6533b829fe1ef96bd128a1b6
RESEARCH PRODUCT
Characterization of alpha sources by Rutherford backscattering spectrometry
J.c. SoaresA. Martín SánchezJ.l. Ferrero CalabuigJ. Rosello FerrandoC. Roldán GarcíaF. Vera ToméM.f. Da Silvasubject
PhysicsNuclear and High Energy PhysicsPlanarSiliconchemistryAlpha spectrometryDetectorchemistry.chemical_elementAtomic physicsRutherford backscattering spectrometryInstrumentationBeam (structure)Characterization (materials science)description
Radioactive sources for alpha spectrometry are usually prepared by electrodeposition onto stainless steel backings (and sometimes heated). In earlier work, using the conventional method with passivated implanted planar silicon detectors for the measurements, several sources had been characterized in terms of various parameters by fitting the data of each spectrum to a certain mathematical function. In the present work, the Rutherford Backscattering Spectrometry (RBS) technique with a 1.6 MeV He+ beam was used to study the influence of those factors on the surface distribution and depth profiles of the thin radionuclide layers. Simulations of the measurements using the RUMP computer code were made to interpret the data obtained in the different experiments. The correlations between the parameters measured using RBS and the results of the alpha spectrometry are presented and discussed.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1996-02-01 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |