Search results for "Transistors"

showing 10 items of 68 documents

High-Yield of Memory Elements from Carbon Nanotube Field-Effect Transistors with Atomic Layer Deposited Gate Dielectric

2008

Carbon nanotube field-effect transistors (CNT FETs) have been proposed as possible building blocks for future nano-electronics. But a challenge with CNT FETs is that they appear to randomly display varying amounts of hysteresis in their transfer characteristics. The hysteresis is often attributed to charge trapping in the dielectric layer between the nanotube and the gate. This study includes 94 CNT FET samples, providing an unprecedented basis for statistics on the hysteresis seen in five different CNT-gate configurations. We find that the memory effect can be controlled by carefully designing the gate dielectric in nm-thin layers. By using atomic layer depositions (ALD) of HfO$_{2}$ and T…

NanotubeGate dielectricGeneral Physics and AstronomyFOS: Physical sciencesCarbon nanotubeDielectriclaw.inventionCondensed Matter::Materials ScienceComputer Science::Emerging TechnologieslawMesoscale and Nanoscale Physics (cond-mat.mes-hall)Physics::Atomic and Molecular ClustersThin filmCNT FETsPhysicsCondensed Matter - Materials Sciencecarbon nanotubesCondensed Matter - Mesoscale and Nanoscale Physicsbusiness.industryPhysicsTransistorfield-effect transistorsMaterials Science (cond-mat.mtrl-sci)HysteresishysteresisOptoelectronicsField-effect transistorbusiness
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Influence Of The Model Parameters On The Noise Performance Of Double-polysilicon BJTs For Microwave LNA's

1997

In the recent post we have measured the noise and the scattering parameters of several series of double polysilicon BJT's over the 2-6 GHz frequency range at different collector current values, according to their emitter finger number. From the experimental data, a noisy circuit model has been extracted based on a T-equivalent network. By means of the correlation matrix techniques, novel analytical expressions of the noise parameters have been derived. As a second step, a sensitivity analysis has been performed for evaluating the influence of each model element on the noise performance. The results show how to improve the characteristics of such devices for a better performance when employe…

Noise temperatureEngineeringNoise measurementbusiness.industryDouble polysilicon bipolar junction transistors Low noise amplifiers (LNA) noise modelsY-factorLow noise amplifiers (LNA)Noise figureNoise (electronics)noise modelsDouble polysilicon bipolar junction transistorsNoise generatorPhase noiseElectronic engineeringFlicker noisebusiness27th European Microwave Conference and Exhibition
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Organic Thin-Film Transistors with Enhanced Sensing Capabilities

2009

Organic thin-film transistors, used as sensing devices, have been attracting quite a considerable interest lately as they offer advantages such as multi parameter behaviour and possibility to be quite easily molecularly tuned for the detection of specific analytes. Here, a study on the dependences of the devices responses on important parameters such as the active layer thickness and its morphology as well as on the transistor channel length is presented. To introduce the least number of variables the system chosen for this study is quite a simple and well assessed one being based on a thiophene oligomer active layer exposed to 1-butanol vapours.

Organic electronicsMaterials scienceOrganic field-effect transistorbusiness.industryTransistorGate dielectricContact resistancemedicine.diseaselaw.inventionActive layerlawThin-film transistormedicineOptoelectronicsnanotechnology organic materials thin films transistorsbusinessVapours
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Current status of AlInN layers lattice-matched to GaN for photonics and electronics

2007

We report on the current properties of Al1-x InxN (x approximate to 0.18) layers lattice- matched ( LM) to GaN and their specific use to realize nearly strain- free structures for photonic and electronic applications. Following a literature survey of the general properties of AlInN layers, structural and optical properties of thin state- of- the- art AlInN layers LM to GaN are described showing that despite improved structural properties these layers are still characterized by a typical background donor concentration of ( 1 - 5) x 10(18) cm(-3) and a large Stokes shift (similar to 800 meV) between luminescence and absorption edge. The use of these AlInN layers LM to GaN is then exemplified …

