6533b81ffe1ef96bd1278e46
RESEARCH PRODUCT
SEGR in SiO<inf>2</inf>-Si<inf>3</inf>N<inf>4</inf> stacks
James R. SchwankHeikki KettunenFrancesco PintacudaAri VirtanenMikko RossiAlexandre Louis BosserArto JavanainenMarty R. ShaneyfeltVeronique Ferlet-cavroisJukka JaatinenMichele Muschitiellosubject
Materials sciencebusiness.industryElectronic engineeringOptoelectronicsbusinessyear | journal | country | edition | language |
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2013-09-01 | 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |