Search results for "Upset"
showing 10 items of 30 documents
Proton Direct Ionization in Sub-Micron Technologies: Numerical Method for RPP Parameter Extraction
2022
This work introduces a numerical method to iteratively extract parameters of a rectangular parallelepiped (RPP) sensitive volume (SV) from experimental proton direct ionization SEU data. The method combines two separate numerical models. The first model estimates the average LET values for energetic ions, including protons and also heavy ions, in elemental solid targets. The second model describes the statistical variance in the energy deposition events of projectile-induced primary ionization within a RPP shaped target volume. To benchmark the method, simulated cross-section values based on RPP parameters derived with this method are compared with literature data from four SRAM devices. Th…
The Pion Single-Event Effect Resonance and its Impact in an Accelerator Environment
2020
International audience; The pion resonance in the nuclear reaction cross section is seen to have a direct impact on the single-event effect (SEE) cross section of modern electronic devices. This was experimentally observed for single-event upsets and single-event latchup. Rectangular parallelepiped (RPP) models built to fit proton data confirm the existence of the pion SEE cross-section resonance. The impact on current radiation hardness assurance (RHA) soft error rate (SER) predictions is, however, minimal for the accelerator environment since this is dominated by high neutron fluxes. The resonance is not seen to have a major impact on the high-energy hadron equivalence approximation estab…
Mono-energetic electron induced single-event effects at the VESPER facility
2016
We present experimental evidence of electron induced upsets in a reference ESA SEU monitor, the SEU based particle detector, induced by 200 MeV electron beam at the VESPER facility at CERN. Comparison of experimental cross sections and simulated cross sections are shown and the differences are analyzed. Possible secondary contributions to the upset rate by neutrons and cumulative dose effects are discussed, showing that electronuclear reactions are the expected SEU mechanism. Insight is given as to possible overall electron contribution to the upset rates in the Jovian radiation environment inside a typical spacecraft shielding are evaluated.
Effect of Ion Energy on Charge Loss From Floating Gate Memories
2008
Heavy ions typical of the space environment have energies which exceed by orders of magnitude those available at particle accelerators. In this paper we are irradiating state of the art floating gate memories by using both a medium energy (SIRAD) and a high energy (RADEF) facilities. The corruption of stored information decreases when increasing ion energy. The proposed model deals with the broader track found for higher energy ions. Implications for testing procedures and for reliability considerations are discussed.
Effects of Scaling in SEE and TID Response of High Density NAND Flash Memories
2010
Heavy ion single-event effect (SEE) measurements and total ionizing dose (TID) response for Micron Technology single-level cell 1, 2, 4, 8 Gb commercial NAND flash memory and multi-level cell 8, 16, 32 Gb are reported. The heavy ion measurements were extended down to LET 0.1 MeV-cm2/mg. Scaling effects in SEE and TID response are discussed. Floating gate bit error upset cross section does not scale with feature size at high LETs, except for single-level cell 8 Gb device which is built with 51 nm processes. The threshold LET does not change with scaling. Charge pump TID degradation and standby current improves with scaling. In general, the effect of radiation is either unchanged or is less s…
Low Energy Protons at RADEF - Application to Advanced eSRAMs
2014
A low energy proton facility has been developed at RADEF, Jyvskyl, Finland. The proton energy selection, calibration and dosimetry are described. The first experiment with external users was performed using two memory test vehicles fabricated with 28 nm technology. Examples of single event upset measurements in the test vehicles embedded SRAMs (eSRAMs) as a function of proton energy are provided.
Dynamic Test Methods for COTS SRAMs
2014
International audience; In previous works, we have demonstrated the importance of dynamic mode testing of SRAM components under ionizing radiation. Several types of failures are difficult to expose when the device is tested under static (retention) mode. With the purpose of exploring and defining the most complete testing procedures and reveal the potential hazardous behaviors of SRAM devices, we present novel methods for the dynamic mode radiation testing of SRAMs. The proposed methods are based on different word address accessing schemes and data background: Fast Row, Fast Column, Pseudorandom, Adjacent (Gray) and Inverse Adjacent (Gray). These methods are evaluated by heavy ion and atmos…
TileCal optical multiplexer board 9U prototype
2007
This paper presents the architecture and the status of the optical multiplexer board (OMB) for the ATLAS/LHC Tile hadronic calorimeter (TileCal). This board will analyze the front-end data CRC to prevent bit and burst errors produced by radiation. Besides, due to its position within the data acquisition chain it will be used to emulate front-end data for tests. The first two prototypes of the final OMB 9U version have been produced at CERN. Detailed design issues and manufacture features of these prototypes are described. These prototypes are being validated whereas some firmware developments are being implemented in the programmable devices of the board. Functional descriptions of the boar…
Introduction : spaces of upset in the Nordic region
2022
Abstract This introductory article opens the thematic issue Spaces of Upset in the Nordic Region. It introduces the contributions of the issue, outlines the concepts that unite them, and discusses the sociolinguistic area in which they are set: the Nordic region. Centering on Denmark, Finland and Sweden, the article offers an overview of some of the sociolinguistic, ideological and political characteristics of the region and the countries it comprises. The Nordic region is widely seen as a paradigm case of social stability, consensus and cohesion. This vision is, however, a mirage. To be sure, upset often lingers below the discursive veneer of Nordic harmony, concord and agreement. Breaking…
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory
2018
This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate characteristic error patterns, affecting isolated bits, words, groups of pages, and sometimes entire regions of the memory array. The underlying mechanisms are discussed. peerReviewed