6533b7d8fe1ef96bd126af76
RESEARCH PRODUCT
Defect spectroscopy of single ZnO microwires
M. VillafuerteJ. M. FerreyraJosé Barzola-quiquiaM. M. De LimaSilvia P. HeluaniFernando IikawaC. ZapataPablo EsquinaziAndrés Cantarerosubject
Materials sciencePhotoluminescenceDeep levelbusiness.industryBand gapCiencias FísicasWide-bandgap semiconductorNanowireGeneral Physics and Astronomy//purl.org/becyt/ford/1.3 [https]Crystallographic defect//purl.org/becyt/ford/1 [https]NanolithographyMicrowiresZnOOptoelectronicsDefectsSpectroscopybusinessCIENCIAS NATURALES Y EXACTASSpectroscopyFísica de los Materiales Condensadosdescription
The point defects of single ZnO microwires grown by carbothermal reduction were studied by microphotoluminescence, photoresistance excitation spectra, and resistance as a function of the temperature. We found the deep level defect density profile along the microwire showing that the concentration of defects decreases from the base to the tip of the microwires and this effect correlates with a band gap narrowing. The results show a characteristic deep defect levels inside the gap at 0.88 eV from the top of the VB. The resistance as a function of the temperature shows defect levels next to the bottom of the CB at 110 meV and a mean defect concentration of 4 1018 cm3 . This combination of techniques allows us to study the band gap values and defects states inside the gap in single ZnO microwires and opens the possibility to be used as a defect spectroscopy method. Fil: Villafuerte, Manuel Jose. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina Fil: Ferreyra, J. M.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina Fil: Zapata, C.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina Fil: Barzola Quiquia, J.. University of Leipzig; Alemania Fil: Iikawa, F.. Instituto de Física “Gleb Wataghin"; Brasil Fil: Esquinazi, P.. University of Leipzig; Alemania Fil: Huleani, S. P.. Universidad Nacional de Tucumán. Facultad de Ciencias Exactas y Tecnología. Departamento de Física. Laboratorio de Física del Solido; Argentina Fil: de Lima, M. M.. Universidad de Valencia; España Fil: Cantarero, A.. Universidad de Valencia; España
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2014-04-01 |