Search results for "X-Ray Fluorescence"
showing 10 items of 53 documents
X-ray fluorescence analysis by the fundamental parameters method without explicit knowledge of the excitation beam spectrum
2000
The results of analyses carried out with the fundamental parameters method without explicit knowledge of the beam exciting the sample are presented. The excitation beam is described by means of the fluorescence produced by a set of thick or thin targets of pure chemical elements. The results are compared with those obtained by using a semi-empirical model and an adjusted spectrum model, all sets of results being in turn compared with the actual chemical composition of the samples. It is concluded that the description of the excitation beam by means of the fluorescence produced on targets of pure elements is suitable for use with the fundamental parameters method. Copyright © 2000 John Wiley…
Applications of the X-ray fluorescence analysis to the cultural patrimony of the Comunidad Valenciana (Spain): Painting, metal and paper
1999
We present examples of the application of the X-ray fluorescence (XRF) to the study of the artistic and cultural patrimony of the Comunidad Valenciana in the following areas: a) Valencian paintings of the XV and XVI centuries; b) silver ornaments coming from Iberian towns (s. III b.C.); c) ink and paper samples in manuscripts and engravings of the XVII and XIX centuries. The non destructive analyses are carried out “in situ” using a XRF system that consists of a tube of X-rays of 50 kV and 1 mA, and a detector of Si(Li) with an energy resolution 140 eV (FWHM at 5.9 keV).
Analytical Study of Raw Materials of Zinc Oxide Used for Enamels on Industrial Ceramics: Quantitative Analysis of Zinc, Lead, and Sulfur in These Sam…
2006
Abstract An analytical study is carried out to optimize X‐ray fluorescence (XRF) and flame atomic absorption spectrometry (FAAS) quantitative analysis of Zn, Pb, and S in ZnO samples commonly used to obtain industrial ceramic enamels. Pb and S in the raw materials often contaminate ZnO and are very detrimental in industrial applications. Thus, very accurate analytical determination of these elements in ceramic samples is extremely important. First of all, a mineralogical study by X‐ray diffraction (XRD) on the different components in these raw materials and the materials produced during the firing process is performed in order to establish the mineral forms in a reference sample for analysi…
X-ray fluorescence analysis of yellow pigments in altarpieces by Valencian artists of the XV and XVI centuries
1999
Abstract XRF analysis has allowed a quick and precise detection and identification of the inorganic elements that compose the yellow pigments in altarpieces of the XV and XVI centuries painted by the Valencian artists Miguel Alcaniz, Vicente Macip, Juan de Juanes, Hernando Yanez de la Almedina and Hernando Llanos. The analyses have been carried out with an XRF portable system that consists of a tube of X-rays and detectors of Si(Li) and cadmium zinc telluride. This system has enabled a non-aggressive and non-destructive analysis of many pieces at the Museo de Bellas Artes of Valencia (Spain). Among the yellow pigments we have identified a pigment composed by lead and tin oxides named lead–t…
Laboratory astrophysics and microanalysis with NTD-germanium-based X-ray microcalorimeters
2000
With the ability to create cosmic plasma conditions in the laboratory it is possible to investigate the dependencies of key diagnostic X-ray lines on density, temperature, and excitation conditions that exist in astrophysical sources with X-ray optics and a high-resolution X-ray microcalorimeter. The same instrumentation can be coupled to scanning electron microscopes or X-ray fluorescence probes to analyze the elemental and chemical composition of electronic, biological, geological and particulate materials. We describe how our microcalorimeter and X-ray optics provide significantly improved capabilities for laboratory astrophysics and microanalysis.
Analysis of toxic elements in plastic components for toys. Multi-elemental determination by x-ray fluorescence
1993
Abstract An x-ray fluorescence method is proposed for the multi-elemental determination of toxic elements in plastic articles for children, viz., Sb(III), Ba, Cd, Cr(III), Hg, Pb and As(III). Mineralization is achieved by using molten sodium hydroxide to decompose the organic matrix, with sodium nitrate as auxiliary oxidant. Stable solutions containing the chemical species for analysis are obtained. The species are separated from the solution by (co)precipitation, in a medium of NH+4-NH3 buffer (pH 8.5) with sodium diethyldithiocarbamate, sodium rhodizonate and Fe3+, which acts as a carrier. The precipitates deposited on filter-paper are placed in the x-ray spectrometer in fine layer morpho…
"Historical pigments characterisation by quantitative X-ray fluorescence"
2014
Abstract Most of the historical paints are mainly constituted by inorganic pigments, either pure or mixed, spread on the surfaces using different binding agents. The knowledge of the exact amount of different constituents of the paint, as well as of the mixing and pictorial techniques, is crucial for a careful program of conservation of polychrome works. Moreover, since the availability of these pigments has been changing through the centuries, their identification and chemical characterisation is useful to acquire or deepen information about the artist and his/her work. This information can also be useful for authentication purposes through relative dating because the identification of one…
A selective microscale x-ray fluorescence analyzing method for determination of trace elements
1973
Abstract A new selective X-ray fluorescence analyzing method for trace element determination has been developed. In this method each trace element is measured independently. The excitation source is an X-ray tube that has a changeable anode and a variable high voltage. The exciting radiation is shaped with critical absorbers. The sample is viewed at backward angles through an absorber to reduce backscattered radiation. The estimated accuracy of this method is of the order of 10 per cent in thesub-ppm range of trace element concentration in organic samples. Measurement times are of the order of a few minutes.
Spontaneous core–shell elemental distribution in In-rich In(x)Ga1-xN nanowires grown by molecular beam epitaxy.
2014
International audience; The elemental distribution of self-organized In-rich InxGa1-xN nanowires grown by plasma-assisted molecular beam epitaxy has been investigated using three different techniques with spatial resolution on the nanoscale. Two-dimensional images and elemental profiles of single nanowires obtained by x-ray fluorescence and energy-dispersive x-ray spectroscopy, respectively, have revealed a radial gradient in the alloy composition of each individual nanowire. The spectral selectivity of resonant Raman scattering has been used to enhance the signal from very small volumes with different elemental composition within single nanowires. The combination of the three techniques ha…
Characterization of single semiconductor nanowires by synchrotron radiation nanoprobe
2012
In this work, we report on the results of the characterization of single semiconductor nanowires by x-ray fluorescence nanoprobe. Wurtzite InGaN and Co-implanted ZnO single nanowires were studied. Ternary semiconductor nanowires show an axial inhomogeneous elemental distribution, with Ga accumulating at the bottom and In at the top of the wires. The ZnO NWs, on the other hand, show a homogeneous distribution of the Co implanted along the nanowires, without signatures of clustering or segregation effects induced by the implantation. No signatures of unintentional doping are observed neither in the InGaN nor the ZnO NWs. These overall results demonstrate the suitability of X-ray fluorescence …