Search results for "ellipsometry"
showing 10 items of 49 documents
Ellipsometric thickness and coverage of physisorbed layers of Xe, Kr, Ar and N2 on graphite
1990
Multilayer isotherms of Xe, Kr, Ar and N2 physisorbed on graphite (001) have been studied by ellipsometry. It is shown that the model of Dignam and Fedyk provides an excellent basis for the interpretation of the ellipsometric thickness in terms of the coverage and the polarizability of the admolecules. For N2 conclusions concerning the orientation of the molecule are drawn.
Segregation of lipid in Ir-dye/DMPA mixed monolayers as strategy to fabricate 2D supramolecular nanostructures at the air–water interface
2008
A novel pseudospherical fluorinated iridium(III) derivative, Ir-dye/PF6, [Ir(F2-ppy)2(bpy)]PF6 (F2-ppy = 2-(2,4-difluoro)phenylpyridine, bpy = 2,2′-bipyridine), has been organized by using a lipid matrix, DMPA (dimyristoyl-phosphatidic acid), in several molar ratios at the air–water interface. The molecular organization of both components and the degree of miscibility in the different mixed films have been inferred by surface techniques such as π–A isotherms, ellipsometry, reflection spectroscopy, Brewster angle microscopy (BAM), and IR spectroscopy for the LB films, additionally the results have been discussed according to the additivity rule. The equimolecular Ir-dye/DMPA mixture leads to…
Thermo‐optical investigations of NaNbO 3 thin films by spectral ellipsometry
2009
In this work a spectroscopic ellipsometry was applied to the thermo-optical investigations of sodium niobate NaNbO3 (NN) thin films at the wide temperature range of 5–820 K. The temperature dependence of complex refractive index dispersions and optical bang energy of the direct allowed electron transitions were evaluated. Additionally dynamic scans of the main ellipsometric angles at the several fixed wave lengths of 300, 400, 500 and 635 nm were performed to acquire more detailed temperature dependences of the refractive index and extinction coefficient. Pronounced minima/maxima and substantial jumps in the temperature dependence of complex refractive index and band gap energy were found a…
Enhanced Reflectivity Change and Phase Shift of Polarized Light: Double Parameter Multilayer Sensor
2022
Herein, the concept of point of darkness based on polarized light phase difference and absorption of light is demonstrated by simulations using low refractive index and extinction coefficient semiconductor and dielectric, and high refractive index nonoxidizing metal multilayer thin film structures. Several multilayer sensor configurations show great sensitivity to thickness and refractive index variation of the detectable material by measuring the reflectivity ratio {\Psi} and phase shift {\Delta}. Focus is on such multilayers, which have sensitivity to both parameters ({\Psi}, {\Delta}) in the visible spectral range, thus opening the possibility for further research on a new biomedical sen…
Above-bandgap ordinary optical properties of GaSe single crystal
2009
We report above-bandgap ordinary optical properties of ε-phase GaSe single crystal. Reference-quality pseudodielectric function 〈ε(E)〉 = 〈ε1(E)〉+i〈ε2(E)〉 and pseudorefractive index 〈N(E)〉 = 〈n(E)〉+i〈k(E)〉 spectra were measured by spectroscopic ellipsometry from 0.73 to 6.45 eV at room temperature for the light polarization perpendicular to the optic axis (math⊥math). The 〈ε〉 spectrum exhibited several interband-transition critical-point structures. Analysis of second-energy derivatives calculated numerically from the measured data yielded the critical-point energy values. Carmen.Martinez-Tomas@uv.es
Thermo-optical studies of NaNbO3thin films
2007
Thermo-optical studies of sodium niobate NaNbO3 (NN) thin films, deposited by the pulsed laser ablation technique on Si/SrRuO3 substrates, were performed by spectroscopic ellipsometry in the temperature range 300-550°C. Optical constants at the room temperature were measured in the spectral range 250-1000 nm. Substantial changes in the refractive index temperature behaviour (taken at λ = 300 nm) were found at temperatures 370, 445, 503, 520, and 532°C, where the first and the last temperatures are the phase transitions P → R and S → T1, respectively. Other temperatures (445, 503, and 520°C) are suggested as the points of some local structural changes in the NN film.
Experimental characterization of micromechanical and microphological properties of nickel base alloys strained by the growth of an ovide payer made i…
2011
The loss of the corrosion resistance of the alloy 600, a nickel base alloy, during the oxidation in pressurized water reactor (PWR) has been demonstrated by many studies. It induces the intergranular stress corrosion cracking (IGSCC). If the chemical composition and the structure of the growing oxide are well-known, the mechanical influence of the oxide on the alloy has not been fully studied, yet. This study aims at bringing new knowledge of the oxidation impact on the mechanical response of the alloy. A new methodology is introduced for determining the local nanodeformation of the alloy 600 induced either by an oxidation or by a tensile loading. This method is based on nanodots disposed a…
Pulmonary surfactant protein C containing lipid films at the air-water interface as a model for the surface of lung alveoli.
1995
The pulmonary surfactant lines as a complex monolayer of lipids and proteins the alveolar epithelial surface. The monolayer dynamically adapts the surface tension of this interface to the varying surface areas during inhalation and exhalation. Its presence in the alveoli is thus a prerequisite for a proper lung function. The lipid moiety represents about 90% of the surfactant and contains mainly dipalmitoylphosphatidylcholine (DPPC) and phosphatidylglycerol (PG). The surfactant proteins involved in the surface tension adaption are called SP-A, SP-B and SP-C. The aim of the present investigation is to analyse the properties of monolayer films made from pure SP-C and from mixtures of DPPC, DP…
Measurements of thickness dispersion in biolayers by scanning force microscopy and comparison with spectroscopic ellipsometry analysis.
2007
Measuring the thickness of biological films remains a difficult task when using differential measurements by atomic force microscopy (AFM). The use of microstructured substrates combined with a selective adsorption constitutes an alternative to tribological measurements. The statistical thickness analysis of biological layers, especially via the dispersion measurements, can provide a way to quantify the molecular orientation. AFM thicknesses were then compared with those obtained optically by spectroscopic ellipsometry (SE) and surface plasmon resonance enhanced ellipsometry (SPREE). The biolayers could then be modeled using a vertical gradient of optical index, which reflects height disper…
Quantifying the Composition of Methylammonium Lead Iodide Perovskite Thin Films with Infrared Spectroscopy
2019
Lead halide perovskites (ABX3) are generally formed from a reaction of the lead halide salt (BX2) with the halide salt of the A cation (AX). The effects of varying film compositions as result of non-stoichiometric precursor ratios on electronic properties of halide perovskites are currently under debate. It is imperative, but experimentally challenging, to determine the chemical composition of thin films as a function of precursor ratio for a full understanding of the effect. Herein we report a precise quantification of the methylammonium (MA) content in differently fabricated films of MAPbI3 via infrared (IR) spectroscopy. We compare the thin film data to the first high quality dielectric …