Search results for "FLE"

showing 10 items of 3517 documents

Comparison of total-reflection X-ray fluorescence, static and portable energy dispersive X-ray fluorescence spectrometers for art and archeometry stu…

2004

Abstract In this paper, a Total-reflection X-ray Fluorescence (TXRF), a static and a portable Energy Dispersive X-ray Fluorescence (EDXRF) spectrometers are described. Both the equipments and the techniques employed in the field of the art and archeometry are compared. Some applications in this area are presented as well. The aim of the work is to know which spectrometer is the best suited depending on the work of art and the problem treated. The conclusion reached from the experience is that the portable EDXRF spectrometer is advisable to make “in situ” and online analysis in a multidisciplinary environment, the static EDXRF equipment is good to perform analysis on paper and metal pieces a…

Total internal reflectionMaterials scienceSpectrometerbusiness.industrySensitive analysisX-ray fluorescenceAtomic and Molecular Physics and OpticsAnalytical ChemistryOnline analysisOpticsbusinessInstrumentationSpectroscopyEnergy (signal processing)Spectrochimica Acta Part B: Atomic Spectroscopy
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Effect of uniaxial deformation on the optical scattering losses of a semicrystalline fluorocopolymer.

1997

Both small- and wide-angle light scattering as well as transmission measurements have been used to investigate the optical scattering losses of a vinylidene difluoride–tetrafluoroethylene–hexafluoropropylene copolymer crystallized from the melt. The main origin of the scattering loss is the wide-angle light scattering from the spherulitic superstructure. Uniaxial deformation transforms this structure into a fiber morphology. The attenuation of fibers has been measured for light propagating both parallel and perpendicular to the orientation axis. For both directions, the attenuation decreases with increasing draw ratio. Annealing of the fibers while keeping their ends fixed is an effective m…

Total internal reflectionMaterials sciencebusiness.industryAnnealing (metallurgy)Materials Science (miscellaneous)AttenuationIndustrial and Manufacturing EngineeringLight scatteringCrystallinityOpticsAttenuation coefficientPerpendicularBusiness and International ManagementbusinessRefractive indexApplied optics
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Emission of Rhodamine B in PMMA opals for luminescent solar concentrators

2012

In conventional luminescent solar concentrators (LSC) incident light is absorbed by luminophores and emitted isotropically. Most of the emitted light is trapped inside the LSC by total internal reflection and guided to solar cells at the edges. Light emitted towards the surfaces, however, is lost in the escape cone. Furthermore, when the luminophore emits light in its absorption range, light is lost due to reabsorption. To overcome these losses, we embed the luminescent material in photonic structures to influence the emission characteristics. Directional and spectral redistribution of emission is supposed to enhance the light guiding in LSCs and reduce reabsorption losses. For this purpose…

Total internal reflectionMaterials sciencebusiness.industryLuminescent solar concentratorRaychemistry.chemical_compoundOpticschemistryRhodamine BLuminophoreOptoelectronicsPhotonicsbusinessLuminescencePhotonic crystalPhotonics for Solar Energy Systems IV
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Bloch Modes Coupling in Photonic Crystal Waveguides

2005

We investigate the properties of Bloch modes inside a photonic crystal waveguide. By using simultaneously a near field optical microscope and a transmittance setup, we demonstrate that Bloch modes having different parity are coupled.

Total internal reflectionMaterials sciencebusiness.industryPhysics::OpticsParity (physics)OpticsMicroscopyTransmittanceOptoelectronicsNear-field scanning optical microscopeCrystal opticsbusinessElectron-beam lithographyPhotonic crystalIntegrated Photonics Research and Applications/Nanophotonics for Information Systems
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Quality Factor Measurements for PMMA WGM Microsphere Resonators Using Fixed Wavelength Laser and Temperature Changes

2019

The whispering gallery modes (WGM) resonators are based on spherical objects, which are made from optically transparent materials, and are capable of maintaining circulating optical waves, inside the sphere, using total internal reflection. If there is a monochromatic light source which supplies the sphere with a constant intensity, the wave moving along the perimeter of sphere starts to constructively interfere. In this case the resonance happens, which is called whispering gallery mode (WGM). The current work explores the possibility of using temperature changes to measure polymethyl methacrylate (PMMA) WGM microsphere resonator quality factor (Q) and thermal expansion parameters. Differe…

Total internal reflectionMaterials sciencebusiness.industryPhysics::OpticsResonanceLaserlaw.inventionWavelengthResonatorOpticslawQ factorMonochromatic colorWhispering-gallery wavebusiness2019 IEEE 9th International Conference Nanomaterials: Applications & Properties (NAP)
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Photon Scanning Tunneling Microscopy and Reflection Scanning Microscopy

