6533b86cfe1ef96bd12c7fa0

RESEARCH PRODUCT

Powder X-ray diffraction data for potassium silver thiocyanate, AgK(SCN)2 and dipotassium silver thiocyanate, AgK2(SCN)3

Jussi ValkonenMinna GünesManu Lahtinen

subject

Crystallographychemistry.chemical_compoundRadiationchemistrySilver thiocyanateRietveld refinementPotassiumX-ray crystallographyInorganic chemistrychemistry.chemical_elementGeneral Materials ScienceCondensed Matter PhysicsInstrumentation

description

Previously unpublished powder X-ray diffraction data for potassium silver thiocyanate, AgK(SCN)2 and dipotassium silver thiocyanate, AgK2(SCN)3 are presented. F30 values for AgK(SCN)2 and AgK2(SCN)3 are 80(0.0075, 50) and 53(0.0089, 63), respectively. The Rietveld refinement of the patterns is also performed. For AgK(SCN)2Rp=6.98, Rwp=11.84, and RBragg=2.9. For AgK2(SCN)3Rp=7.22, Rwp=10.79, and RBragg=5.0.

yearjournalcountryeditionlanguage
2002-03-01Powder Diffraction
https://doi.org/10.1154/1.1419182