Search results for "Force Microscopy"

showing 10 items of 247 documents

Early bone healing around implant surfaces treated with variations in the resorbable blasting media method. A study in rabbits.

2010

Objective: this study aimed to histomorphologically and histomorphometrically evaluate the in vivo response to three variations in the resorbable blasting media (RBM) surface processing in a rabbit femur model. Study Design: screw root form implants with 3.75 mm in diameter by 8 mm in length presenting four surfaces (n=8 each): alumina-blasted/acid-etched (AB/AE), bioresorbable ceramic blasted (TCP), TCP + acid etching, and AB/AE + TCP were characterized by scanning electron microscopy (SEM) and atomic force microscopy (AFM). The implants were placed at the distal femur of 8 New Zeland rabbits, remaining for 2 weeks in vivo. After sacrifice, the implants were nondecalcified processed to 30 …

Dental ImplantsMaterials scienceSurface PropertiesScanning electron microscopeAtomic force microscopymedicine.medical_treatmentBone healing:CIENCIAS MÉDICAS [UNESCO]OtorhinolaryngologyUNESCO::CIENCIAS MÉDICASDental EtchingMicroscopy Electron ScanningmedicineAnimalsSurgeryFemurFemurRabbitsDental EtchingImplantDental implantGeneral DentistryRock blastingBiomedical engineeringMedicina Oral Patología Oral y Cirugia Bucal
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Complex Ordering in Thin Films of Di- and Trifunctionalized Hexaalkoxytriphenylene Derivatives

1997

We have used pressure−area isotherms, X-ray diffraction, atomic force microscopy, and infrared dichroism to study Langmuir and Langmuir−Blodgett films of 2,3,6,7,10,11-hexaalkoxytriphenylenes which...

DiffractionCrystallographyLangmuirColloid and Surface ChemistryInfrared dichroismAtomic force microscopyChemistryGeneral ChemistryThin filmBiochemistryCatalysisJournal of the American Chemical Society
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Electric and dielectric properties of nanostructured stoichiometric and excess-iron Ni–Zn ferrites

2013

In this paper, we report a study of the effect of excess iron on structural, microstructural, electric and dielectric properties of the nanostructured Ni–Zn ferrites Ni1−xZnxFe2+zO4−δ of different compositions with x = 0, 0.3, 0.5, 0.7, 1 and z = 0, 0.1. The structural and microstructural properties are estimated from x-ray diffraction and atomic force microscopy (AFM) data. The average grain size, evaluated from AFM topographical analysis, is found to be below 70 nm. The samples exhibit low values of dielectric constant and dielectric loss and a high resistivity. Contrary to earlier conclusions regarding microstructured Ni–Zn ferrites, in nanostructured Ni–Zn ferrites sintered at relativel…

DiffractionMaterials scienceElectrical resistivity and conductivityAtomic force microscopyAnalytical chemistryDissipation factorDielectric lossDielectricCondensed Matter PhysicsMathematical PhysicsAtomic and Molecular Physics and OpticsStoichiometryGrain sizePhysica Scripta
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Ferroelastic Fingerprints in Methylammonium Lead Iodide Perovskite

2016

Methylammonium lead iodide (MAPbI3) perovskite shows an outstanding performance in photovoltaic devices. However, certain material properties, especially the possible ferroic behavior, remain unclear. We observed distinct nanoscale periodic domains in the piezoresponse of MAPbI3(Cl) grains. The structure and the orientation of these striped domains indicate ferroelasticity as their origin. By correlating vertical and lateral piezoresponse force microscopy experiments performed at different sample orientations with X-ray diffraction, the preferred domain orientation is suggested to be the a1–a2-phase. The observation of these ferroelastic fingerprints appears to strongly depend on the film t…

Diffractionchemistry.chemical_classificationPhase transitionMaterials scienceFerroelasticityIodide02 engineering and technology010402 general chemistry021001 nanoscience & nanotechnology01 natural sciences0104 chemical sciencesSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCrystallographyGeneral EnergyPiezoresponse force microscopychemistryChemical physicsTexture (crystalline)Physical and Theoretical Chemistry0210 nano-technologyNanoscopic scalePerovskite (structure)The Journal of Physical Chemistry C
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Preliminary results on the electrostatic double-layer force between two surfaces with high surface potentials

1998

Abstract The aim of this study is to measure interaction forces between surfaces with high electric potentials in aqueous electrolyte solutions. Therefore the force between a gold sample and a gold sphere attached to the end of an atomic force microscope cantilever was measured. Gold sample and sphere were electrically connected and served as the working electrode. A potential was applied via a platinized platinum electrode. Experimental results are compared to forces approximated with the Poisson-Boltzmann theory.