PhotoluminescenceMaterials scienceAcoustics and UltrasonicsGallium nitrideSettore ING-INF/01 - ElettronicaVertical-cavity surface-emitting laserchemistry.chemical_compoundMOLECULAR-BEAM EPITAXYALGAN/GAN QUANTUM-WELLSIII-VDISTRIBUTED BRAGG REFLECTORSCRYSTALSURFACE-EMITTING LASERSbusiness.industryREFLECTORSHeterojunctionOPTICAL-PROPERTIESCondensed Matter PhysicsAL1-XINXN THIN-FILMSSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsDISTRIBUTED BRAGGAbsorption edgechemistryOptoelectronicsVAPOR-PHASE EPITAXYIII-V NITRIDESFIELD-EFFECT TRANSISTORSNITRIDESbusinessLiterature surveyCRYSTAL GALLIUM NITRIDELasing thresholdGALLIUM NITRIDEMolecular beam epitaxyJournal of Physics D: Applied Physics
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Measuring charge based quantum bits by a superconducting single-electron transistor

2002

Single-electron transistors have been proposed to be used as a read-out device for Cooper pair charge qubits. Here we show that a coupled superconducting transistor at a threshold voltage is much more effective in measuring the state of a qubit than a normal-metal transistor at the same voltage range. The effect of the superconducting gap is to completely block the current through the transistor when the qubit is in the logical state 1, compared to the mere diminishment of the current in the normal-metal case. The time evolution of the system is solved when the measuring device is driven out of equilibrium and the setting is analysed numerically for parameters accessible by lithographic alu…

PhysicsCharge qubitCondensed matter physicsPhysicsCondensed Matter - Superconductivitysingle-electron transistorMultiple-emitter transistorFOS: Physical sciencesHardware_PERFORMANCEANDRELIABILITYsuperconductorsCondensed Matter::Mesoscopic Systems and Quantum Hall EffectThreshold voltagePhase qubitSuperconductivity (cond-mat.supr-con)superconductorsingle-electron transistorsComputer Science::Emerging TechnologiesHardware_GENERALOptical transistorHardware_INTEGRATEDCIRCUITScharge-based quantum bitsField-effect transistorSuperconducting quantum computingStatic induction transistorHardware_LOGICDESIGN
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Operation of transition-edge sensors with excess thermal noise

2006

The superconducting transition-edge sensor (TES) is currently one of the most attractive choices for ultra-high resolution calorimetry in the keV x-ray band, and is being considered for future ESA and NASA missions. We have performed a study on the noise characteristics of Au/Ti bilayer TESs, at operating temperatures around ~100 mK, with the SQUID readout at 1.5 K. Experimental results indicate that without modifications the back-action noise from the SQUID chip degrades the noise characteristics significantly. We present a simple and effective solution to the problem: by installing an extra shunt resistor which absorbs the excess radiation from the SQUID input, we have reduced the excess …

PhysicsNoise powerSquidPhotonbiologybusiness.industryPhysics::Instrumentation and DetectorscalorimetersMetals and AlloysY-factorsuperconducting microwave devicesRadiationCondensed Matter PhysicsChipSQUIDNoise (electronics)biology.animalsuperconducting transistorsThermalMaterials ChemistryCeramics and Compositestransition edge sensorsOptoelectronicsElectrical and Electronic EngineeringbusinessSuperconductor Science and Technology
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Failure analysis of normally-off GaN HEMTs under avalanche conditions

2020

Gallium nitride (GaN) high electron-mobility transistors (HEMTs) are promising devices in the power electronics field owing to their wide bandgap (WBG). However, all the potential advantages provided by their WBG require reliability improvement. In industrial applications, robustness is one of the main factors considered by circuit designers. This study focuses on the observation of the degradation behavior of the main waveforms of unclamped inductive-switching (UIS) test circuits of two different commercial GaN HEMT structures. The relevance of this study lies in the potential applications of these devices to high-voltage applications and automotive systems where they are subjected to many…

