Search results for "Applied Physics"

showing 10 items of 1226 documents

Growth of titanium oxynitride layers by short pulsed Nd:YAG laser treatment of Ti plates: Influence of the cumulated laser fluence.

2009

International audience; Titanium oxynitride layerswere formed by surface laser treatment of Ti plates in air using a Nd:YAG laser source of short pulse duration about 5 ns. The cumulated laser fluence was varied in the 100–1200 J cm2 range and its influence on the composition and the structure of the formed layers was studied by different characterization techniques providing physico-chemical and structural information. It was shown that the laser treatment induces the insertion of light elements as O, N and C in the formed layer with the amount increasing with the laser fluence. The in-depth composition of the layers and the co-existence of different phases were also studied. The way in wh…

Materials scienceAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_element02 engineering and technologyLaser pumping01 natural sciencesFluencelaw.inventionTitanium oxynitridesPlasmalawLaser treatment0103 physical sciences010302 applied physicsPulse durationSurfaces and InterfacesGeneral ChemistryPlasma021001 nanoscience & nanotechnologyCondensed Matter PhysicsLaserSurfaces Coatings and FilmschemistryTitanium oxycarbidesNd:YAG laser0210 nano-technologyLayer (electronics)Titanium
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Orthorhombic boron oxide under pressure: in situ study by X-ray diffraction and Raman scattering

2016

High-pressure phase of boron oxide, orthorhombic \b{eta}-B2O3, has been studied in situ by synchrotron X-ray diffraction to 22 GPa and Raman scattering to 46 GPa at room temperature. The bulk modulus of \b{eta}-B2O3 has been found to be 169(3) GPa that is in good agreement with our ab initio calculations. Raman and IR spectra of \b{eta}-B2O3 have been measured at ambient pressure, all experimentally observed bands have been attributed to the theoretically calculated ones, and the mode assignment has been performed. Based on the data on Raman shift as a function of pressure, combined with equation-of-state data, the Gr\"uneisen parameters of all experimentally observed Raman bands have been …

Materials scienceAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_elementInfrared spectroscopyFOS: Physical sciences02 engineering and technology01 natural sciencessymbols.namesakeCondensed Matter::Materials ScienceCondensed Matter::Superconductivity0103 physical sciencesPhysics::Atomic PhysicsBoron010302 applied physicsBulk modulusCondensed Matter - Materials ScienceMaterials Science (cond-mat.mtrl-sci)021001 nanoscience & nanotechnologychemistryBoron oxideX-ray crystallographysymbolsOrthorhombic crystal system0210 nano-technologyRaman spectroscopyRaman scattering
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Structural and electrical properties of cerium tungstate: Application to methane conversion

2020

International audience; The catalytic efficiency as well as the electrical conduction mechanism of Ce2(WO4)3 powders synthetized for the oxidation of methane were investigated. Total and partial oxidation reactions were observed in the temperature range between 600 and 750 °C under CH4/dry air flux, for low CH4 concentrations. The electrical conduction mechanism is based on electron tunneling at low temperature (< 650 °C) and hopping over an ion barrier at high temperature, which favors the catalytic oxidation of CH4 in air; these mechanisms occur during the partial and total oxidation under weak gas flow. The occurrence of these types of conduction mechanism was related both to the distort…

Materials scienceAnalytical chemistrychemistry.chemical_element02 engineering and technology01 natural sciencesMethanechemistry.chemical_compoundTungstateX-ray photoelectron spectroscopyOxidation state0103 physical sciencesMaterials Chemistry[CHIM]Chemical SciencesPartial oxidation010302 applied physicsProcess Chemistry and Technology[CHIM.MATE]Chemical Sciences/Material chemistry[CHIM.CATA]Chemical Sciences/CatalysisAtmospheric temperature range021001 nanoscience & nanotechnologySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCeriumCatalytic oxidationchemistry13. Climate actionCeramics and Composites0210 nano-technology
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Antiferromagnetism and p‐type conductivity of nonstoichiometric nickel oxide thin films

2020

Plasma‐enhanced atomic layer deposition was used to grow non‐stoichiometric nickel oxide thin films with low impurity content, high crystalline quality, and p‐type conductivity. Despite the non‐stoichiometry, the films retained the antiferromagnetic property of NiO.

