6533b7d0fe1ef96bd125ac30

RESEARCH PRODUCT

Processing, basic characterization and standard dielectric measurements on PLZTx/65/35 (4 ≤x≤ 11) ceramics

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The influence of external stress (0–800 bar) on the dielectric properties of lead lanthanum zirconium titanate (PLZT) x/65/35 (4 ≤ x ≤ 11) ceramics was investigated. Applying uniaxial pressure leads to a change in the peak intensity of the electric permittivity (ϵ), in its frequency dispersion as well as in the dielectric hysteresis. The peak intensity of ϵ becomes broader and shifts to lower temperatures for PLZT x/65/35 with x = 4, 7, 9.75 and 11, with increasing pressure, on heating. It was concluded that applying uniaxial pressure induces an increase of Tm, and thus has a similar effect as the increase of the Ti ion concentration in the lead zirconium titanate (PZT) system. Results based on nanoregion switching processes under combined electromechanical loading were interpreted. Studies clearly showed that applied stress has a significant influence on the dielectric properties of PLZT ceramics.