Search results for "Wafer"

showing 10 items of 73 documents

Results of proton irradiations of large area strip detectors made on high-resistivity Czochralski silicon

2004

Abstract We have processed full-size strip detectors on Czochralski grown silicon wafers with resistivity of about 1.2 kΩ cm. Wafers grown with Czochralski method intrinsically contain high concentrations of oxygen, and thus have potential for high radiation tolerance. Detectors and test diodes were irradiated with 10 MeV protons. The 1-MeV neutron equivalent irradiation doses were 1.6×1014 and 8.5×1013 cm−2 for detectors, and up to 5.0×1014 cm−3 for test diodes. After irradiations, depletion voltages and leakage currents were measured. Czochralski silicon devices proved to be significantly more radiation hard than the reference devices made on traditional detector materials.

PhysicsNuclear and High Energy PhysicsSiliconbusiness.industryDetectorchemistry.chemical_elementRadiationchemistryElectrical resistivity and conductivityOptoelectronicsWaferIrradiationbusinessInstrumentationDiodeLeakage (electronics)Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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Particle detectors made of high-resistivity Czochralski silicon

2005

We have processed pin-diodes and strip detectors on n- and p-type high-resistivity silicon wafers grown by magnetic Czochralski method. The Czochralski silicon (Cz-Si) wafers manufactured by Okmetic Oyj have nominal resistivity of 900 O cm and 1.9 kO cm for n- and p-type, respectively. The oxygen concentration in these substrates is slightly less than typically in wafers used for integrated circuit fabrication. This is optimal for semiconductor fabrication as well as for radiation hardness. The radiation hardness of devices has been investigated with several irradiation campaigns including low- and high-energy protons, neutrons, g-rays, lithium ions and electrons. Cz-Si was found to be more…

PhysicsNuclear and High Energy PhysicsSiliconbusiness.industrychemistry.chemical_elementFloat-zone siliconRadiationFluencechemistryElectrical resistivity and conductivityOptoelectronicsWaferIrradiationbusinessInstrumentationRadiation hardeningNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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A prototype of very high resolution small animal PET scanner using silicon pad detectors

2007

Abstract A very high-resolution small animal positron emission tomograph (PET), which can achieve sub-millimeter spatial resolution, is being developed using silicon pad detectors. The prototype PET for a single slice instrument consists of two 1 mm thick silicon pad detectors, each containing a 32×16 array of 1.4×1.4 mm pads readout with four VATAGP3 chips which have 128 channels low-noise self-triggering ASIC in each chip, coincidence units, a source turntable and tungsten slice collimator. The silicon detectors were located edgewise on opposite sides of a 4 cm field-of-view to maximize efficiency. Energy resolution is dominated by electronic noise, which is 0.98% (1.38 keV) FWHM at 140.5…

PhysicsNuclear and High Energy Physicsmedicine.medical_specialtySiliconbusiness.industryDetectorResolution (electron density)chemistry.chemical_elementCollimatorChipLine sourceArticlelaw.inventionOpticschemistrylawmedicineWaferMedical physicsbusinessInstrumentationImage resolution
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Fast determination of impurities in metallurgical grade silicon for photovoltaics by instrumental neutron activation analysis

2010

Standard wafer solar cells are made of near-semiconductor quality silicon. This high quality material makes up a significant part of the total costs of a solar module. Therefore, new concepts with less expensive so called solar grade silicon directly based on physiochemically upgraded metallurgical grade silicon are investigated. Metallurgical grade silicon contains large amounts of impurities, mainly transition metals like Fe, Cr, Mn, and Co, which degrade the minority carrier lifetime and thus the solar cell efficiency. A major reduction of the transition metal content occurs during the unidirectional crystallization due to the low segregation coefficient between the solid and liquid phas…

RadiationMaterials scienceSiliconbusiness.industryMetallurgychemistry.chemical_elementCarrier lifetimeSolar cell efficiencychemistryImpurityPhotovoltaicsWaferIngotNeutron activation analysisbusinessApplied Radiation and Isotopes
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Finely tunable laser based on a bulk silicon wafer for gas sensing applications

2016

In this work a very simple continuously tunable laser based on an erbium ring cavity and a silicon wafer is presented. This laser can be tuned with very fine steps, which is a compulsory characteristic for gas sensing applications. Moreover the laser is free of mode hopping within a spectral range sufficiently wide to match one of the ro-vibrational lines of a target molecule. Here the proposed laser reached, at ∼1530 nm, a continuous tuning range of around 950 pm (>100 GHz) before mode hopping occurred, when a silicon wafer of 355 μm thickness was used. Additionally, the laser can be finely tuned with small tuning steps of <12 pm, achieving a resolution of 84.6 pm °C-1 and by using a therm…

Range (particle radiation)Materials sciencePhysics and Astronomy (miscellaneous)Hybrid silicon laserbusiness.industrychemistry.chemical_element02 engineering and technologyLaser01 natural scienceslaw.invention010309 opticsErbiumWavelength020210 optoelectronics & photonicsOpticschemistrylaw0103 physical sciences0202 electrical engineering electronic engineering information engineeringWaferbusinessInstrumentationFabry–Pérot interferometerTunable laserLaser Physics Letters
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Real-time manipulation of ZnO nanowires on a flat surface employed for tribological measurements: Experimental methods and modeling

