6533b7cefe1ef96bd125719f
RESEARCH PRODUCT
Microcalorimeter/EBIT measurements of X-ray spectra of highly charged ions
Endre TakacsJ. M. LamingE. E. HallerHerbert W. SchnopperD.a. LandisJeffrey W. BeemanJames V. PortoJohn D. GillaspyNancy BrickhouseSimon R. BandlerEric H. SilverNorman W. MaddenI KinkS. S. MurrayM. Barberasubject
PhysicsAtomic and Molecular Physics and OpticPhysics::Instrumentation and DetectorsDetectorTheoretical modelsCondensed Matter PhysicsAtomic and Molecular Physics and OpticsSpectral lineIonSettore FIS/05 - Astronomia E AstrofisicaMathematical PhysicAtomic physicsElectronic band structureX ray spectraMathematical PhysicsLine (formation)Electron beam ion trapdescription
Spectra of highly charged Ar, Kr, Xe and Fe ions, produced in an Electron Beam Ion Trap (EBIT), have been recorded in a broad X-ray energy band (0.2 keV to 10 keV) with a microcalorimeter detector. The first analysis of the Kr spectra has been completed and most of the spectral lines have been identified as transitions of B- to Al-like Kr. Line intensity ratios of Fe XVII have been measured and compared with theoretical models.
year | journal | country | edition | language |
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2001-01-01 |