Search results for "fault"

showing 10 items of 610 documents

Optical properties of wurtzite GaN/AlN quantum dots grown on non-polar planes: the effect of stacking faults in the reduction of the internal electri…

2016

The optical emission of non-polar GaN/AlN quantum dots has been investigated. The presence of stacking faults inside these quantum dots is evidenced in the dependence of the photoluminescence with temperature and excitation power. A theoretical model for the electronic structure and optical properties of non-polar quantum dots, taking into account their realistic shapes, is presented which predicts a substantial reduction of the internal electric field but a persisting quantum confined Stark effect, comparable to that of polar GaN/AlN quantum dots. Modeling the effect of a 3 monolayer stacking fault inside the quantum dot, which acts as zinc-blende inclusion into the wurtzite matrix, result…

Materials sciencePhotoluminescenceStackingFOS: Physical sciences02 engineering and technologyElectronic structure01 natural sciencessymbols.namesakeCondensed Matter::Materials ScienceMesoscale and Nanoscale Physics (cond-mat.mes-hall)0103 physical sciencesGeneral Materials Science[PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]ComputingMilieux_MISCELLANEOUSWurtzite crystal structure010302 applied physics[PHYS]Physics [physics]Condensed matter physicsCondensed Matter - Mesoscale and Nanoscale PhysicsMechanical EngineeringQuantum-confined Stark effectCiència dels materials021001 nanoscience & nanotechnologyCondensed Matter PhysicsCondensed Matter::Mesoscopic Systems and Quantum Hall EffectStark effectMechanics of MaterialsQuantum dotsymbolsCristalls0210 nano-technologyStacking fault
researchProduct

Twin coarsening in CdTe(111) films grown on GaAs(100)

2006

Abstract We present a scanning force microscopy study of twin coarsening in CdTe(1 1 1) films grown on GaAs(1 0 0). Two types of CdTe(1 1 1) twins grow epitaxially and with equal probability on the long-range wavy surface structure developed by previous in situ annealing of the GaAs(1 0 0) substrate. Due to this initial substrate wavy structure, the grain coarsening during film growth leads to a quasi-one-dimensional rippled pattern. We propose a coarsening mechanism between twins driven by the formation of stacking faults.

Materials sciencePolymers and PlasticsCondensed matter physicsAnnealing (metallurgy)business.industryMetals and AlloysStackingEpitaxyMicrostructureCadmium telluride photovoltaicsElectronic Optical and Magnetic MaterialsCrystallographySemiconductorCeramics and CompositesCrystal twinningbusinessStacking faultActa Materialia
researchProduct

Unstable behaviour of normally-off GaN E-HEMT under short-circuit

2018

The short-circuit capability of power switching devices plays an important role in fault detection and the protection of power circuits. In this work, an experimental study on the short-circuit (SC) capability of commercial 600 V Gallium Nitride enhancement-mode high-electron-mobility transistors (E-HEMT) is presented. A different failure mechanism has been identified for commercial p-doped GaN gate (p-GaN) HEMT and metal-insulator-semiconductor (MIS) HEMT. In addition to the well known thermal breakdown, a premature breakdown is shown on both GaN HEMTs, triggered by hot electron trapping at the surface, which demonstrates that current commercial GaN HEMTs has requirements for improving the…

Materials scienceThermal breakdownGallium nitrideFailure mechanism02 engineering and technologyHigh-electron-mobility transistor01 natural sciencesFault detection and isolationlaw.inventionchemistry.chemical_compoundlaw0103 physical sciencesMaterials ChemistryElectrical and Electronic Engineering010302 applied physicsbusiness.industryTransistorNormally off021001 nanoscience & nanotechnologyCondensed Matter PhysicsElectronic Optical and Magnetic MaterialschemistryOptoelectronics0210 nano-technologybusinessShort circuitSemiconductor Science and Technology
researchProduct

Optical Probing (EOFM/TRI): A large set of complementary applications for ultimate VLSI

2013

International audience; Electro Optical Techniques (EOFM: Electro Optical Frequency Mapping and EOP: Electro Optical Probing) and Dynamic Light Emission Techniques (TRE: Time Resolved Emission and TRI: Time Resolved Imaging) are dynamic optical probing techniques widely used at IC level for design debug and defect localization purpose. They can pinpoint the origin of timing issue or logic fault in up to date CMOS devices. Each technique has its advantages and its drawbacks allowing a common set of applications and more specific ones. We have been involved in the development of the most advanced techniques related to EOFM and TRI on various devices (down to 28nm technology). What we can expe…

Materials science[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI] Engineering Sciences [physics][SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronicsmedia_common.quotation_subjectComputerApplications_COMPUTERSINOTHERSYSTEMS02 engineering and technologyFault (power engineering)01 natural sciencesSet (abstract data type)[SPI]Engineering Sciences [physics]Optical frequenciesOptical probing0103 physical sciencesElectronic engineering[ SPI ] Engineering Sciences [physics][SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronicsmedia_common010302 applied physicsVery-large-scale integration021001 nanoscience & nanotechnologyCMOSDebugging[SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicLight emission[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonic0210 nano-technology
researchProduct

Wireless partial discharge tracking on cross-linked polyethylene MV and HV cables

2018

Medium voltage (MV)/high voltage (HV) cable lines are high-value assets and require substantial costs for their installation or replacement. For this reason, the capability to assess the condition of cable lengths and accessories on site is of great importance. Cross-linked polyethylene (XLPE) insulation is extensively used for MV, HV, and extra-high voltage (EHV) class cables [1] thanks to its excellent voltage-endurance and thermomechanical properties. In particular, XLPE-insulated cables feature substantially lower losses, easier manufacturing and jointing procedures, better environmental compatibility, and higher operating temperature compared with impregnated paper cables, which lead t…

