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RESEARCH PRODUCT
New approach to energy loss measurements
V. LyapinV. LyapinJyrki RäisänenWladyslaw Henryk TrzaskaWladyslaw Henryk TrzaskaMarcin WojdyrT. AlankoManfred MuttererG. P. Tjurinsubject
Nuclear and High Energy PhysicsNickelRange (particle radiation)chemistryDetectorchemistry.chemical_elementStopping power (particle radiation)Alpha particleAtomic physicsInstrumentationFOIL methodSemiconductor detectorIondescription
Abstract A new approach to energy loss measurements is proposed. In the same experiment electronic stopping force (power) in gold, nickel, carbon, polycarbonate and Havar for 40 Ar, 28 Si, 16 O, 4 He and 1 H ions in the energy range 0.12–11 MeV/u has been measured. In this paper we give the full results for gold, nickel, and carbon and for 40 Ar, 16 O, 4 He and 1 H ions. Good agreement of the measured stopping force values for light ions with literature data is interpreted as the positive test of the experimental technique. The same technique used with heavy ions yields agreement with the published data only for energies above 1 MeV/u. At lower energies we observe progressively increasing discrepancy. This discrepancy is removed completely as soon as we neglect pulse height defect compensation. This observation makes us believe that the majority of the published results as well as semi-empirical calculations based on them (like the popular SRIM) may be in error at low ion energies. Procedures to evaluate foil quality and to determine pulse height defect for charged ions in semiconductor detectors are given. Our improved MCP-based time pick-off detector is described in detail.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2002-10-01 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |