6533b823fe1ef96bd127e2c2
RESEARCH PRODUCT
Analysis of broadband x-ray spectra of highly charged krypton from a microcalorimeter detector of an electron-beam ion trap
Eric H. SilverNorman W. MaddenJames V. PortoI KinkJohn D. GillaspyJeffrey W. BeemanEndre TakacsNancy BrickhouseM. BarberaJ. M. LamingD.a. LandisE. E. HallerSimon R. BandlerHerbert W. SchnopperS. S. Murraysubject
PhysicsDetectorKryptonchemistry.chemical_elementFizikai tudományokPlasmaCondensed Matter PhysicSpectral lineIonPhysics and Astronomy (all)Settore FIS/05 - Astronomia E AstrofisicaTermészettudományokchemistryPhysics::Atomic PhysicsIon trapAtomic physicsElectronic band structureMathematical PhysicsElectron beam ion trapStatistical and Nonlinear Physicdescription
Spectra of highly charged Kr ions, produced in an electron-beam ion trap (EBIT), have been recorded in a broad x-ray energy band (0.3 keV to 4 keV) with a microcalorimeter detector. Most of the spectral lines have been identified as transitions of B- to Al-like Kr. The transition energies have been determined with 0.2% uncertainty. A semi-empirical EBIT plasma model has been created to calculate a synthetic spectrum of highly charged Kr and to determine a charge state distribution of Kr ions inside the EBIT.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2001-01-01 |