6533b838fe1ef96bd12a4ecd
RESEARCH PRODUCT
On the Rigorous Calculation of All Ohmic Losses in Rectangular Waveguide Multi-Port Junctions
J. HuesoSantiago CogollosVicente E. BoriaBenito GimenoM. TaroncherA. VidalI. Hidalgosubject
PhysicsAdmittancebusiness.industryPhysics::OpticsMechanicsLossy compressionCondensed Matter::Mesoscopic Systems and Quantum Hall EffectHollow waveguideMatrix decompositionAdmittance parametersOpticsCondensed Matter::SuperconductivityHardware_INTEGRATEDCIRCUITSHardware_ARITHMETICANDLOGICSTRUCTURESbusinessOhmic contactMulti portElectronic circuitdescription
In this paper, all ohmic losses effects present in rectangular waveguide multi-port junctions are rigorous and efficiently computed. For this purpose, a new formulation based on the theory of cavities, which provides generalized admittance matrix representations for such junctions, is proposed. To validate this theory, we have successfully compared our results with numerical data of a lossy E-plane T-junction and of a hollow waveguide, as well as with experimental measurements of a real H-plane T-junction.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2005-06-17 | IEEE MTT-S International Microwave Symposium Digest, 2005. |