2012

Elastic and tribological properties of zinc oxide nanowires (NWs) on Si wafer and highly oriented pyrolytic graphite (HOPG) are experimentally investigated and theoretically interpreted. Measurements are performed inside a scanning electron microscope (SEM) using real-time manipulation technique that enables two possible ways of data registration: “external” force registration with quartz tuning fork (QTF) based sensor and “internal” force registration utilizing in situ observed elastic deformation of NWs. Young modulus is determined by loading half-suspended NW at its free end and then employed for the following tribological experiments. Maximal static friction force is estimated when NW i…

Range (particle radiation)Materials scienceScanning electron microscopeRelaxation (NMR)NanowireYoung's modulusNanotechnologyTribologyCondensed Matter PhysicsElectronic Optical and Magnetic Materialssymbols.namesakeHighly oriented pyrolytic graphitesymbolsWaferComposite materialphysica status solidi (b)
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Comparing different processing methods in apple slice drying. Part 2 solid-state Fast Field Cycling 1H-NMR relaxation properties, shrinkage and chang…

2019

The objective of this paper was to study the effects of different drying methods that are: microwave (MW), hot air (HA) and a combination of both (HY), on the 1H-NMR relaxation properties, shrinkage and volatile compounds of Golden Delicious apple slices. Fast field cycling NMR relaxometry reveals that the HA samples dried at different temperatures (65 and 75 °C) appear to contain less restrained water as compared to the sample obtained by MW heating at the same temperatures. In fact, the longitudinal relaxation rates (T1) of the water molecules in the HA dried slices resulted shorter than those measured for the MW dried samples, thereby revealing that in the MW slices, water molecules beha…

RelaxometryMaterials scienceField cyclingSettore AGR/13 - Chimica AgrariaRelaxation (NMR)AppleAnalytical chemistrySolid-stateSoil Science1H-NMR relaxation propertieSettore AGR/15 - Scienze E Tecnologie Alimentarirelaxation propertiesControl and Systems EngineeringAppleDrying relaxation propertiesShrinkageVolatile compoundsMicrowaveVolatile compoundsProton NMRWaferShrinkageMicrowaveAgronomy and Crop ScienceAppleDryingMicrowaveDryingFood ScienceShrinkageBiosystems Engineering
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Diffusion of oxygen in cork.

2012

International audience; This work reports measurements of effective oxygen diffusion coefficient in raw cork. Kinetics of oxygen transfer through cork is studied at 298 K thanks to a homemade manometric device composed of two gas compartments separated by a cork wafer sample. The first compartment contains oxygen, whereas the second one is kept under dynamic vacuum. The pressure decrease in the first compartment is recorded as a function of time. The effective diffusion coefficient D-eff is obtained by applying Fick's law to transient state using a numerical method based on finite differences. An analytical model derived from Fick's law applied to steady state is also proposed. Results give…

Transient stateWork (thermodynamics)DiffusionAnalytical chemistryWineCorkengineering.material01 natural sciencesINGRESSPermeabilityDiffusion0404 agricultural biotechnologyMass transferEffective diffusion coefficientWaferNONDESTRUCTIVE COLORIMETRIC METHODDIFFERENT CLOSURESSteady stateChemistry010401 analytical chemistryBOTTLESFood Packaging04 agricultural and veterinary sciencesGeneral ChemistryODORANTSModels Theoretical040401 food science0104 chemical sciencesOxygenKineticsengineeringWHITE WINESGeneral Agricultural and Biological SciencesJournal of agricultural and food chemistry
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Modeling of kinetic and static friction between an elastically bent nanowire and a flat surface

2011

Friction forces for a nanowire (NW) elastically bent on flat substrate were investigated both theoretically and experimentally. Models based on elastic beam theory were proposed considering balance of external, frictional, and elastic forces along the NW. The distributed friction force was determined for two cases: (i) the NW was uniformly dragged at its midpoint and bent by kinetic friction forces and (ii) the NW was held in a bent state by static friction forces. The first case considers a uniform distribution of kinetic friction along the NW and enables the measurement of the friction force from the elastically deformed NW profile. The second case exploits the interplay between static fr…

Uniform distribution (continuous)Materials scienceMechanical EngineeringBent molecular geometryNanowireNanotechnologySubstrate (electronics)MechanicsTribologyCondensed Matter PhysicsKinetic energyMomentumMechanics of MaterialsGeneral Materials ScienceWaferJournal of Materials Research
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Power monitoring in dielectric-loaded plasmonic waveguides with internal Wheatstone bridges

2013

We report on monitoring the mode power in dielectric-loaded surface plasmon polariton waveguides (DLSPPWs) by measuring the resistance of gold electrodes, supporting the DLSPPW mode propagation, with internal (on-chip) Wheatstone bridges. The investigated DLSPPW configuration consisted of 1-μm-thick and 10-μm-wide cycloaliphatic acrylate polymer ridges tapered laterally to a 1-μm-wide ridge placed on a 50-nm-thin and 4-um wide gold stripe, all supported by a ~1.7-µm-thick Cytop layer deposited on a Si wafer. The fabricated DLSPPW power monitors were characterized at telecom wavelengths, showing very high responsivities reaching up to ~6.4 μV/μW (for a bias voltage of 245 mV) and the operati…

Wheatstone bridgeMaterials sciencebusiness.industryPhotonic integrated circuitBiasing02 engineering and technologyDielectric021001 nanoscience & nanotechnology01 natural sciencesSurface plasmon polaritonAtomic and Molecular Physics and Opticslaw.invention010309 opticsWavelengthOpticslaw0103 physical sciencesElectrodeWafer0210 nano-technologybusinessOptics Express
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