Search results for "photoemission electron"
showing 10 items of 55 documents
Near Field of Strongly Coupled Plasmons: Uncovering Dark Modes
2012
Strongly coupled plasmons in a system of individual gold nanoparticles placed at subnanometer distance to a gold film (nanoparticle-on-plane, NPOP) are investigated using two complementary single particle spectroscopy techniques. Optical scattering spectroscopy exclusively detects plasmon modes that couple to the far field via their dipole moment (bright modes). By using photoemission electron microscopy (PEEM), we detect in the identical NPOPs near-field modes that do not couple to the scattered far field (dark modes) and are characterized by a strongly enhanced nonlinear electron emission process. To our knowledge, this is the first time that both far- and near-field spectroscopy are carr…
PEEM with high time resolution—imaging of transient processes and novel concepts of chromatic and spherical aberration correction
2006
The potential of time-resolved photoemission electron microscopy (PEEM) for imaging ultrafast processes and for aberration correction in full-field imaging is discussed. In particular, we focus on stroboscopic imaging of precessional magnetic excitations via XMCD-PEEM exploiting the time structure of synchrotron radiation (magnetic field pulse pump–X-ray probe). In a special bunch-compression mode at BESSY, a time resolution of about 15 ps has been obtained. Further, we discuss an all-optical pump–probe technique using femtosecond laser excitation. A highly promising alternative to stroboscopic imaging is an approach using time-resolved image detection. As a second application of time-resol…
Time-resolved photoemission electron microscopy of magnetic field and magnetisation changes
2003
Owing to its parallel image acquisition, photoemission electron microscopy is well suited for real-time observation of fast processes on surfaces. Pulsed excitation sources like synchrotron radiation or lasers, fast electric pulsers for the study of magnetic switching, and/or time-resolved detection can be utilised. A standard approach also being used in light optical imaging is stroboscopic illumination of a periodic (or quasi-periodic) process. Using this technique, the time dependence of the magnetic field in a pulsed microstrip line has been imaged in real time exploiting Lorentz-type contrast. Similarly, the corresponding field-induced changes in the magnetisation of cobalt microstruct…
Magneto-optical linear dichroism in threshold photoemission electron microscopy of polycrystalline Fe films.
2000
Magnetic linear dichroism in threshold photoemission has been exploited to obtain magnetic contrast in a photoemission electron microscope using a mercury arc lamp. The dichroism at threshold can be described similar to the magneto-optical Kerr effect in the region of visible light. The asymmetry of electron intensity observed for a 100 nm polycrystalline Fe film on silicon is A=(0.37+/-0.05)%. The asymmetry occurs for the geometry of the transverse Kerr effect. For unpolarized light the asymmetry was about half the value observed for linearly polarized light. Threshold photoemission microscopy has a large potential for high resolution magnetic domain imaging with fast data acquisition.
Image enhancement in photoemission electron microscopy by means of imaging time-of-flight analysis
2004
Abstract Photoemission electron microscopy (PEEM) is widely used in combination with synchrotron sources as a powerful tool to observe chemical and magnetic properties of metal and semiconductor surfaces. Presently, the resolution limit of these instruments using soft-X-ray excitation is limited to about 50 nm, because of the chromatic aberation of the electron optics used. Various sophisticated approaches have thus been reported for enhancing the spatial resolution in photoemission electron microscopy. This work demonstrates the use of a simple imaging energy filter based on electron time-of-flight (ToF) selection. The spatial resolution could be improved dramatically, even though the inst…
Photoemission time-of-flight spectromicroscopy of Ag nanoparticle films on Si(111)
2004
Abstract Time-of-flight photoemission electron microscopy was used to measure spatially resolved energy distribution curves of electrons emitted from Ag nanoparticle films with different mass thicknesses. Two-photon photoemission (2PPE) was induced by femtosecond laser pulse excitation with 3.1 eV photon energy and 200 fs pulse width. Regions of Ag nanoparticles with different average sizes and one region with a continuous 100 nm thick Ag film were deposited as a stepped wedge on a Si(1 1 1) substrate. Upon laser excitation the nanoparticle films exhibit a very high electron emission yield in the images, whereas the uncovered Si surface and the continuous Ag film are dark. The time-of-fligh…
Multiphoton photoemission electron microscopy using femtosecond laser radiation
2002
Abstract The interaction of intense, pulsed laser radiation with surfaces results in non-linear optical effects that are responsible for emission of electrons even if the photon energies are below the work function. In the present study, photoelectrons have been excited by means of femtosecond laser pulses from a frequency doubled Ti:sapphire laser with a photon energy of 3.1 eV. The spatial distribution of the photo emitted electrons was imaged using a photoemission electron microscope. All samples exhibit centres of enhanced second or higher order photoemission yield, so called ‘hot spots’. These ‘hot spots’ were preferentially excited with s-polarised light. This behaviour may be explain…
Surface magnetism studied by photoelectron spectromicroscopy with high spatial and time resolution
2004
Abstract Photoemission electron microscopy (PEEM) is widely used for the study of magnetic surfaces and thin films. Ferromagnetic and antiferromagnetic microstructures are investigated exploiting magnetic circular and linear dichroism in the soft X-ray range using tuneable synchrotron radiation. Local dichroism spectroscopy gives access to magnetic moments of the elements in compounds or multilayer materials. Beyond these achievements, the method bears a high future potential with respect to an increased lateral resolution via aberration correction of the electron optics and a high time resolution in the 100 ps range for the study of dynamic processes. In addition, photoelectron spin polari…
Recent progress in photoemission microscopy with emphasis on chemical and magnetic sensitivity
1997
Abstract With the improved access to synchrotron radiation sources photoemission electron microscopy is developing into a versatile analytical tool in surface and materials science. The broad spectral range and the well-defined polarization characteristics of synchrotron light permit a unique combination of topographic, chemical, and even magnetic investigations down to a mesoscopic scale. The potentiality of photoemission electron microscopy is demonstrated by several experiments on surfaces and microstructured thin film systems, which have been carried out with a newly designed instrument. We discuss its different modes of operation with respect to both microscopy and spectroscopy. A comb…
Photoabsorption and MXCD in photoemission microscopy for characterisation of advanced materials
1999
Abstract We applied chemical and magnetic sensitive photoemission electron microscopy (PEEM) to investigate surfaces of advanced materials. PEEM at low photon energies provides a high spatial resolution, but suffers from the lack of information about the chemical composition of the imaged surface. Such information can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired and subtracted microscopic images using photon energies just below and at the edges. The resulting difference gives a micro-image of the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of secondary electrons in…