6533b7d9fe1ef96bd126c2bd

RESEARCH PRODUCT

Fabrication and characterization of small tunnel junctions through a thin dielectric membrane

A. AassimeAntti ManninenJukka P. Pekola

subject

Materials scienceFabricationPhysics and Astronomy (miscellaneous)business.industryCoulomb blockadePhysics::OpticsNanotechnologyCondensed Matter::Mesoscopic Systems and Quantum Hall EffectPlanarTunnel junctionCondensed Matter::SuperconductivityOptoelectronicsbusinessElectrical impedanceQuantum tunnellingElectron-beam lithographyVoltage

description

We show that a small tapered hole through a thin silicon nitride membrane provides a mask for tunnel junction structures. Our experiments imply, unlike in the conventional planar electron beam lithography, that tunnel junctions are well voltage biased in this structure with vanishingly small on-chip impedance. Our technique allows fabrication of double junctions, and even multijunction linear arrays, with small metallic islands in between.

10.1063/1.122463https://cris.vtt.fi/en/publications/0a4a96ce-2260-4e41-a613-06550a5136e7