Materials scienceAnalytical chemistrynickel oxide02 engineering and technologyChemical vapor depositionConductivity01 natural scienceschemical vapor depositionAtomic layer deposition0103 physical scienceslcsh:TA401-492AntiferromagnetismThin film010302 applied physicslcsh:T58.5-58.64kemialliset reaktiotkemialliset ilmiötlcsh:Information technologyNickel oxidesolution depositionatomikerroskasvatus021001 nanoscience & nanotechnologyeye diseasesthin filmsatomic layer depositionlcsh:Materials of engineering and construction. Mechanics of materialssense organsohutkalvot0210 nano-technologyInfoMat
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Modification of the sheet resistance under Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructures

2018

This paper reports on the modification of the sheet resistance under Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructures, studied by means of Transmission Line Model (TLM) structures, morphological and structural analyses, as well as computer simulations. In particular, the contacts exhibited an Ohmic behaviour after annealing at 800 degrees C, with a specific contact resistance rho(c) = (2.4 +/- 0.2) x 10(-5) Omega cm(2), which was associated to morphological and structural changes of both the metal layer and the interface. Interestingly, TLM analyses gave a value of the sheet resistance under the contact (R-SK = 26.1 +/- 5.0 Omega/rectangle) significantly lower than that measured out…

Materials scienceAnnealing (metallurgy)Algan gan02 engineering and technology01 natural sciencesMetal0103 physical sciencesAlGaN/GaN heterostructuresGeneral Materials ScienceComposite materialOhmic contactSheet resistanceOhmic contacts010302 applied physicsbusiness.industryMechanical EngineeringContact resistanceTransmission Line ModelHeterojunction021001 nanoscience & nanotechnologyCondensed Matter PhysicsSemiconductorMechanics of Materialsvisual_artvisual_art.visual_art_mediumTi/Al/Ni/Au0210 nano-technologybusiness
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Study of the defects in La3Ta0.5Ga5.5O14 single crystals

2016

Abstract Defects that are formed during crystal growth pose a serious obstacle for potential application of La 3 Ga 5.5 Ta 0.5 O 14 (LGT) as a laser or piezoelectric crystal. We have performed the study of the defects origin in LGT crystals grown in different atmospheres using optical, EPR and time-resolved luminescence characterization methods. The absorption bands detected in the transparency region at 290, 360 and 490 nm ( T =300 K) demonstrate different dependence on crystal annealing in vacuum and air. EPR analysis demonstrated that the defects responsible for these bands are non-paramagnetic. X-ray irradiation results in hole trapping by oxygen ions thus forming O − centers perturbed …

Materials scienceAnnealing (metallurgy)BiophysicsMineralogyCrystal growth02 engineering and technologyCrystal structure01 natural sciencesBiochemistrylaw.inventionCrystallaw0103 physical scienceslanthanum-gallium tantalateElectron paramagnetic resonanceSpectroscopyabsorption bandsdefects010302 applied physicstime-resolved luminescenceGeneral Chemistry021001 nanoscience & nanotechnologyCondensed Matter PhysicsAtomic and Molecular Physics and OpticsCrystallographyAbsorption bandEPRpiezoelectric0210 nano-technologyLuminescenceJournal of Luminescence
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Atomic Layer Deposition and Characterization of Erbium Oxide-Doped Zirconium Oxide Thin Films

2010

ZrO 2 films doped with Er 2 O 3 were grown by atomic layer deposition from tris(2,2,6,6-tetramethyl-3,5-heptanedionato)erbium, bis(methylcyclopentadienyl)methoxymethylzirconium, and ozone as precursors at 350°C. The erbium content was 1―5 cation %. The films were uniform in thickness. The ZrO 2 :Er 2 O 3 films were crystallized already in the as-deposited state. Upon annealing at 650°C, they were stabilized in the form of cubic or tetragonal polymorph of ZrO 2 . Enhancement in capacitance required intense crystallization that was observed when the film thickness exceeded 4.4 nm. The permittivity of the ZrO 2 :Er 2 O 3 films could reach 31. The capacitors based on the doped ZrO 2 possessed l…

