Search results for "Spectral density"

Experimental determination of the kurtosis of RF noise in microwave low-noise devices

2000

Abstract The degree of the Gaussian nature of the white noise present in microwave low-noise devices is experimentally investigated. The chosen experimental technique consists of simultaneously digitizing four versions of the noise which are amplified by four parallel independent amplifiers. The four independent signals are then used to compute the second, and, to a good approximation, the fourth moment of the noise. The ratio of the fourth moment to the square of the second moment is the kurtosis of the noise. Gaussian processes are characterized by a kurtosis equal to 3. A deviation from this value gives an indication about the degree of non-Gaussian nature of the noise. By using this tec…

Implicit Wiener Filtering for Speech Enhancement In Non-Stationary Noise

2021

Speech quality is degraded in the presence of background noise, which reduces the quality of experience (QoE) of the end-user and therefore motivates the usage of speech enhancement algorithms. A large number of approaches have been proposed in this context. However most of them have focused on the case where the noise is stationary, an assumption that seldom holds in practice. For instance, in mobile telephony, noise sources with a marked non-stationary spectral signature include vehicles, machines, and other speakers to name a few. On the other hand, the usage of frequency-domain information in existing algorithms for speech enhancement in non-stationary noise environments can be made mor…

Skewness and kurtosis of 1/f noise in semiconductor devices

2000

An experimental investigation of the third and fourth moments of the 1/f noise of two different electronic devices is reported. The skewness and the kurtosis of the noise voltage data are estimated. Although the devices under investigation have similar noise power spectral density, the time waveforms are shown to have slightly different statistical properties. In both cases, a small deviation from Gaussian distribution is observed.

Three Different Methods for Determining the Microwave Noise Parameters of HEMT's at Decreasing Temperatures

1998

The noise characteristics of any transistor are usually represented by means of four parameters which are frequency-, bias- and temperature-dependent, similarly to the scattering parameters. The noise parameters are determined by a standard indirect procedure based on multiple noise figure measurements and appropriate data processing techniques requiring a complex instrumentation set-up and skilled operators. As an alterative way, we have shown that the noise parameters of packaged HEAMT's can be computed with very good accuracy from the analysis of a noisy circuit model derived from the scattering parameters plus a single noise figure measurement. A third way exists for the determination o…

On the determination of device noise and gain parameters

1979

The least-squares fitting of measured noise figures and gains versus input termination admittance is an established procedure to determine linear two-port noise and gain parameters. Unfortunately, the method is liable to the serious inconvenience of yielding often erroneous results or even results without physical meaning. Some criteria are suggested which allow the carrying out of measurements in such a manner as to safely avoid the above drawbacks.

Complete characterization of low-noise devices at microwave frequencies: two alternative procedures for HEMTs

1995

Signal to Noise Ratio of Silicon Photomultipliers measured in the Continuous Wave Regime

2014

We performed a Signal to Noise Ratio characterization, in the continuous wave regime, at different bias voltages, frequencies and temperatures, on a novel class of silicon photomultipliers fabricated in planar technology on silicon p-type substrate. Signal to Noise Ratio has been measured as the ratio of the photogenerated current, filtered and averaged by a lock-in amplifier, and the Root Mean Square deviation of the overall current flowing to the device. The measured noise takes into account the shot noise, resulting from the photocurrent and the dark current. We have also performed a comparison between our SiPMs and a photomultiplier tube in terms of Signal to Noise Ratio, as a function …

Typical Aspects of the Microwave Noise Performance of HEMTs at Decreasing Temperatures

1996

In analog signal processing at microwave frequencies the noise performance of active devices is of fundamental importance for the accurate design of low-noise amplifiers. To this aim, the determination of the four noise parameters F O , Γ O (complex variable) and Rn has to be accomplished together with the usual scattering parameter measurements vs. frequency. In addition, the dependence of the device performance vs. temperature is of interest for circuit applications characterized by harsh environmental conditions. In this work the noise behavior of high electron mobility transistors has been investigated by means of measurements and modeling in the 2-18 GHz frequency range and as a functi…

A Robust Wrap Reduction Algorithm for Fringe Projection Profilometry and Applications in Magnetic Resonance Imaging.

2017

In this paper, we present an effective algorithm to reduce the number of wraps in a 2D phase signal provided as input. The technique is based on an accurate estimate of the fundamental frequency of a 2D complex signal with the phase given by the input, and the removal of a dependent additive term from the phase map. Unlike existing methods based on the discrete Fourier transform (DFT), the frequency is computed by using noise-robust estimates that are not restricted to integer values. Then, to deal with the problem of a non-integer shift in the frequency domain, an equivalent operation is carried out on the original phase signal. This consists of the subtraction of a tilted plane whose slop…

Response Power Spectrum of Multi-Degree-of-Freedom Nonlinear Systems by a Galerkin Technique

2003

This paper deals with the estimation of spectral properties of randomly excited multi-degree-of-freedom (MDOF) nonlinear vibrating systems. Each component of the vector of the stationary system response is expanded into a trigonometric Fourier series over an adequately long interval T. The unknown Fourier coefficients of individual samples of the response process are treated by harmonic balance, which leads to a set of nonlinear equations that are solved by Newton’s method. For polynomial nonlinearities of cubic order, exact solutions are developed to compute the Fourier coefficients of the nonlinear terms, including those involved in the Jacobian matrix associated with the implementation o…