6533b861fe1ef96bd12c476f

RESEARCH PRODUCT

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory

Alexandre BosserV. GuptaArto JavanainenG. TsiligiannisS. D. LalumondiereD. BreweV. Ferlet-cavroisH. PuchnerHeikki KettunenT. GilF. WrobelF. SaignéAri VirtanenL. Dilillo

subject

X-rayFRAMsäteilyfysiikkaSEFIkäyttömuistitsingle-event effectstatic testmuistit (tietotekniikka)heavy ionsingle-event upsetdynamic test

description

This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate characteristic error patterns, affecting isolated bits, words, groups of pages, and sometimes entire regions of the memory array. The underlying mechanisms are discussed. peerReviewed

yearjournalcountryeditionlanguage
2018-01-01
http://urn.fi/URN:NBN:fi:jyu-201808203863