0000000000162015

AUTHOR

Giacomo Torrisi

showing 4 related works from this author

Growth kinetics of colloidal Ge nanocrystals for light harvesters

2016

Colloidal Ge nanocrystals (NCs) are gaining increased interest because of their potential application in low-cost optoelectronic and light harvesting devices. However, reliable control of colloidal NC synthesis is often an issue and a deeper understanding of the key-role parameters governing NC growth is highly required. Here we report an extended investigation on the growth of colloidal Ge NCs synthesized from a one-pot solution based approach. A systematic study of the effects of synthesis time, temperature and precursor concentration is elucidated in detail. X-ray diffraction (XRD) analysis reveals the presence of crystalline Ge NCs with a mean size (from 5 to 35 nm) decreasing with the …

Materials scienceScanning electron microscopePHOTODETECTORSGeneral Chemical EngineeringPhotodetectorNanotechnology02 engineering and technologyActivation energy010402 general chemistry01 natural sciencesSettore ING-INF/01 - ElettronicaColloidDynamic light scatteringPEDOT:PSSGermanium; Quantum dot; PHOTODETECTORSchemistry.chemical_classificationGermaniumQuantum dotGeneral ChemistryPolymer021001 nanoscience & nanotechnology0104 chemical scienceschemistryChemical engineeringNanocrystaloptoelectronic devices colloidal nanocrystals0210 nano-technology
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Ion irradiation of AZO thin films for flexible electronics

2017

Aluminum doped Zinc oxide (AZO) is a promising transparent conductor for solar cells, displays and touch-screen technologies. The resistivity of AZO is typically improved by thermal annealing at temperatures not suitable for plastic substrates. Here we present a non-thermal route to improve the electrical and structural properties of AZO by irradiating the TCO films with O+ or Ar+ ion beams (30–350 keV, 3 × 1015–3 × 1016 ions/cm2) after the deposition on glass and flexible polyethylene naphthalate (PEN). X-ray diffraction, optical absorption, electrical measurements, Rutherford Backscattering Spectrometry and Atomic Force Microscopy evidenced an increase of the crystalline grain size and a …

Nuclear and High Energy PhysicsMaterials science02 engineering and technology01 natural sciencesSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della MateriaOpticsTransparent conductive oxideElectrical resistivity and conductivity0103 physical sciencesAZO ; Transparent conductive oxide ; Ion implantationElectrical measurementsThin filmPolyethylene naphthalateFlexible and transparent electronicInstrumentationTransparent conducting filmNuclear and High Energy Physic010302 applied physicsbusiness.industryAZO021001 nanoscience & nanotechnologyRutherford backscattering spectrometryIon implantationIon implantationOptoelectronicsCrystallite0210 nano-technologybusinessPhotovoltaic
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Robustness and electrical reliability of AZO/Ag/AZO thin film after bending stress

2017

Abstract The increasing interest in thin flexible and bendable devices has led to a strong demand for mechanically robust and electrically reliable transparent electrodes. Indium doped Tin Oxide (ITO) and Aluminium doped Zinc Oxide (AZO) are among the most employed transparent conductive oxides (TCO) and their reliability on flexible substrates have thus received a great attention. However, a high flexibility is usually achieved at very low thickness, which, unfortunately, compromises the electrical conductivity. Here we report the effects of mechanical bending cycles on the electrical and optical properties of ultra thin AZO/Ag/AZO multilayers (45 nm/10 nm/45 nm) and, for comparison, of AZ…

Materials scienceScanning electron microscopeThin filmschemistry.chemical_element02 engineering and technologySettore ING-INF/01 - Elettronica01 natural sciencesSettore FIS/03 - Fisica Della MateriaTransparent conductive oxideElectrical resistance and conductance0103 physical sciencesThin filmThin filmComposite materialPolyethylene naphthalateElectrical conductor010302 applied physicsRenewable Energy Sustainability and the EnvironmentElectronic Optical and Magnetic MaterialTransparent conductive oxide; Thin films; PhotovoltaicsSputtering021001 nanoscience & nanotechnologyTin oxideSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsPhotovoltaicschemistryElectrode0210 nano-technologyPhotovoltaicFlexibleIndiumSolar Energy Materials and Solar Cells
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Laser irradiation of ZnO:Al/Ag/ZnO:Al multilayers for electrical isolation in thin film photovoltaics

2013

Laser irradiation of ZnO:Al/Ag/ZnO:Al transparent contacts is investigated for segmentation purposes. The quality of the irradiated areas has been experimentally evaluated by separation resistance measurements, and the results are complemented with a thermal model used for numerical simulations of the laser process. The presence of the Ag interlayer plays two key effects on the laser scribing process by increasing the maximum temperature reached in the structure and accelerating the cool down process. These evidences can promote the use of ultra-thin ZnO:Al/ Ag/ZnO:Al electrode in large-area products, such as for solar modules. © 2013 Crupi et al.; licensee Springer.

Materials scienceTransparent electrodesThin film photovoltaicNanochemistryNanotechnologyTransparent electrode AluminumSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della Materialaw.inventionElectrical isolationIrradiated areaMaterials Science(all)PhotovoltaicslawTransparent electrodes ; Multilayers; Pulsed laser scribingMultilayerGeneral Materials ScienceIrradiationThin filmLaser scribingNano Expressbusiness.industryMaximum temperaturePulsed laser scribingCondensed Matter PhysicsLaserThin film photovoltaicsMultilayersElectrical isolationElectrodeOptoelectronicsResistance measurementLaser scribing proceZinc oxide Film preparationbusinessLaser scribing
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