Double layer (biology)CantileverWorking electrodePhysics::Instrumentation and DetectorsAtomic force microscopyElectrostatic force microscopeSurface forceAnalytical chemistrychemistry.chemical_elementMolecular physicsColloid and Surface ChemistrychemistryElectrodePlatinumColloids and Surfaces A: Physicochemical and Engineering Aspects
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The thin and medium filters of the EPIC camera on-board XMM-Newton: measured performance after more than 15 years of operation

2016

After more than 15 years of operation of the EPIC camera on board the XMM-Newton X-ray observatory, we have reviewed the status of its Thin and Medium filters. We have selected a set of Thin and Medium back-up filters among those still available in the EPIC consortium and have started a program to investigate their status by different laboratory measurements including: UV/VIS transmission, Raman scattering, X-Ray Photoelectron Spectroscopy, and Atomic Force Microscopy. Furthermore, we have investigated the status of the EPIC flight filters by performing an analysis of the optical loading in the PN offset maps to gauge variations in the optical and UV transmission. We both investigated repea…

EPIC01 natural sciencesfilters; X-rays: instrumentation; X-rays: XMM-Newton; Astronomy and Astrophysics; Space and Planetary Science [X-rays]symbols.namesakeApparent magnitudeOpticsSettore FIS/05 - Astronomia E AstrofisicaObservatory0103 physical sciencesX-rays: XMM-NewtonStatistical analysis010306 general physics010303 astronomy & astrophysicsRemote sensingX-rays: instrumentationPhysicsbusiness.industryAtomic force microscopyX-rays: filterDetectorAstronomy and AstrophysicsAstronomy and AstrophysicOn boardSpace and Planetary SciencesymbolsbusinessRaman scattering
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Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

2018

In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film transistors or on cross sections of functional solar cells. Quantitative surface potential measurements are crucial for understanding the operation principles of functional nanostructures in these electronic devices. Nevertheless, KPFM is prone to certain imaging artifacts, such as crosstalk from topography or stray electric fields. Here, we compare different amplitude modulation (AM) and frequency modulation (FM) KPFM methods on a reference s…

FM-KPFMMaterials scienceNanostructureGeneral Physics and Astronomy02 engineering and technologylcsh:Chemical technology01 natural sciencesAM-KPFMlcsh:TechnologyFull Research Paperlaw.inventioncrosstalkfield effect transistorlawElectric field0103 physical sciencesMicroscopySolar cellNanotechnologyfrequency modulation sidebandGeneral Materials Sciencelcsh:TP1-1185Electrical and Electronic Engineeringlcsh:Sciencequantitative Kelvin probe force microscopy010302 applied physicsKelvin probe force microscopecross sectionbusiness.industrylcsh:Tfrequency modulation heterodyne021001 nanoscience & nanotechnologyAM off resonanceAM lift modelcsh:QC1-999NanoscienceAM second eigenmodesolar cellsOptoelectronicsField-effect transistorlcsh:Q0210 nano-technologybusinessFrequency modulationlcsh:PhysicsVoltageBeilstein Journal of Nanotechnology
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Nanofabrication of TaS2 conducting layers nanopatterned with Ta2O5 insulating regions via AFM

2013

It is demonstrated how local oxidation nanolithography performed with an atomic force microscope (AFM-LON) may be successfully employed for the nanopatterning of insulating regions of Ta2O5 on TaS2 ultrathin metallic layers. This provides a simple approach for the fabrication of electronic devices, such as single-electron transistors, at the nanoscale.

FabricationNanolithographyMaterials sciencelawAtomic force microscopyTransistorMaterials ChemistryNanotechnologyGeneral ChemistryElectronicsLocal oxidation nanolithographyNanoscopic scalelaw.inventionJournal of Materials Chemistry C
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Nanomanufacturing/Nanotechnology

2008

This chapter provides comprehensive knowledge regarding the fabrication of nanoproducts and element of micro-electromechanical systems using various techniques and processes. Both well-established techniques, such as nanomachining (ultra-precision) and new trends in improving nanoprocesses taking into account AFM, laser beam machining, electron beam machining processes are overviewed. The background of nanomachining processes, including typical machining operations such as turning, milling and grinding and different construction materials (metallic and nonmetallic), is outlined. The physical mechanisms responsible for the transition from brittle to ductile regime machining are explained. Mo…

FabricationNanomanufacturingElectron beam machiningMachiningAtomic force microscopyComputer scienceSystem of measurementLaser beam machiningNanotechnologyGrinding
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Organic fractal nano-dimensional structures based on fullerene C60

2019

The ways for a synthesis of nanoporous and close-packed types of fullerene C60 aggregates in two-component organic solvents (toluene + tetrahydrofuran) were established as well as their structural ...

FullereneMaterials scienceAtomic force microscopyNanoporousOrganic Chemistry02 engineering and technology010402 general chemistry021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and Optics0104 chemical sciencesSolventFractalChemical engineeringNano-General Materials SciencePhysical and Theoretical Chemistry0210 nano-technologyFullerenes, Nanotubes and Carbon Nanostructures
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