Power HEMTMaterials scienceIII-V semiconductorswide band gap semiconductorsbusiness.industryoutagesion beamsNormally offCondensed Matter Physicshigh electron mobility transistorsAvalanche breakdownElectronic Optical and Magnetic MaterialsMaterials ChemistryOptoelectronicsimpact ionizationElectrical and Electronic Engineeringbusinessgallium nitride
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Photoelectrochemical Synthesis of Polypyrrole on Anodic Ta2O5 Films

2007

Polypyrrole film was photoelectrochemically grown on insulating Ta2O5 anodic film in acetonitrile solution. A characterization by photocurrent spectroscopy PCS of metal/oxide/polypyrrole interface was carried out. The PCS results suggest that a metallic-like PPy is formed under illumination at constant anodic potential. By polarizing the polypyrrole at cathodic potentials a photocurrent spectrum typical of p-type semiconducting film was recorded. A scanning electron microscopy study of PPy surfaces solution side and oxide side allowed us to obtain information on the morphology of the polymer as well as a rough estimate of the film thickness and of the diameter of PPy globules at the two int…

Settore ING-IND/23 - Chimica Fisica ApplicataCONDUCTING POLYMERSTHICKNESSMETALSFIELD-EFFECT TRANSISTORSFIELD-EFFECT TRANSISTORS; CONDUCTING POLYMERS; GENERATION; TANTALUM; METALS; THICKNESS; OXIDATIONOXIDATIONTANTALUMGENERATION
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Investigation on Cascode Devices for High Frequency Electrical Drives Applications

2019

In the last years a widespread development in the market of electrical drives employing high-speed electrical machines has occurred in various industrial fields, due to the extremely high power density that can be reached. Nevertheless, to maintain output power quality without using bulky filtering networks, DC-AC converters should be controlled by means of higher PWM switching frequencies. New switching device technologies, such as Field Effect Transistors based on SiC and GaN, are therefore gathering momentum in order to comply with the higher working frequencies. To operate under high frequencies and at the same time at high voltage levels, alternative circuital configurations for switch…

Settore ING-INF/05 - Sistemi Di Elaborazione Delle InformazioniMomentum (technical analysis)High voltage deviceComputer sciencebusiness.industry020209 energyCascode020208 electrical & electronic engineeringElectrical engineeringHigh voltage02 engineering and technologyConvertersSettore ING-IND/32 - Convertitori Macchine E Azionamenti ElettriciHigh frequencyPower transistors0202 electrical engineering electronic engineering information engineeringField-effect transistorPower semiconductor deviceCascodebusinessFrequency modulationPulse-width modulation
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Layout influence on microwave performance of graphene field effect transistors

2018

The authors report on an in-depth statistical and parametrical investigation on the microwave performance of graphene FETs on sapphire substrate. The devices differ for the gate-drain/source distance and for the gate length, having kept instead the gate width constant. Microwave S -parameters have been measured for the different devices. Their results demonstrate that the cut-off frequency does not monotonically increase with the scaling of the device geometry and that it exists an optimal region in the gate-drain/source and gate-length space which maximises the microwave performance.

TechnologyMaterials science02 engineering and technologyHardware_PERFORMANCEANDRELIABILITYSettore ING-INF/01 - Elettronica01 natural scienceslaw.inventionComputer Science::Hardware ArchitectureComputer Science::Emerging Technologieslaw0103 physical sciencesHardware_INTEGRATEDCIRCUITSElectrical and Electronic EngineeringScaling010302 applied physicsbusiness.industryGrapheneComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKSWide-bandgap semiconductorSettore ING-INF/02 - Campi Elettromagnetici021001 nanoscience & nanotechnologyGraphene field effect transistorsSapphire substrateOptoelectronicsField-effect transistorGraphene0210 nano-technologyConstant (mathematics)businessMicrowaveddc:600MicrowaveHardware_LOGICDESIGN
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