Search results for " beam"

showing 10 items of 1274 documents

The effect of plasma instabilities on the background impurities in charge breeder ECRIS

2017

International audience; Experimental observations of plasma instabilities in the 14.5 GHz PHOENIX charge breeder ECRIS are summarized. It has been found that the injection of 133Cs+ or 85Rb+ into oxygen discharge of the CB-ECRIS can trigger electron cyclotron instabilities, which results to sputtering of the surfaces exposed to the plasma, followed by up to an order of magnitude increase of impurity currents in the extracted n+ charge state distribution. The transition from stable to unstable plasma regime is caused by gradual accumulation and ionization of Cs/Rb altering the discharge parameters in 10 - 100 ms time scale, not by a prompt interaction between the incident ion beam and the EC…

010302 applied physicsMaterials scienceIon beamta114syklotronit[PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph]Buffer gasCyclotronPlasmaElectroncharge breederplasmafysiikka7. Clean energy01 natural sciences010305 fluids & plasmaslaw.inventionIonECRISSputteringlawIonization0103 physical sciencesAtomic physicsplasma (kaasut)plasma
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Vapor plume and melted zone behavior during dissimilar laser welding of titanium to aluminum alloy

2020

The present study deals with continuous Yb:YAG laser welding of pure titanium to aluminum alloy A5754 performed with different beam offsets to the joint line. Spectroscopic and morphological characterization of vapor plume exiting the keyhole was combined with post-mortem observation and energy-dispersive X-ray spectroscopy (EDX) analysis of the welds. The laser beam centered on the joint line resulted in periodic transversal inclination of a vapor jet on the aluminum side associated with a local increase of melt width and an intense spatter formation. Such behavior can be attributed to the instability of the keyhole wall from the aluminum side. The beam offset on the titanium side led to …

010302 applied physicsMaterials scienceMechanical EngineeringMetallurgyAlloychemistry.chemical_elementLaser beam welding02 engineering and technologyengineering.material021001 nanoscience & nanotechnologyLaser01 natural sciencesPlumelaw.inventionchemistryAluminiumlawJoint line0103 physical sciencesengineeringGeneral Materials Science0210 nano-technologyBeam (structure)TitaniumProceedings of the Institution of Mechanical Engineers, Part L: Journal of Materials: Design and Applications
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Temperature dependence of luminescence of LiF crystals doped with different metal oxides

2020

Photoluminescence and cathodoluminescence of LiF crystals doped with different binary metal oxides were measured in the wide temperature range of 50-300 K and time interval of 10−8−10−1 s after the nanosecond electron excitation pulse. Both as-grown those and crystals irradiated by an electron beam in range of absorbed dose up to 103 Gy were studied. It is shown that spectral-kinetic characteristics of the luminescence depend on the absorbed dose (type of created/accumulated color centers), the irradiation temperature, the concentration of hydroxyl, which promotes incorporation of the MeO complex (Me: W, Ti, Fe, Li) into the crystal lattice, and the cation-dopants.

010302 applied physicsMaterials sciencePhotoluminescencePhysics and Astronomy (miscellaneous)DopingAnalytical chemistryGeneral Physics and AstronomyCathodoluminescenceNanosecondAtmospheric temperature range01 natural sciencesElectron excitation0103 physical sciencesElectron beam processing010306 general physicsLuminescenceLow Temperature Physics
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Nucleation of GaN nanowires grown by plasma-assisted molecular beam epitaxy: The effect of temperature

2011

Abstract The growth of GaN nanowires by means of plasma assisted molecular beam epitaxy directly on Si(1 1 1) has been investigated as a function of temperature. Statistical analysis of scanning electron microscopy pictures taken for different growth temperatures has revealed that density, diameter, length and length dispersion of nanowires were strongly dependent on temperature. Length dispersion, in particular, was found to be significant at high temperature. These features have been assigned to the different duration of the nucleation process with temperature, namely to the dependence with temperature of the time necessary for the size increase of the three-dimensional precursors up to a…

010302 applied physicsMaterials scienceScanning electron microscopeNucleationNanowireAnalytical chemistry02 engineering and technologyPlasma021001 nanoscience & nanotechnologyCondensed Matter PhysicsCritical value01 natural sciencesSize increaseInorganic ChemistryCondensed Matter::Materials ScienceCrystallography0103 physical sciencesMaterials Chemistry[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]0210 nano-technologyDispersion (chemistry)ComputingMilieux_MISCELLANEOUSMolecular beam epitaxy
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Kinetic instabilities in pulsed operation mode of a 14 GHz electron cyclotron resonance ion source

2016

The occurrence of kinetic plasma instabilities is studied in pulsed operation mode of a 14 GHz Aelectron cyclotron resonance type electron cyclotron resonance ion source. It is shown that the temporal delay between the plasma breakdown and the appearance of the instabilities is on the order of 10- 100 ms. The most important parameters affecting the delay are magnetic field strength and neutral gas pressure. It is demonstrated that kinetic instabilities limit the high charge state ion beam production in the unstable operating regime. peerReviewed

010302 applied physicsMaterials scienceta114Ion beamCyclotron resonancePlasma01 natural sciencesplasma electronsIon sourceElectron cyclotron resonanceFourier transform ion cyclotron resonance010305 fluids & plasmasMagnetic fieldpulsed operation modePhysics::Plasma Physics0103 physical scienceselectron cyclotron resonance ion sourceskinetic instabilitiesAtomic physicsInstrumentationIon cyclotron resonanceReview of Scientific Instruments
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New progress of high current gasdynamic ion source (invited).

