6533b7d4fe1ef96bd12629ef

RESEARCH PRODUCT

Natural optical anisotropy of h-BN: Highest giant birefringence in a bulk crystal through the mid-infrared to ultraviolet range

Lluís ArtúsTakashi TaniguchiAlfredo SeguraGuillaume CassaboisBernard GilRamón Cuscó

subject

Van der waals interactionsRefractive-IndexMaterials sciencePhysics and Astronomy (miscellaneous)Band gap02 engineering and technologyDielectricsemiconductorsmedicine.disease_cause01 natural sciencesMolecular physicswide bandgapHeterostructures constants0103 physical sciencesmedicineTransmittancePressureHexagonalGeneral Materials SciencePlane010306 general physicsAnisotropyBirefringenceGAASSystems021001 nanoscience & nanotechnologyPolarization (waves)2D materialsBoron nitride[PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other][PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]Single-crystalsGraphene0210 nano-technologyRefractive indexUltraviolet

description

The giant birefringence of layered h-BN was demonstrated by analyzing the interference patterns in reflectance and transmittance measurements in the mid-infrared to the deep ultraviolet energy range. The refractive index for polarization perpendicular to the c axis is much higher than the refractive index for polarization parallel to the c axis, and it displays a strong increase in the ultraviolet range that is attributed to the huge excitonic effects arising from the unique electronic structure of h-BN. Thus, h-BN is shown to exhibit a giant negative birefringence that ranges from -0.7 in the visible to -2 in the deep ultraviolet close to the band gap. The electronic dielectric constants for polarization perpendicular and parallel to the c axis were determined to be epsilon(perpendicular to)(infinity) = 4.95 and epsilon(parallel to)(infinity) = 2.86, respectively. The anisotropy we find in high-quality h-BN is significantly larger than proposed in previous experimental studies but in excellent agreement with ab initio calculations.

10.1103/physrevmaterials.2.024001http://hdl.handle.net/10261/161209