1991

The Photon Scanning Tunneling Microscope (PSTM) is the photon analogue to the Electron Scanning Tunneling Microscope (ESTM). It uses the evanescent field due to the total internal reflection (TIR) of a light beam in a prism modulated by a sample attached to the prism. The exponential decay of the evanescent field is characterized by the penetration depth dp and depends on the angle of incidence θ, the wavelength and polarization of the incident beam. Changes in intensity are monitored by a probe tip scanned over the surface, and the data are processed to generate an image of the sample. Images produced by a prototype instrument are shown to have a vertical resolution of about 3 A and a late…

Total internal reflectionMaterials sciencebusiness.industryScanning confocal electron microscopyPhysics::OpticsScanning capacitance microscopylaw.inventionScanning probe microscopyOpticslawMicroscopyPrismScanning tunneling microscopebusinessVibrational analysis with scanning probe microscopy
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Back-scattering of whispering-gallery-modes resonances of cylindrical microcavities: Refractometric applications

2009

Whispering-gallery modes (WGM) resonances of microcapillaries are directly compatible with microfluidic systems and have demonstrated its suitability for refractometric applications [1]. Microcapillaries with a submicrometric wall exhibit very large wavelength shifts as a function of the refractive index of the liquids that fill the inside of the capillary [2]. The spatial separation between the surface where the total internal reflection takes place (the outer surface) and the sensing surface (the inner surface) where the wave interacts with the analyte is a unique property that can be exploited to deal with analytes with a refractive index higher than that of the capillary [2].

Total internal reflectionMaterials sciencebusiness.industryScatteringPhysics::OpticsPhysics::Fluid DynamicsWavelengthOpticsSurface waveReflection (physics)OptoelectronicsWhispering-gallery wavebusinessRefractive indexRefractometryCLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference
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Refractometric sensor based on whispering-gallery modes of thin capillarie.

2009

Whispering-gallery modes resonances of submicron wall thickness capillaries exhibit very large wavelength shifts as a function of the refractive index of the medium that fills the inside. The sensitivity to refractive index changes is larger than in other optical microcavities as microspheres, microdisks and microrings. The outer surface where total internal reflection takes place remains always in air, enabling the measure of refractive index values higher than the refractive index of the capillary material. The fabrication of capillaries with submicron wall thickness has required the development of a specific technique. A refractometer with a response higher than 390 nm per refractive ind…

Total internal reflectionMaterials sciencebusiness.industryÒpticaAtomic and Molecular Physics and OpticsWavelengthOpticsRefractometerSurface waveOptoelectronicsWhispering-gallery wavebusinessStep-index profileRefractometryRefractive indexOptics express
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Sample–tip coupling efficiencies of the photon-scanning tunneling microscope

1991

The photon-scanning tunneling microscope is the photon analog to the electron-scanning tunneling microscope. It uses the evanescent field due to the total internal reflection of a light beam in a prism, modulated by a sample attached to the prism. The exponential decay of the evanescent field is characterized by the penetration depth dp and depends on the angle of incidence θ, the wavelength, and the polarization of the incident beam. The 1/e decay lengths range from 150 to 265 nm as deduced from the expression of the electric-field intensity in the rarer medium for θ = π/2. If we place another optically transparent medium near the surface, frustrated total reflection occurs. It is shown th…

Total internal reflectionMicroscopeMaterials sciencebusiness.industryScanning tunneling spectroscopyPhysics::OpticsAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionOpticslawLight beamComputer Vision and Pattern RecognitionExponential decayScanning tunneling microscopebusinessPenetration depthRefractive indexJournal of the Optical Society of America A
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Recent Experimental Results with the PSTM: - Observation of a Step on a Quartz Surface. - Spatial Spectroscopy of Microwaveguides

1993

The Photon Scanning Tunneling Microscope (PSTM) is based on the frustration of the total internal reflected beam by the end of an optical fiber. Till today it has been used to obtain topographic information generally for smooth samples. In this paper we report two different kinds of experimental results. First, when the sample is in the form of a step, our measurements demonstrate how the images, obtained in the constant intensity mode, depend on the orientation of the incident beam of light with respect to the step. Next, we show that the first derivative of the collected intensity with respect to the probe-sample distance at each point of the sample yields to a new kind of image named her…

Total internal reflectionOptical fiberMaterials sciencePhotonOrientation (computer vision)business.industrylaw.inventionOpticslawScanning tunneling microscopeSpectroscopybusinessRefractive indexBeam (structure)
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