0000000000164047

AUTHOR

A. Abou Chaaya

showing 3 related works from this author

Optical properties of ultrathin Al2O3/ZnO nanolaminates

2015

Abstract Because of their high resistance against ultraviolet and high energy particles, ultrathin amorphous nanolaminates can be very attractive for aerospace application. Here we report on the optical and structural properties of ultrathin Al2O3/ZnO nanolaminates deposited by Atomic Layer Deposition. Structural properties of nanolaminates were studied by GIXRD and AFM. Optical characterization was performed by transmittance, spectroscopic ellipsometry and photoluminescence (PL) spectroscopy. Regression analysis of ellipsometric spectra has shown that absorption peak decreases and blue shifted with the decrease of bilayer thickness in the stack. On the basis of the analysis of structural a…

PhotoluminescenceMaterials sciencebusiness.industryBilayerMetals and AlloysNanotechnologySurfaces and InterfacesSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsBlueshiftAmorphous solidAtomic layer depositionMaterials ChemistryTransmittanceOptoelectronics[CHIM]Chemical SciencesbusinessSpectroscopyAbsorption (electromagnetic radiation)ComputingMilieux_MISCELLANEOUS
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The influence of localized plasmons on the optical properties of Au/ZnO nanostructures

2015

Optical and structural experiments have been carried out on Si/ZnO thin films modified with ultra-thin gold layers of different thicknesses. ZnO was produced via Atomic Layer Deposition (ALD) and Au via Physical Vapor Deposition (sputtering). The structural properties of nanostructures were studied by XRD and AFM. Optical characterization was performed by absorbance, photoluminescence (PL) and spectroscopic ellipsometry (SE). A transition from cluster-to-thin films with the increase of Au thickness has been revealed from an analysis of optical and structural parameters. The analysis of optical features of the system has shown that slight changes of the localized plasmon absorption peaks in …

PhotoluminescenceMaterials sciencebusiness.industryGeneral ChemistryAtomic layer depositionOpticsPhysical vapor depositionDispersion (optics)Materials Chemistry[CHIM]Chemical SciencesOptoelectronicsThin filmbusinessLayer (electronics)Refractive indexComputingMilieux_MISCELLANEOUSPlasmonJournal of Materials Chemistry C
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ALD thin ZnO layer as an active medium in a fiber-optic Fabry–Perot interferometer

2015

Abstract A novel optical fiber sensor of temperature using a thin ZnO layer fabricated by atomic layer deposition (ALD) is demonstrated for the first time. The thin ZnO layer was grown on the face of a standard optical telecommunication fiber SMF-28 and operates as a Fabry–Perot interferometer sensitive to temperature. The interferometer characterization was made in the temperature range extending from 50 to 300 °C with resolution equal to 1 °C. The output signal was analyzed by measurement of the shift of the maxima in spectral pattern. The sensitivity of temperature measurement is about 0.05 nm/°C. Furthermore, very good linearity of the sensor was achieved with correlation coefficient R2…

Materials science02 engineering and technology01 natural sciencesTemperature measurementAtomic layer depositionOptics0103 physical sciences[CHIM]Chemical SciencesFiberElectrical and Electronic EngineeringInstrumentationComputingMilieux_MISCELLANEOUS010302 applied physicsbusiness.industryMetals and AlloysAtmospheric temperature range021001 nanoscience & nanotechnologyCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsInterferometryFiber optic sensor0210 nano-technologybusinessLayer (electronics)Fabry–Pérot interferometer
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