Search results for "Diffraction"

showing 10 items of 1584 documents

Elucidating structural order and disorder phenomena in mullite-type Al4B2O9 by automated electron diffraction tomography

2017

The crystal structure and disorder phenomena of Al4B2O9, an aluminum borate from the mullite-type family, were studied using automated diffraction tomography (ADT), a recently established method for collection and analysis of electron diffraction data. Al4B2O9, prepared by sol-gel approach, crystallizes in the monoclinic space group C2/m. The ab initio structure determination based on three-dimensional electron diffraction data from single ordered crystals reveals that edge-connected AlO6 octahedra expanding along the b axis constitute the backbone. The ordered structure (A) was confirmed by TEM and HAADF-STEM images. Furthermore, disordered crystals with diffuse scattering along the b axis…

DiffractionReflection high-energy electron diffractionMaterials scienceGas electron diffraction02 engineering and technologyCrystal structure010402 general chemistry021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciences0104 chemical sciencesElectronic Optical and Magnetic MaterialsInorganic ChemistryDiffraction tomographyCrystallographyElectron diffractionMaterials ChemistryCeramics and CompositesPhysical and Theoretical Chemistry0210 nano-technologySuperstructure (condensed matter)Electron backscatter diffractionJournal of Solid State Chemistry
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Towards automated diffraction tomography: Part I—Data acquisition

2007

Abstract The ultimate aim of electron diffraction data collection for structure analysis is to sample the reciprocal space as accurately as possible to obtain a high-quality data set for crystal structure determination. Besides a more precise lattice parameter determination, fine sampling is expected to deliver superior data on reflection intensities, which is crucial for subsequent structure analysis. Traditionally, three-dimensional (3D) diffraction data are collected by manually tilting a crystal around a selected crystallographic axis and recording a set of diffraction patterns (a tilt series) at various crystallographic zones. In a second step, diffraction data from these zones are com…

DiffractionReflection high-energy electron diffractionbusiness.industryChemistryAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsData setDiffraction tomographyOpticsData acquisitionPrecession electron diffractionSelected area diffractionbusinessInstrumentationElectron backscatter diffractionUltramicroscopy
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Ab Initio Structure Determination of Vaterite by Automated Electron Diffraction

2012

tion that is fundamental for understanding material properties. Still, a number of compounds have eluded such kinds of analysis because they are nanocrystalline, highly disordered, with strong pseudosymmetries or available only in small amounts in polyphasic or polymorphic systems. These materials are crystallographically intractable with conventional Xray or synchrotron radiation diffraction techniques. Single nanoparticles can be visualized by high-resolution transmission electron microscopy (HR-TEM) up to sub�ngstrom resolution, [2] but obtaining 3D information is still a difficult task, especially for highly beam-sensitive materials and crystal structures with long cell parameters. Elec…

DiffractionReflection high-energy electron diffractionmetastable phaseElectron crystallographyChemistryResolution (electron density)Analytical chemistrybiomineralization; calcium carbonate; electron crystallography; metastable phase; structure determinationElectronsGeneral ChemistrybiomineralizationCatalysisNanocrystalline materialstructure determinationAutomationCrystallographyelectron crystallographyX-Ray DiffractionElectron diffractionMicroscopy Electron ScanningNanoparticlescalcium carbonateAntacidsPowder diffractionElectron backscatter diffraction
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On the existence of a pyrochlore-type phase in the system Bi2O3–TiO2

1995

The existence of a bismuth titanate in the range between Bi 2 Ti 4 O 11 (Bi 2 O 3 . 4 TiO 2 ) and Bi 4 Ti 3 O 12 (2 Bi 2 O 3 . 3 TiO 2 ) has been investigated by X-ray diffraction of samples prepared by solid state reactions. For reaction temperatures above 1100 °C and a starting composition Bi 2 O 3 . 2 TiO 2 there appeared additional lines which could be attributed to a cubic face-centred cell with a = 10.354 A. A multiphase Rietveld analysis based on X-ray powder diffraction data confirmed the structural model of a pyrochlore for this compound. There is evidence that this phase belongs to the group of defect pyrochlores with a Bi 3+ -deficiency resulting in a composition of Bi 1.833 Ti 2…

DiffractionRietveld refinementBismuth titanatePyrochloreMineralogyGeneral ChemistryCrystal structureengineering.materialCondensed Matter Physicschemistry.chemical_compoundCrystallographychemistryPhase (matter)engineeringGeneral Materials ScienceChemical compositionPowder diffractionCrystal Research and Technology
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Isomerism in [MCl2(ERR‘)2] (M = Pd, Pt; E = S, Se; R, R‘ = Me, Ph)

2006

A series of thioether and selenoether complexes [MCl2(EPh2)2] and [MCl2(SMePh)2] (M = Pt, Pd; E = S, Se) have been prepared and characterized to explore the isomerism of the complexes in solution and in the solid state. The NMR spectroscopic information indicates that only one isomer is present in solution in case of the palladium complexes, while two isomers are formed in the case of most platinum complexes. Single-crystal X-ray structures of trans-[PdCl2(SPh2)2] (1t), trans-[PdCl2(SePh2)2] (2t), cis-[PtCl2(SePh2)2] (4c), trans-[PdCl2(SMePh)2] (5t), and trans-[PtCl2(SMePh)2] (7t) are reported and have been used as starting points for the X-ray powder diffraction structure determinations us…

DiffractionRietveld refinementSolid-statechemistry.chemical_elementGeneral ChemistryCondensed Matter Physicschemistry.chemical_compoundCrystallographyThioetherchemistrySolid phasesGeneral Materials SciencePlatinumPowder diffractionPalladiumCrystal Growth & Design
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Liquid Structure of Trihexyltetradecylphosphonium Chloride at Ambient Temperature: An X-ray Scattering and Simulation Study