2016

The experimental and theoretical research carried out at the Institute of Applied Physics resulted in development of a new type of electron cyclotron resonance ion sources (ECRISs)—the gasdynamic ECRIS. The gasdynamic ECRIS features a confinement mechanism in a magnetic trap that is different from Geller’s ECRIS confinement, i.e., the quasi-gasdynamic one similar to that in fusion mirror traps. Experimental studies of gasdynamic ECRIS were performed at Simple Mirror Ion Source (SMIS) 37 facility. The plasma was created by 37.5 and 75 GHz gyrotron radiation with power up to 100 kW. High frequency microwaves allowed to create and sustain plasma with significant density (up to 8 × 1013 cm−3 ) …

010302 applied physicsMaterials scienceta114ta213ion beamsPlasma01 natural sciencesIon sourceElectron cyclotron resonance010305 fluids & plasmaslaw.inventionIonlawGyrotronIonizationgasdynamic ECRIS0103 physical scienceselectron cyclotron resonance ion sourcesThermal emittanceAtomic physicsInstrumentationMicrowaveThe Review of scientific instruments
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Influence of surface topography on depth profiles obtained by Rutherford backscattering spectrometry

2000

A method for determining correct depth profiles from samples with rough surfaces is presented. The method combines Rutherford backscattering spectrometry with atomic force microscopy. The topographical information obtained by atomic force microscopy is used to calculate the effect of the surface roughness on the backscattering spectrum. As an example, annealed Au/ZnSe heterostructures are studied. Gold grains were observed on the surfaces of the annealed samples. The annealing also caused diffusion of gold into the ZnSe. Backscattering spectra of the samples were measured with a 2 MeV 4He+ ion beam. A scanning nuclear microprobe was used to verify the results by measuring backscattering fro…

010302 applied physicsMicroprobeMaterials scienceIon beamAnnealing (metallurgy)Analytical chemistryGeneral Physics and AstronomyHeterojunction02 engineering and technologyCondensed Matter::Mesoscopic Systems and Quantum Hall Effect021001 nanoscience & nanotechnologyRutherford backscattering spectrometry01 natural sciencesSpectral lineCondensed Matter::Materials Science0103 physical sciencesSurface roughness0210 nano-technologySpectroscopyJournal of Applied Physics
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Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

2018

[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.

010302 applied physicsMultipactor effectNuclear and High Energy PhysicsWaveguide (electromagnetism)Materials scienceDielectricCondensed Matter Physics01 natural sciencesSecondary electrons010305 fluids & plasmasCharacterization (materials science)Computational physicsSecondary electron emission (SEE)Secondary emission0103 physical sciencesRadio frequencyTEORIA DE LA SEÑAL Y COMUNICACIONESElectron beam processingEquivalent circuitMultipactor effectSecondary electron yield
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Analysis of thin high-k and silicide films by means of heavy ion time-of-flight forward-scattering spectrometry

2006

The use of forward scattered heavy incident ions in combination with a time-of-flight-energy telescope provides a powerful tool for the analysis of very thin (5–30 nm) films. This is because of greater stopping powers and better detector energy resolution for heavier ions than in conventional He-RBS. Because of the forward scattering angle, the sensitivity is greatly enhanced, thus reducing the ion beam induced desorption during the analysis of very thin films. The drawback of forward scattering angle is the limited mass separation for target elements. We demonstrate the performance of the technique with the analysis of 25 nm thick NiSi films and atomic layer deposited 6 nm thick HfxSiyOz f…

010302 applied physicsNuclear and High Energy PhysicsMaterials scienceIon beamSiliconbusiness.industryScatteringForward scatterchemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnology01 natural sciences7. Clean energyIonElastic recoil detectionTime of flightchemistry0103 physical sciencesOptoelectronicsAtomic physicsThin film0210 nano-technologybusinessInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Radiation-induced defects in sapphire single crystals irradiated by a pulsed ion beam

2020

Abstract The luminescence and thermal stability of defects formed in α-Al2O3 single crystals after powerful (300 keV) pulsed irradiation with C+/H+ ion beam were investigated. It was found by measuring of optical density, photoluminescence, and pulsed cathodoluminescence that ion irradiation induces both single F-, F+-centers and F2-type aggregate centers. An intense thermoluminescence band with a complex shape was observed in the broad temperature range of 350–700 K, its intensity decreases with increasing of the energy density of the ion beam. The thermal stability of the F-type defects produced in α-Al2O3 after irradiation with a pulsed ion beam is comparable to that in neutron-irradiate…

010302 applied physicsNuclear and High Energy PhysicsPhotoluminescenceMaterials scienceIon beamAnalytical chemistryCathodoluminescence02 engineering and technologyAtmospheric temperature range021001 nanoscience & nanotechnology01 natural sciencesThermoluminescenceIon0103 physical sciencesIrradiation0210 nano-technologyLuminescenceInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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