Search results for "Atomic Force"
showing 10 items of 308 documents
Sintering process of amorphous SiO2 nanoparticles investigated by AFM, IR and Raman techniques
2011
We report an experimental investigation on the effects of thermal treatments at different temperatures (room-1270 K) and for different duration (0-75 h) on amorphous silica nanoparticles (fumed silica) in powder tablet form. Three types of fumed silica are considered, comprising nearly spherical particles of 40 nm, 14 nm and 7 nm mean diameter. The experimental techniques used here are Raman and infrared absorption (IR) spectroscopy together with atomic force microscopy (AFM). Raman and IR spectra indicate that the structure of nanometer silica particles is significantly different with respect to that of a bulk silica glass. In particular, the main differences regard the positions of the IR…
Observation directe de la croissance d'hydrosilicate de calcium sur des surfaces d'alité et de silice par microscopie à force atomique
1998
Direct observation of the growth of calcium silicate hydrates, the tricalcium silicate hydration products, at the solid-solution interface were performed by atomic force microscopy. The covering of the surface of alite or silica by a three-dimensional oriented aggregation of nano particles of calcium silicate hydrate is always observed whatever the sample. All observations and quantifications made on calcium silicate growth at the submicronic level are in agreement with the data deduced from the study of the system evolution at the macroscopic level.
Non-destructive technique to detect local buried defects in metal sample by scanning microwave microscopy
2012
International audience; Based on the skin effect, our recent developments using scanning microwave microscopy lead to propose a non-destructive method to detect located buried defect in metal samples like stainless steel. A 3D tomography is possible by taking advantage of microwave measurement, using a vector network analyzer in bandwidth frequencies, and the nanometer resolution positioning capabilities with atomic force microscopy. At each used frequency, an incident electromagnetic wave is sent to the sample and the reflected wave gives information on a specific depth layer in the material. With diagnostic tools of nanotechnologies (SEM. AFM, etc.), different stainless steel samples (fro…
Measurements of thickness dispersion in biolayers by scanning force microscopy and comparison with spectroscopic ellipsometry analysis.
2007
Measuring the thickness of biological films remains a difficult task when using differential measurements by atomic force microscopy (AFM). The use of microstructured substrates combined with a selective adsorption constitutes an alternative to tribological measurements. The statistical thickness analysis of biological layers, especially via the dispersion measurements, can provide a way to quantify the molecular orientation. AFM thicknesses were then compared with those obtained optically by spectroscopic ellipsometry (SE) and surface plasmon resonance enhanced ellipsometry (SPREE). The biolayers could then be modeled using a vertical gradient of optical index, which reflects height disper…
Assembly of citrate gold nanoparticles on hydrophilic monolayers
2016
Abstract Self-assembled monolayers (SAMs) as model surfaces were linked onto planar gold films thorough lipoic acid or disulfide groups. The molecules used were polyethylene glycol (EG-S-S), N -[tris-(hydroxymethyl)methyl]acrylamide polymers with and without lipoic acid (Lipa-pTHMMAA and pTHMMAA) and a lipoic acid triazine derivative (Lipa-MF). All the layers, but Lipa-MF with a primary amino group were hydroxyl terminated. The layers were characterized by contact angle measurements and atomic force microscopy, AFM. Citrate stabilized nanoparticles, AuNPs in water and phosphate buffer were allowed to assemble on the layers for 10 min and the binding was followed in real-time with surface pl…
Spin-polarized scanning tunneling microscopy and spectroscopy of ultrathinFe∕Mo(110)films usingW∕Au∕Cotips
2006
We report on magnetic contrast observed in low-temperature spin-polarized scanning tunneling microscopy (SP-STM) of Fe nanowires deposited on Mo(110) using tungsten tips covered by $\mathrm{Au}∕\mathrm{Co}$ thin films. Due to the spin reorientation transition of Co films on Au an out-of-plane magnetic sensitivity is obtained for tips with thin cobalt films (up to 8 monolayers of Co), while for thicker Co coverages an in-plane magnetization component can be probed. Using $\mathrm{W}∕\mathrm{Au}∕\mathrm{Co}$ tips with out-of-plane magnetic sensitivity we show that the one (ML) and two (DL) atomic layers thick Fe nanowires prepared using step flow growth on a Mo(110) crystal are perpendicularl…
Synthesis and characterisation of ordered arrays of mesoporous carbon nanofibres
2009
A facile and reproducible one-step pathway has been developed for preparing ordered arrays of mesoporous carbon nanostructures within the pores of anodized aluminium oxide (AAO) membranes, through the confined self-assembly of phenol/formaldehyde resol and amphiphilic copolymer templates. The morphology of the mesoporous carbon nanostructures can be controlled by varying the copolymer surfactant, the quantity of the resol–surfactant precursor sol used and the amount of phenol–formaldehyde resol introduced into the resol–surfactant sol. One-dimensional (1-D) carbon nanostructures, such as carbon fibres with a core–shell structure and carbon ribbons with circular mesopores running parallel to…
Conductive films of ordered nanowire arrays
2004
peer-reviewed High-density, ordered arrays of germanium nanowires have been synthesised within the pores of mesoporous thin films (MTFs) and anodized aluminium oxide (AAO) matrices using a supercritical fluid solution-phase inclusion technique. Conductive atomic force microscopy (C-AFM) was utilised to study the electrical properties of the nanowires within these arrays. Nearly all of the semiconductor nanowires contained within the AAO substrates were found to be conducting. Additionally, each individual nanowire within the substrate possessed similar electrical properties demonstrating that the nanowires are continuous and reproducible within each pore. C-AFM was also able to probe the co…
Atomic Force Microscopy Study of Yeast Cells Influenced by High Voltage Electrical Discharge
2008
Human cells are the eukaryotic ones. Simulation of wide-spectrum electromagnetic radiation influence on eukaryotic cells was performed with yeast which is usually used now in molecular biological and medical biological investigations as the ideal model of eukaryotic system. The aim of the research was to observe possible induced alterations of the cell morphology. Atomic force microscopy (AFM) and electron scanning microscopy (ESM) have been applied to image the surface of cells exposed to electromagnetic radiation.
Adhesion and Friction Forces between Spherical Micrometer-Sized Particles
1999
An experimental setup, based on the principles of atomic force microscopy (AFM), was used to measure directly the adhesion and rolling-friction forces between individual silica microspheres of radii between 0.5 and 2.5 \ensuremath{\mu}m. It showed that the linear dependence of the pull-off force on the particle radius is still valid for micron-sized particles. Rolling-friction forces between silica microspheres were measured for the first time by combining AFM methods and optical microscopy: They are $\ensuremath{\sim}100$ times lower than the corresponding adhesion forces.