Materials scienceAnnealing (metallurgy)Inorganic chemistryOxideAnalytical chemistrychemistry.chemical_elementEquivalent oxide thickness02 engineering and technology01 natural scienceslaw.inventionErbiumchemistry.chemical_compoundAtomic layer depositionlaw0103 physical sciencesMaterials ChemistryElectrochemistryThin filmCrystallization010302 applied physicsRenewable Energy Sustainability and the EnvironmentDoping021001 nanoscience & nanotechnologyCondensed Matter PhysicsSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialschemistry0210 nano-technologyJournal of The Electrochemical Society
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Photoemission study of the reactivity of barium towards SiOx thermal films

2011

Abstract Barium was deposited at room temperature on a thermal silicon oxide layer and the interfacial reaction was monitored by synchrotron induced photoemission (both core level and valence band). The first step of the growth consists of an interfacial reaction which leads to the formation of an interfacial silicate layer. The next step consists in formation of barium oxide while metallic barium occurs subsequently. The deposit can be also homogenized by annealing above 575 K. This results in the formation of several layers of silicate by consumption of silicon oxide. In the case of fractional coverage, subsequent annealing at 975 K induces the decomposition of barium silicate. However, s…

Materials scienceAnnealing (metallurgy)Inorganic chemistrychemistry.chemical_element02 engineering and technology01 natural scienceslaw.inventionMetalchemistry.chemical_compoundlaw0103 physical sciencesMaterials ChemistrySilicon oxide010302 applied physicsBarium oxideChemical process of decompositionBariumSurfaces and Interfaces021001 nanoscience & nanotechnologyCondensed Matter PhysicsSynchrotronSilicateSurfaces Coatings and FilmschemistryChemical engineeringvisual_artvisual_art.visual_art_medium0210 nano-technologySurface Science
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Low-temperature atomic layer deposition of ZnO thin films: Control of crystallinity and orientation

2011

Abstract Low-temperature atomic layer deposition (ALD) processes are intensely looked for to extend the usability of the technique to applications where sensitive substrates such as polymers or biological materials need to be coated by high-quality thin films. A preferred film orientation, on the other hand, is often required to enhance the desired film properties. Here we demonstrate that smooth, crystalline ZnO thin films can be deposited from diethylzinc and water by ALD even at room temperature. The depositions were carried out on Si(100) substrates in the temperature range from 23 to 140 °C. Highly c-axis-oriented films were realized at temperatures below ~ 80 °C. The film crystallinit…

Materials scienceAnnealing (metallurgy)Mineralogy02 engineering and technology01 natural sciencesAtomic layer depositionchemistry.chemical_compoundCrystallinity0103 physical sciencesMaterials ChemistryThin filmta116010302 applied physicschemistry.chemical_classificationta114Metals and AlloysSurfaces and InterfacesPolymerDiethylzincAtmospheric temperature range021001 nanoscience & nanotechnologySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCarbon filmchemistryChemical engineering0210 nano-technologyTHIN SOLID FILMS
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Sub-gap defect density characterization of molybdenum oxide: An annealing study for solar cell applications

2020

AbstractThe application of molybdenum oxide in the photovoltaic field is gaining traction as this material can be deployed in doping-free heterojunction solar cells in the role of hole selective contact. For modeling-based optimization of such contact, knowledge of the molybdenum oxide defect density of states (DOS) is crucial. In this paper, we report a method to extract the defect density through nondestructive optical measures, including the contribution given by small polaron optical transitions. The presence of defects related to oxygen-vacancy and of polaron is supported by the results of our opto-electrical characterizations along with the evaluation of previous observations. As part…

Materials scienceAnnealing (metallurgy)Oxide02 engineering and technologyPolaronSettore ING-INF/01 - Elettronica01 natural scienceslaw.inventionmolybdenum oxidechemistry.chemical_compoundlaw0103 physical sciencesThermalSolar cellGeneral Materials Sciencepolaron theoryElectrical and Electronic Engineering010302 applied physicsbusiness.industrysilicon heterojunction solar cellHeterojunction021001 nanoscience & nanotechnologyCondensed Matter PhysicsAtomic and Molecular Physics and Opticschemistrymolybdenum oxide density of states polaron theory silicon heterojunction solar celldensity of statesDensity of statesOptoelectronicsDensity functional theory0210 nano-technologybusiness
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