2009

We report on an experimental and simulation study done on a representative room temperature ionic liquid, namely tetradecyltrihexylphosphonium chloride, at ambient conditions. The study was conducted using small and wide angle X-ray scattering and molecular dynamics simulations. Both approaches converge in indicating that this material is characterized by the existence of strong P-Cl interactions (with characteristic distances between 3.5 and 5.0 Å) and by the occurrence of nanoscale segregation, despite the symmetric nature of the cation and similarly to other room temperature ionic liquids. A good agreement is found between the structure factor and pair correlation functions obtained from…

DiffractionSTRUCTUREclean technologysaltsAnalytical chemistrydiffractionChlorideionic liquidsMolecular dynamicschemistry.chemical_compoundSettore CHIM/02Materials ChemistrymedicinecrystallinePhysical and Theoretical ChemistrySettore CHIM/02 - Chimica FisicaScatteringChemistryIONIC LIQUIDS; SIMULATION; STRUCTUREX-rayObservableSurfaces Coatings and Filmsphosphonium halidessolventsclean technology; crystalline; diffraction; extraction; ionic liquids; phosphonium halides; salts; solventsChemical physicsIonic liquidSIMULATIONextractionStructure factormedicine.drug
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Vapor growth of Hg1−xCdxI2 on glass using CdTe buffer

2001

Abstract Vapor phase epitaxy (VPE) of Hg1−xCdxI2 layers on glass substrates covered by a CdTe buffer layer has been studied. The buffer layers of 2–4 μm thickness were formed by VPE using polycrystalline CdTe and Cd metal sources. The Hg1−xCdxI2 layers were grown using a (Hg1−yCdy)1−z(I2)z polycrystalline source, with a composition in the range of y=0.1–0.5 and z=0.5–0.8. Scanning electron microscopy and X-ray diffraction studies have shown that the composition and structure of Hg1−xCdxI2 layers depend strongly on the VPE conditions. Varying the growth time and source composition, it has been possible to obtain Hg1−xCdxI2 layers with the composition x in the range from approximately 0 (HgI2…

DiffractionScanning electron microscopeChemistrybusiness.industryMetals and AlloysAnalytical chemistrySurfaces and InterfacesEpitaxyCadmium telluride photovoltaicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsMetalTetragonal crystal systemOpticsvisual_artMaterials Chemistryvisual_art.visual_art_mediumCrystallitebusinessLayer (electronics)Thin Solid Films
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X-ray diffraction line broadening on vibrating dry-milled Two Crows sepiolite

2006

A reference sample of sepiolite and products of its comminution by vibrating dry-milling have been studied using X-ray diffraction (XRD) line-broadening analysis, complementary field emission scanning electron microscopy (FESEM) images and surface area measurements. The apparent crystallite sizes determined via XRD are in agreement with observations on FESEM images. The sepiolite aggregates consist of lath-shaped agglutinations of prisms and pinacoids elongated along [001], each lath including several crystallites in that direction. The surface area magnitudes are in the range of previous experimental measurements of other sepiolites. The results obtained show the effectiveness of vibro-mil…

DiffractionScanning electron microscopeCrystalline Lattice StrainSepioliteAnalytical chemistrySoil ScienceMineralogyLathengineering.materialchemistry.chemical_compoundReference ClayGeochemistry and PetrologyNevada SepioliteEarth and Planetary Sciences (miscellaneous)Crystallite SizeWater Science and TechnologySepioliteX-ray DiffractionLine BroadeningSurface AreaSilicatechemistryX-ray crystallographyengineeringCrystalliteComminutionGeologyClays and Clay Minerals
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Investigation of Silicon Carbide Polytypes by Raman Spectroscopy

2014

Abstract Polytypes of colourless and coloured single crystals of silicon carbide (SiC) grown on SiC substrates by chemical vapour deposition are studied using Raman spectroscopy supplemented by scanning electron microscopy (SEM) and X-ray diffraction (XRD) analyses. The SEM analysis of the defect stacking faults, inclusions of defects and their distribution has shown that they correlate with the peak positions of the obtained Raman spectra and with the XRD data on the crystal structure

DiffractionScanning electron microscopePhysicsQC1-999General EngineeringStackingAnalytical chemistryGeneral Physics and AstronomySem analysisChemical vapor depositionCrystal structurex-ray diffraction (xrd)silicon carbide (sic)symbols.namesakechemistry.chemical_compoundraman spectroscopychemistrysymbolsSilicon carbidepolytypesRaman spectroscopyLatvian Journal of Physics and Technical Sciences
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Fourier optical approach to the extraction of morphological parameters from the diffraction pattern of biological cells.

1978

A new procedure for fast quantitative extraction of cell parameters from diffraction patterns was deduced from model calculations and applied to cervical gynecological material. Based on radial scans of the diffraction pattern, the technique permits simultaneous determination of the nuclear and cytoplasmic diameters by Fourier analysis of the radial scanning signals after compensation for the intensity falloff by an amplification proportional to the third power of the radial position in the diffraction plane. Illustrative examples of measurements on exfoliated cells of different types are presented.

DiffractionScatteringbusiness.industryPlane (geometry)Materials Science (miscellaneous)Physics::Medical PhysicsIndustrial and Manufacturing EngineeringPtychographyLight scatteringIntensity (physics)symbols.namesakeOpticsFourier transformFourier analysissymbolsBusiness and International ManagementbusinessApplied optics
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