Materials sciencecross-linked polyethylene insulation01 natural scienceschemistry.chemical_compoundOperating temperaturepower cable testing0103 physical sciencesWirelessPower cablefault locationElectrical and Electronic Engineeringcable insulation010302 applied physicsCross-linked polyethylenebusiness.industryElectronic Optical and Magnetic Material010401 analytical chemistryElectrical engineeringfault diagnosiHigh voltagePolyethylene0104 chemical sciencesElectronic Optical and Magnetic Materialspartial dischargechemistryPartial dischargebusinesspower cableVoltageIEEE Electrical Insulation Magazine
researchProduct

A General Methodology for Short-circuit Calculations in Hybrid AC/DC Microgrids

2023

In this paper, the issues related to short-circuit calculations in hybrid AC/DC microgrids are discussed. The reference standard for short-current calculations in DC systems is the IEC 61660, which provides a mathematical formulation of the problem. The standard only includes radial DC grids and does not consider a more complex system, such as meshed DC systems or a hybrid AC/DC microgrid. This paper proposes a generalized approach that can be used independently of the characteristics of the hybrid system. The proposed approach is applied to four test microgrids with different distributed sources and number of nodes and the results are compared with those obtained simulating the same grids …

Mathematical modelsStandardsResistanceShort-circuit currentsVoltageIEC StandardsShort-circuithybrid systemsIndustrial and Manufacturing EngineeringSettore ING-IND/33 - Sistemi Elettrici Per L'EnergiaAC/DC MicrogridsControl and Systems EngineeringMicrogridsElectrical and Electronic EngineeringFault calculationIEEE Transactions on Industry Applications
researchProduct

Discrete-timeH −  ∕ H ∞ sensor fault detection observer design for nonlinear systems with parameter uncertainty

2013

SUMMARY This work concerns robust sensor fault detection observer (SFDO) design for uncertain and disturbed discrete-time Takagi–Sugeno (T–S) systems using H −  ∕ H ∞ criterion. The principle of the proposed approach is based on simultaneously minimizing the perturbation effect and maximizing the fault effect on the residual vector. Furthermore, by introducing slack decision matrices and taking advantage of the descriptor formulation, less conservative sufficient conditions are proposed leading to easier linear matrix inequalities (LMIs). Moreover, the proposed (SFDO) design conditions allow dealing with unmeasurable premise variables. Finally, a numerical example and a truck–trailer system…

Mathematical optimizationMechanical EngineeringGeneral Chemical EngineeringBiomedical EngineeringAerospace EngineeringPerturbation (astronomy)ResidualIndustrial and Manufacturing EngineeringFault detection observerSystem modelNonlinear systemDiscrete time and continuous timeControl and Systems EngineeringControl theoryDecision matrixElectrical and Electronic EngineeringDesign methodsMathematicsInternational Journal of Robust and Nonlinear Control
researchProduct

A multi-objective strategy for concurrent mapping and routing in networks on chip

2009

The design flow of network-on-chip (NoCs) include several key issues. Among other parameters, the decision of where cores have to be topologically mapped and also the routing algorithm represent two highly correlated design problems that must be carefully solved for any given application in order to optimize several different performance metrics. The strong correlation between the different parameters often makes that the optimization of a given performance metric has a negative effect on a different performance metric. In this paper we propose a new strategy that simultaneously refines the mapping and the routing function to determine the Pareto optimal configurations which optimize averag…

Mathematical optimizationNetwork on a chipRobustness (computer science)Computer scienceMultipath routingAlgorithm designFault toleranceNetwork topologyMulti-objective optimization2009 IEEE International Symposium on Parallel & Distributed Processing
researchProduct

Default Mode Network Efficiency Is Correlated With Deficits in Inhibition in Adolescents With Inhalant Use Disorder

2020

It is well established that alterations in cognitive function and damage to brain structures are often found in adolescents who have substance use disorder (SUD). However, deficits in executive cognitive functioning in adolescents related to the vulnerability and consumption of such substances are not well known. In this study, we use graph theoretic analysis to compare the network efficiency in the resting state for three networks---default mode network (DMN), salience network (SN) and fronto-parietal network (FPN)---between inhalant-consuming adolescents and a control group (12 to 17 years old). We analysed whether the efficiency of these functional networks was related to working memory,…

Mediation (statistics)lcsh:RC435-571executive-functionresting-state functional magnetic resonance imaging03 medical and health sciences0302 clinical medicinelcsh:PsychiatrymedicineadolescentsCognitive skillDefault mode networkOriginal ResearchPsychiatryResting state fMRIsubstance use disorderWorking memoryfunctional connectivityCognitive flexibilityCognitionmedicine.disease030227 psychiatrySubstance abusePsychiatry and Mental healthPsychology030217 neurology & neurosurgeryClinical psychologyFrontiers in Psychiatry
researchProduct

Transtensional/extensional fault activity from the Mesozoic rifting to Tertiary chain building in Northern Sicily (Central Mediterranean)

2005

Extensional structures of different ages characterize the Sicilian fold-and-thrust belt. Normal faults ranging in geometry from stepped to listric and formed in different geodynamic settings significantly controlled the pattern of syn-tectonic deposits. Since Mesozoic times Sicily has experienced deformation related to the opening of the Tethys Ocean. Between the Upper Triassic and the Cretaceous normal, strike- and oblique-slip faults, developed in northern Sicily, in the framework of a transtensional deformation regime induced by the oblique rifting of the African and European continental passive margins. Since Tertiary times a reversal in the general relative plate motion induced converg…

Mesozoic-Tertiary Sicilian Maghrebian Chain modes of extension basin formation normal faults
researchProduct