6533b851fe1ef96bd12a9a14

RESEARCH PRODUCT

Carbon Dots Dispersed on Graphene/SiO2/Si: A Morphological Study

Alice SciortinoFranco Mario GelardiGiacomo MessinaGwan Hyoung LeeNicola LisiAndrea CapassoSimonpietro AgnelloMarco CannasFabrizio MessinaAndrea GnisciAngelo ArmanoEmanuela SchiliròFilippo GiannazzoGiuliana Faggio

subject

atomic force microscopyMaterials scienceGrapheneAtomic force microscopychemistry.chemical_elementSurfaces and InterfacesCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionGraphene carbon dotssymbols.namesakechemistryChemical engineeringlawchemical vapor deposited graphenecarbon dotsRaman spectroscopyMaterials ChemistrysymbolsElectrical and Electronic EngineeringRaman spectroscopyCarbon

description

Low-dimensional carbon materials occupy a relevant role in the field of nanotechnology. Herein, the authors report a study conducted by atomic force microscopy and Raman spectroscopy on the deposition of carbon dots onto graphene surfaces. The study aims at understanding if and how the morphology and the microstructure of chemical vapor deposited graphene on Si/SiO2 may change due to the interaction with the carbon dots. Potential alteration in the graphene's electrical properties might be detrimental for optoelectronic applications. The deposition of carbon dots dispersed in water and ethanol solvents are explored to investigate the effect of solvents with different fluidic properties. The obtained results indicate that the carbon dots do not alter the quality of graphene.

yearjournalcountryeditionlanguage
2019-01-07
10.1002/pssa.201800559http://hdl.handle.net/10447/350139