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RESEARCH PRODUCT
Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
Patrick PhilippJosé María De TeresaRosa CórdobaPablo Orússubject
n/aMaterials scienceIon beamControl and Systems Engineeringlcsh:Mechanical engineering and machineryMechanical EngineeringAnalytical chemistrylcsh:TJ1-1570ElectronElectrical and Electronic EngineeringDeposition (chemistry)description
In Section 3 [...]
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2020-02-01 | Micromachines |