0000000000407212
AUTHOR
Marco Castriota
showing 4 related works from this author
Structural characterization of mixed Ta–Re oxide films
2006
Thin films of mixed Ta and Re oxides have been produced by reactive dc magnetron co-sputtering of pure Ta and Re metal targets in Ar–O2 atmosphere. The structural evolution of these films has been studied as a function of the composition, starting from a pure tantalum oxide film up to about 82% rhenium content. The composition and the structure of the films have been investigated by using X-ray diffraction and micro-Raman spectroscopy. For low Re content (20%), islands of a well crystallized phase, based on ReO4 groups, appear in the films still composed by pure amorphous tantalum oxide, while a mixed disordered solid phase is found for the highest Re concentration (82%). © 2006 Elsevier B.…
Proton presence and motion in rhenium-oxide films and their application to liquid-crystalline cells
2007
Disordered solid phases, containing appreciable amounts of hydrogen ions, are grown at the surface of rhenium oxide crystals, because of the high reactivity of this compound with ambient moisture. To investigate such phenomena, a comparative study is performed on ground powder and thermally evaporated or sputtered films using x-ray diffraction and micro-Raman spectroscopy. Two types of solid phases were found in the films: HxReO3 distorted perovskite structures, based on corner-sharing ReO6 octahedra as in the bulk crystals, and ordered HReO4 crystalline structures, based on tetrahedral perrhenate ions. The complex impedance measurements on ReO3 films support the hypothesis of mobile hydrog…
Characterization of rhenium oxide films and their application to liquid crystal cells
2009
Rhenium trioxide exhibits high electronic conductivity, while its open cubic crystal structure allows an appreciable hydrogen intercalation, generating disordered solid phases, with protonic conductivity. Rhenium oxide thin films have been obtained by thermal evaporation of ReO3 powders on different substrates, maintained at different temperatures, and also by reactive magnetron sputtering of a Re metallic target. A comparative investigation has been carried out on these films, by using micro-Raman spectroscopy and x-ray diffraction. Two basic types of solid phases appear to grow in the films: a red metallic HxReO3 compound, with distorted perovskite structures, like in the bulk material, a…
Sputtering deposition and characterization of Ru-doped WO3 thin films for electrochromic applications
2003
Mixed tungsten-ruthenium oxide thin films were prepared for the first time by dc magnetron co-sputtering technique and were studied by cyclic voltammetry, optical transmission measurements, Raman spectroscopy and the W L3 and Ru K edges X-ray absorption spectroscopy (XAS) in comparison with pure WO3 films. The Ru concentration was varied in the range from 0 to 28 at.%. XAS results suggest that the average local structure around both tungsten and ruthenium ions remains unchanged within experimental accuracy in all samples, moreover, for tungsten ions, it resembles that of pure WO3 films. However, the presence of the ruthenium ions affects the electrochemical and optical properties of the fil…