6533b860fe1ef96bd12c303a

RESEARCH PRODUCT

Optical sectioning microscopy through single-shot Lightfield protocol

E. Sanchez-ortigaG. ScrofaniG. SaavedraM. Martinez-corral

subject

FiMicGeneral Computer ScienceOptical sectioningComputer scienceComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION02 engineering and technology3d microscopy01 natural sciences010309 opticsOptics0103 physical sciencesMicroscopyGeneral Materials ScienceProtocol (object-oriented programming)Fourier integral microscopebusiness.industryResolution (electron density)Orthographic projectionGeneral EngineeringSingle shotfourier lightfield microscopeGPU computingÒptica021001 nanoscience & nanotechnologySample (graphics)Microscòpialightfield microscopeoptical sectioninglcsh:Electrical engineering. Electronics. Nuclear engineering0210 nano-technologybusinesslcsh:TK1-9971

description

Optical sectioning microscopy is usually performed by means of a scanning, multi-shot procedure in combination with non-uniform illumination. In this paper, we change the paradigm and report a method that is based in the light field concept, and that provides optical sectioning for 3D microscopy images after a single-shot capture. To do this we fi rst capture multiple orthographic perspectives of the sample by means of Fourier-domain integral microscopy (FiMic). The second stage of our protocol is the application of a novel refocusing algorithm that is able to produce optical sectioning in real time, and with no resolution worsening, in the case of sparse f luorescent samples.We provide the theoretical derivation of the algorithm, and demonstrate its utility by applying it to simulations and to experimental data.

yearjournalcountryeditionlanguage
2020-01-01
10.1109/access.2020.2966323https://doi.org/10.1109/ACCESS.2020.2966323