Search results for "engineering"

Experimental Equipment for Studying the Residual Stresses Developed During High Temperature Reactions by X-Ray Diffraction

1996

This paper describes a device dedicated to studyng, by X-ray diffraction the residual stresses developed on surface samples as a function of temperature and atmosphere conditions. The setup consists of : a.) an horizontal axis goniometer which allows the programmed positionning of the sealed X-ray source and of the linear detector. b.) a high temperature controlled atmosphere chamber Particular attention has been paid to the thermal stability up to 1200°C and the accurate position on the sample.

X-ray diffraction and Raman spectroscopy studies in Na1/2Bi1/2TiO3-SrTiO3-PbTiO3 solid solutions

2016

The long and short range orders in 0.4Na1/2Bi1/2TiO3-(0.6-x)SrTiO3-xPbTiO3 solid solutions were studied by x-ray diffraction and Raman spectroscopy. X-ray diffraction patterns for these composition...

High quality epitaxial Mn 2 Au (001) thin films grown by molecular beam epitaxy

2020

The recently discovered phenomenon of Neel spin–orbit torque in antiferromagnetic Mn2Au [Bodnar et al., Nat. Commun. 9, 348 (2018); Meinert et al., Phys. Rev. Appl. 9, 064040 (2018); Bodnar et al., Phys. Rev. B 99, 140409(R) (2019)] has generated huge interest in this material for spintronics applications. In this paper, we report the preparation and characterization of high quality Mn2Au thin films by molecular beam epitaxy and compare them with magnetron sputtered samples. The films were characterized for their structural and morphological properties using reflective high-energy electron diffraction, x-ray diffraction, x-ray reflectometry, atomic force microscopy, and temperature dependen…

Structure and dielectric properties of Na0.5Bi0.5TiO3-CaTiO3 solid solutions

2016

Despite wide studies of Na0.5Bi0.5TiO3, structure of this material and its connection with the observed physical properties still raise numerous questions due to mutually contradicting results obtained. Here, structure and dielectric properties of poled and unpoled Na0.5Bi0.5TiO3-CaTiO3 solid solutions are studied, projecting the obtained concentration dependence of structure and dielectric properties on pure Na0.5Bi0.5TiO3 as the end member of this material group. X-ray diffraction patterns for Na0.5Bi0.5TiO3-CaTiO3 solid solutions reveal dominating of an orthorhombic Pnma phase, even for the compositions approaching the end composition (Na0.5Bi0.5TiO3), whereas structure of pure Na0.5Bi0.…

Simultaneous Synthesis and Consolidation of Nanostructured MoSi2

2002

A new process combining electric field activation and the imposition of pressure from mechanically activated powder mixtures is demonstrated as a means to simultaneously synthesize and densify nano-MoSi2 in one step. Nanophase reactants (Mo + 2Si) produced by mechanical activation are reacted by field activation with the simultaneous application of a uniaxial pressure. Mo + 2Si powders were comilled in a specially designed planetary mill to obtain nanometric reactants but to avoid formation of any product phases. These were then subjected to high alternating currents (1600 A) and pressures of 106 MPa. Under these conditions, a reaction is initiated and completed within a short period of tim…

Correlative study of structural and optical properties of ZnSe under severe plastic deformation

2019

The effect of plastic deformation on the optical and structural properties of ZnSe crystals has been investigated. The optical properties have been monitored by cathodoluminescence measurements as a function of the deformation degree. Remarkable differences in the defect-related emissions from the most severely deformed areas have been encountered. Deformation of the crystal lattice of ZnSe, associated with slip phenomena, has been studied by means of Electron Backscattered Diffraction and micro-Raman spectroscopy. The relation between the deformation and the optical properties of the ZnSe crystals has been described.

Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM

2019

Abstract Electron diffraction is a powerful characterization method that is used across different fields and in different instruments. In particular, the power of transmission electron microscopy (TEM) largely relies on the capability to switch between imaging and diffraction mode enabling identification of crystalline phases and in-depth studies of crystal defects, to name only examples. In contrast, while diffraction techniques have found their way into the realm of scanning electron microscopy (SEM) in the form of electron backscatter diffraction and related techniques, on-axis transmission diffraction is still in its infancy. Here we present a simple but versatile setup that enables a ‘…

Fast-ADT: A fast and automated electron diffraction tomography setup for structure determination and refinement.

2020

Abstract Electron crystallography has focused in the last few years on the analyses of microcrystals, mainly organic compounds, triggered by recent publications on acquisition methods based on direct detection cameras and continuous stage tilting. However, the main capability of a transmission electron microscope is the access to features at the nanometre scale. In this context, a new acquisition method, called fast and automated diffraction tomography (Fast-ADT), has been developed in form of a general application in order to get the most of the diffraction space from a TEM. It consists of two subsequent tilt scans of the goniometric stage; one to obtain a crystal tracking file and a secon…

Radial composition of single InGaN nanowires: a combined study by EDX, Raman spectroscopy, and X-ray diffraction

2013

Quasi-parallel precession diffraction: Alignment method for scanning transmission electron microscopes.

2018

Abstract A general method to set illuminating conditions for selectable beam convergence and probe size is presented in this work for Transmission Electron Microscopes (TEM) fitted with µs/pixel fast beam scanning control, (S)TEM, and an annular dark field detector. The case of interest of beam convergence and probe size, which enables diffraction pattern indexation, is then used as a starting point in this work to add 100 Hz precession to the beam while imaging the specimen at a fast rate and keeping the projector system in diffraction mode. The described systematic alignment method for the adjustment of beam precession on the specimen plane while scanning at fast rates is mainly based on …