Search results for "Noise Figure"
showing 7 items of 27 documents
Fast and efficient procedures for determining the microwave noise parameters of HEMT's at decreasing temperatures
1998
Noise parameters are an electrical representation of the noise performance of transistors which is widely used in reliability studies as well as in the design of low-noise microwave amplifiers. Such parameters are usually determined by employing a complex indirect (standard) procedure based on multiple noise figure measurements and appropriate data processing techniques. We report here two altemative and rapid methods used to perform the complete noise characterization of HEMT's at decreasing temperatures over the 6 to 18 GHz frequency range. The results show a very satisfactory agreement.among the different procedures thus assessing the inherent consistency of the global approach to the pr…
Computer-Aided Simultaneous Determination of Noise and Gain Parameters of Microwave Transistors
1979
A new method for the determination of noise and gain parameters of microwave linear two-ports (transistors) is presented. The method allows the simultaneous determination of the two parameter sets through a proper computer-aided procedure which processes the experimental data obtained from a measuring system employing noise meters and generators only. Experimental verifications carried-out on a microwave low noise transistor in S-band are reported.
Up to Date Version of a Computer-Driven Noise Figure Measuring System for the Simultaneous Determination of Noise, Gain and Scattering Parameters of …
1995
The complete characterization of microwave transistors in terms of (four) noise, (four) gain and scattering parameters sets ({N), {G) and [SI, respectively) vs. frequency and bias conditions (and also vs. decreasing temperature, if required) is the first and most important step to design low noise amplifiers (LNAs). The characterization of the device under test (DUT) in terms of [SI is friendly by means of commercial Automatic Network Analyzer; then the { G) set may be determined by computation.
On the noise resistance of field-effect transistors at microwave frequencies
2001
This paper presents a survey on the topical aspects of the noise resistance in field-effect transistors (FET) at microwave frequencies. Such noise parameter represents the sensitivity of the device noise figure to the departure from the minimum noise condition and is therefore important in all low-noise applications. The performance of the noise resistance in FETs has been reviewed since the first noise modeling analysis of short-gate devices were presented in the early '70s. The authors also comment and compare their own results on this subject as obtained by extensive experimental activity in the field of noisy device characterization vs. frequency, bias and temperature conditions.
Cross-Spectrum PM Noise Measurement, Thermal Energy, and Metamaterial Filters.
2017
International audience; Virtually all commercial instruments for the measurement of the oscillator PM noise make use of the crossspectrum method (arXiv:1004.5539 [physics.ins-det], 2010). High sensitivity is achieved by correlation and averaging on two equal channels, which measure the same input, and reject the background of the instrument.We show that a systematic error is always present if the thermal energy of the input power splitter is not accounted for. Such error can result in noise underestimation up to a few decibels in the lowest-noise quartz oscillators, and in an invalid measurement in the case of cryogenic oscillators. As another alarming fact, the presence of metamaterial com…
Bimodal Approach for Noise Figures of Merit Evaluation in Quantum-Limited Josephson Traveling Wave Parametric Amplifiers
2022
The advent of ultra-low noise microwave amplifiers revolutionized several research fields demanding quantum-limited technologies. Exploiting a theoretical bimodal description of a linear phase-preserving amplifier, in this contribution we analyze some of the intrinsic properties of a model architecture (i.e., an rf-SQUID based Josephson Traveling Wave Parametric Amplifier) in terms of amplification and noise generation for key case study input states (Fock and coherents). Furthermore, we present an analysis of the output signals generated by the parametric amplification mechanism when thermal noise fluctuations feed the device.
Noise characterization of analog to digital converters for amplitude and phase noise measurements
2017
International audience; Improvements on electronic technology in recent years have allowed the application of digital techniques in phase noise metrology where low noise and high accuracy are required, yielding flexibility in systems implementation and setup. This results in measurement systems with extended capabilities, additional functionalities and ease of use. In most digital schemes the Analog to Digital Converters (ADCs) set the ultimate performance of the system, therefore the proper selection of this component is a critical issue. Currently, the information available in literature describes in depth the ADC features only at frequency offsets far from the carrier. However, the perfo…