements. The aim of our study is to shed light on the origin of the optical emission of the Si $\mathrm{NCs}/\mathrm{Si}{\mathrm{O}}_{2}$. The Si NCs were produced by chemical-vapor deposition of Si-rich oxynitride $(\mathrm{SRON})/\mathrm{Si}{\mathrm{O}}_{2}$ multilayers with 5- and 4-nm SRON layer thicknesses on fused silica substrates and subsequent annealing at 1150 \ifmmode^\circ\else\textdegree\fi{}C, which resulted in the precipitation of Si NCs with an average size of 4.1 a…

Materials sciencePhotoluminescenceAnnealing (metallurgy)PhononHydrostatic pressureAnalytical chemistryNanotechnology02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesPressure coefficientElectronic Optical and Magnetic Materialssymbols.namesakeNanocrystal0103 physical sciencessymbols010306 general physics0210 nano-technologyRaman spectroscopyRaman scatteringPhysical Review B
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Boron doping of silicon rich carbides: Electrical properties

2013

Boron doped multilayers based on silicon carbide/silicon rich carbide, aimed at the formation of silicon nanodots for photovoltaic applications, are studied. X-ray diffraction confirms the formation of crystallized Si and 3C-SiC nanodomains. Fourier Transform Infrared spectroscopy indicates the occurrence of remarkable interdiffusion between adjacent layers. However, the investigated material retains memory of the initial dopant distribution. Electrical measurements suggest the presence of an unintentional dopant impurity in the intrinsic SiC matrix. The overall volume concentration of nanodots is determined by optical simulation and is shown not to contribute to lateral conduction. Remarka…

Silicon nanodotMaterials scienceSiliconSilicon dioxideBoron dopingInorganic chemistrychemistry.chemical_elementSilicon carbide02 engineering and technologySettore ING-INF/01 - Elettronica7. Clean energy01 natural sciencesSettore FIS/03 - Fisica Della MateriaCarbidechemistry.chemical_compoundUV-vis reflection and transmittanceMultilayer0103 physical sciencesSilicon carbideGeneral Materials ScienceElectrical measurementsSilicon rich carbide010302 applied physicsDopantbusiness.industryMechanical EngineeringDopingFourier transform infrared spectroscopySilica021001 nanoscience & nanotechnologyCondensed Matter PhysicsSilicon richOptical propertieElectrical transportchemistryMechanics of MaterialsUV-vis reflection and transmittance Doping (additives)Boron-dopingOptoelectronicsElectric propertieNanodot0210 nano-technologybusinessX ray diffraction Boron carbideMaterials Science and Engineering: B
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