Search results for "PHOTOEMISSION"
showing 10 items of 174 documents
Surface magnetism studied by photoelectron spectromicroscopy with high spatial and time resolution
2004
Abstract Photoemission electron microscopy (PEEM) is widely used for the study of magnetic surfaces and thin films. Ferromagnetic and antiferromagnetic microstructures are investigated exploiting magnetic circular and linear dichroism in the soft X-ray range using tuneable synchrotron radiation. Local dichroism spectroscopy gives access to magnetic moments of the elements in compounds or multilayer materials. Beyond these achievements, the method bears a high future potential with respect to an increased lateral resolution via aberration correction of the electron optics and a high time resolution in the 100 ps range for the study of dynamic processes. In addition, photoelectron spin polari…
Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY
1999
We present a new experiment for photoelectron microspectroscopy by use of undulator radiation, which has been set up at the beamline U2 at the Berlin electron storage ring BESSY 1. This approach employs a non-imaging simulated hemispherical electron energy analyser attached to an imaging photoemission electron microscope (FOCUS IS-PEEM) with integrated microarea selector. The photoemission microscope exhibits a lateral resolution of 25 nm (with 4.9 eV UV-excitation), while the resolution with incident synchrotron radiation in the soft X-ray range is about 100-120 nm (mainly due to chromatic aberrations). Photoemission microscopy as well as photoelectron microspectroscopy of selected areas o…
Recent progress in photoemission microscopy with emphasis on chemical and magnetic sensitivity
1997
Abstract With the improved access to synchrotron radiation sources photoemission electron microscopy is developing into a versatile analytical tool in surface and materials science. The broad spectral range and the well-defined polarization characteristics of synchrotron light permit a unique combination of topographic, chemical, and even magnetic investigations down to a mesoscopic scale. The potentiality of photoemission electron microscopy is demonstrated by several experiments on surfaces and microstructured thin film systems, which have been carried out with a newly designed instrument. We discuss its different modes of operation with respect to both microscopy and spectroscopy. A comb…
NanoESCA: imaging UPS and XPS with high energy resolution
2005
Abstract A novel imaging electron spectrometer has been used for laterally resolved ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS) in the soft X-ray range. The instrument is based on a high-resolution emission microscope optics using a cathode lens and an imaging dispersive analyser. The analyser is corrected for the leading aberration term ( α 2 -term) by means of two hemispherical analysers in antisymmetric configuration with an appropriate transfer lens. Small-area spectra as well as energy-filtered images have been taken in the soft X-ray range for a meteorite sample and in the range of the d-band of a Cu polycrystal. An energy resolution of 106 …
Fast elemental mapping and magnetic imaging with high lateral resolution using a novel photoemission microscope
1998
Abstract Using tunable soft X-ray synchrotron radiation and a new-generation photoemission electron microscope with integral sample stage and microarea selector, elemental images and local XANES spectra have been measured. Given the present conditions (PM3 at BESSY), the lateral resolution was in the range of 130 nm with the potential of considerable improvement with high-brilliance sources (a base resolution of 25 nm was obtained in threshold photoemission). Measurements at the oxygen K-edge demonstrate that differences in the local chemical environment of the emitter atom are clearly revealed and can thus be used as a fingerprint technique for its chemical state and geometrical surroundin…
Temperature-dependent angular resolved UV-photoemission spectroscopy from CeNi2Ge2
2001
Abstract Pronounced temperature effects in angular resolved ultraviolet photoelectron spectroscopy from the (001) surface of the ternary heavy fermion compound CeNi 2 Ge 2 are presented. The measurements were performed on atomically clean and well-ordered thin films grown on a W(110) substrate. A strongly enhanced intensity at the Fermi edge ( ϵ F ) is observed at low-temperatures if the spectra are excited by means of HeI light ( hν =21.2 eV). In addition, the work function is dramatically increased with temperature, exhibiting an unusually high positive temperature coefficient of about 0.65 meV/K. The observed temperature dependency suggests a strong redistribution of the states near the …
Photoabsorption and MXCD in photoemission microscopy for characterisation of advanced materials
1999
Abstract We applied chemical and magnetic sensitive photoemission electron microscopy (PEEM) to investigate surfaces of advanced materials. PEEM at low photon energies provides a high spatial resolution, but suffers from the lack of information about the chemical composition of the imaged surface. Such information can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired and subtracted microscopic images using photon energies just below and at the edges. The resulting difference gives a micro-image of the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of secondary electrons in…
UV LED Photo Electron Ionisation for MS and IMS
2009
AbstractA new MEMS ionisation source for spectrometry is presented on the basis of photo electron emission in silicon MEMS. Lanthanum hexaboride ceramic sample and thin nanolayer proved their suitability for photo electron emission in the desired photon energy range of 3.1eV to 3.9eV which correspond to industrially available UV LED. This ionisation source alternative to a Photoionisationdetector (PID) is inspected of its gas ionisation behaviour using gases with an ionisation potential over and under an energy of 10,6eV. To enable the ionisation of the gases the emitted electrons were accelerated to a well-defined energy. The results of these investigations are comparable to the UV dischar…
The spatial distribution of non-linear effects in multi-photon photoemission from metallic adsorbates on Si(1 1 1)
2001
Multi-photon excitations from thin metallic films on silicon substrates have been observed utilising photoemission electron microscopy. The photoelectrons have been excited by means of high power femtosecond laser pulses with a photon energy below the work function threshold. The strong spatial variations of the non-linear effects became directly visible in electron emission from the adsorbed thin films. Centres of enhanced photoelectron yield, so-called hot spots, were observed on the surfaces of various samples. The multi-photon electron yield of the metallic films (permalloy and lead) depends strongly on the sample topography and the photon polarisation.
Single-Hemisphere Photoelectron Momentum Microscope With Time-of-Flight Recording
2020
Photoelectron momentum microscopy is an emerging powerful method for angle-resolved photoelectron spectroscopy (ARPES), especially in combination with imaging spin filters. These instruments record kx-ky images, typically exceeding a full Brillouin zone. As energy filters double-hemispherical or time-of-flight (ToF) devices are in use. Here we present a new approach for momentum mapping of the full half-space, based on a single hemispherical analyzer (path radius 225 mm). Excitation by an unfocused He lamp yielded an energy resolution of 7.7 meV. The performance is demonstrated by k-imaging of quantum-well states in Au and Xe multilayers. The alpha-square-aberration term (alpha: entrance an…