6533b833fe1ef96bd129bfda

RESEARCH PRODUCT

Spin Polarimetry and Magnetic Dichroism on a Buried Magnetic Layer Using Hard X-ray Photoelectron Spectroscopy

Koichiro InomataGregory StryganyukGerd SchönhenseAndreas OelsnerSiham OuardiKeisuke KobayashiKeisuke KobayashiClaudia FelserGerhard H. FecherPavel LushchykXeniya KozinaP. BernhardEiji IkenagaTakeharu SugiyamaHiroaki SukegawaStanislav ChadovZhenchao Wen

subject

Physics::Instrumentation and DetectorsChemistrybusiness.industryGeneral EngineeringPolarimetryGeneral Physics and AstronomyElectronPhotoelectric effectDichroismInelastic mean free pathMolecular physicsOpticsX-ray photoelectron spectroscopyBeamlineSpin (physics)business

description

The spin-resolved electronic structure of buried magnetic layers is studied by hard X-ray photoelectron spectroscopy (HAXPES) using a spin polarimeter in combination with a high-energy hemispherical electron analyzer at the high-brilliance BL47XU beamline (SPring-8, Japan). Spin-resolved photoelectron spectra are analyzed in comparison with the results of magnetic linear and circular dichroism in photoelectron emission in the case of buried Co2FeAl0.5Si0.5 layers. The relatively large inelastic mean free path (up to 20 nm) of fast photoelectrons enables us to extend the HAXPES technique with electron-spin polarimetry and to develop spin analysis techniques for buried magnetic multilayers and interfaces.

https://doi.org/10.1143/jjap.51.016602