6533b833fe1ef96bd129c416
RESEARCH PRODUCT
Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions
Ronald LehndorffAndrés Conca ParraMathias KläuiFrederick CasperBurkard HillebrandsChristian HauptJohannes PaulGerhard Jakobsubject
Materials science530 PhysicsPopulationMgO02 engineering and technologylcsh:Chemical technology01 natural sciencesBiochemistryArticleAnalytical Chemistrytunneling barrierstressCritical point (thermodynamics)sensor0103 physical sciencesElectronic engineeringlcsh:TP1-1185Electrical and Electronic EngineeringeducationInstrumentationWeibull distribution010302 applied physicseducation.field_of_studyreliabilityTime evolutionFailure rate021001 nanoscience & nanotechnologyMicrostructure530 PhysikAtomic and Molecular Physics and OpticsMagnetic fieldfailureDistribution functionTMRWeibull0210 nano-technologyMTJdescription
The estimation of the reliability of magnetic field sensors against failure is a critical point concerning their application for industrial purposes. Due to the physical stochastic nature of the failure events, this can only be done by means of a statistical approach which is extremely time consuming and prevents a continuous observation of the production. Here, we present a novel microstructure design for a parallel measurement of the lifetime characteristics of a sensor population. By making use of two alternative designs and the Weibull statistical distribution function, we are able to measure the lifetime characteristics of a CoFeB/MgO/CoFeB tunneling junction population. The main parameters governing the time evolution of the failure rate are estimated and discussed and the suitability of the microstructure for highly reliable sensor application is proven.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2019-01-30 | Sensors (Basel, Switzerland) |