Search results for "testing"

showing 10 items of 1769 documents

Contribution to the study and to the optimization of active thermographic process applied to surface crack detection

2017

The aim of this work is the detection of open and subjacent defects in metallic materials using laser-material interaction coupled with infrared thermography. This process is a possible alternative for magnetic particles testing and dye penetrant testing in the field of non-destructive testing. This work is divided into three main parties. At first, we have been interested in the characterization of optical and thermophysical properties of materials we used, in order to have good boundary conditions and also for the needs of temperatures fields measurements for validation. The second part concern the development of a numerical simulation model with two step approach: the first involves mode…

Non destructive testing[SPI.OTHER]Engineering Sciences [physics]/Other[ SPI.OTHER ] Engineering Sciences [physics]/OtherContrôle non destructif[SPI.OTHER] Engineering Sciences [physics]/OtherMatériauxLaserThermiqueMaterialNumerical experimental designThermographie infrarougeThermalInfrared thermographyPlans d'expériences numériques
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Guided-wave frequency doubling in surface periodically poled lithium niobate: competing effects

2007

We carried out second-harmonic generation in quasi-phase-matched ? -phase lithium niobate channel waveguides realized by proton exchange and surface periodic poling. Owing to a limited ferroelectric domain depth, we could observe the interplay between second-harmonic generation and self-phase modulation due to cascading and cubic effects, resulting in a nonlinear resonance shift. Data reduction allowed us to evaluate both the quadratic nonlinearity in the near infrared as well as the depth of the uninverted domains. © 2007 Optical

Nonlinear optics integrated opticsMaterials scienceGuided wave testingbusiness.industryLithium niobateNonlinear opticsSecond-harmonic generationPhysics::OpticsFOS: Physical sciencesStatistical and Nonlinear PhysicsHarmonic generation and mixingSettore ING-INF/01 - ElettronicaFerroelectricityAtomic and Molecular Physics and Opticschemistry.chemical_compoundOpticschemistryPeriodic polingNonlinear resonanceHigh harmonic generationbusinessPhysics - OpticsOptics (physics.optics)
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Ein Auswerteprogramm zur quantitativen Untersuchung der Lungenventilation mittels dynamischer MRT von hochpolarisiertem 3He

2004

Purpose: 3 He-MRI is able to visualize the regional distribution of lung ventilation with a temporal and spatial resolution so far unmatched by any other technique. The aim of the study was the development of a new software tool for quantification of dynamic ventilation parameters in absolute physical units. Materials and Methods: During continuous breathing, a bolus of hyperpolarized 3 He (300 ml) was applied at inspiration and a series of 168 coronal projection images simultaneously acquired using a 2D FLASH-sequence. Postprocessing software was developed to analyze the 3 He distribution in the lung. After correction for lung motion, several ventilation parameters (rise time, delay time, …

Normalization (statistics)Pathologymedicine.medical_specialtybusiness.industryComputer sciencemedicine.medical_treatmentlaw.inventionPulmonary function testingSoftwarelawVentilation (architecture)BreathingmedicineLung transplantationRadiology Nuclear Medicine and imagingLung emphysemabusinessImage resolutionBiomedical engineeringRöFo - Fortschritte auf dem Gebiet der Röntgenstrahlen und der bildgebenden Verfahren
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Language testing as part of integration policy in Norway

2016

In this paper, we present the two standardised tests of Norwegian for adult immigrants in Norway; Test i norsk – høyere nivå, developed by Norsk språktest, and Norskprøven for voksne innvandrere, developed by Skills Norway, the main focus being on Norskprøven, with which both authors are involved. We briefly introduce the tests and the assessment practice and policy in Norway, and the challenges we see for assessment policy in our country. To conclude, we express our concern towards an integration policy where more and stricter requirements are introduced, a development that we fear may lead to segregation and alienation rather than to integration. nonPeerReviewed

Norwayintegration policydigital testing
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Were the chaotic ELMs in TCV the result of an ARMA process?

2004

The results of a previous paper claiming the demonstration that edge localized mode (ELM) dynamics on TCV are chaotic in a number of cases has recently been called into question, because the statistical test employed was found to also identify linear auto regressive—moving average (ARMA) models as chaotic. The TCV ELM data has therefore been re-examined with an improved method that is able to make this distinction, and the ARMA model is found to be an inappropriate description of the dynamics on TCV. The hypothesis that ELM dynamics are chaotic on TCV in a number of cases is therefore still favoured.

Nuclear Energy and EngineeringComputer scienceChaoticImproved methodAutoregressive–moving-average modelArma processStatistical physicsCondensed Matter PhysicsEdge-localized modeStatistical hypothesis testingPlasma Physics and Controlled Fusion
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Methodologies for the Statistical Analysis of Memory Response to Radiation

2016

International audience; Methodologies are proposed for in-depth statistical analysis of Single Event Upset data. The motivation for using these methodologies is to obtain precise information on the intrinsic defects and weaknesses of the tested devices, and to gain insight on their failure mechanisms, at no additional cost. The case study is a 65 nm SRAM irradiated with neutrons, protons and heavy ions. This publication is an extended version of a previous study.

Nuclear and High Energy PhysicsEngineeringHardware_PERFORMANCEANDRELIABILITYRadiation[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]01 natural sciencesstatistical analysis0103 physical sciencesStatic testingElectronic engineeringmemory responseStatistical analysisSensitivity (control systems)Static random-access memoryElectrical and Electronic Engineeringstatic testCluster of bit-flipsdynamic test010302 applied physicsSingle event upset SEURandom access memoryta114ta213010308 nuclear & particles physicsbusiness.industrymultiple cell upset (MCU)säteilySRAMReliability engineeringradiationNuclear Energy and EngineeringSingle event upsetradiation effectsbusiness[MATH.MATH-NA]Mathematics [math]/Numerical Analysis [math.NA]Dynamic testing
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From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II

2008

The reference SEU Monitor system designed and presented in 2005 (R. H. SOslashrensen, F.-X. Guerre, and A. Roseng ldquoDesign, testing and calibration of a reference SEU monitor system,rdquo in Proc. RADECS, 2005, pp. B3-1-B3-7) has now been used by many researchers at many radiation test sites and has provided valuable calibration data in support of numerous projects. As some of these findings and results give new insight into improved inter-facility calibrations and provide additional inputs into ongoing SEE research, a few of the more interesting cases are presented. Furthermore the dasiadetector elementpsila, the Atmel AT60142F SRAM, now in a hybrid configuration, will form the key dete…

Nuclear and High Energy PhysicsEngineeringbusiness.industryDetectorOn boardRadiation testingNuclear Energy and EngineeringSingle event upsetCalibrationKey (cryptography)Electronic engineeringSatelliteStatic random-access memoryElectrical and Electronic EngineeringbusinessComputer hardwareIEEE Transactions on Nuclear Science
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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

2015

International audience; Various failure scenarios may occur during irradiation testing of SRAMs, which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

Nuclear and High Energy PhysicsEngineeringcomputer.software_genreUpsetCross section (physics)Static testingCluster of bit flipsStatic random-access memoryElectrical and Electronic Engineeringradiation testingstatic testCluster analysisdynamic test[PHYS]Physics [physics]single event upset (SEU)ta213ta114Cross sectionbusiness.industrySEFImultiple cell upset (MCU)SRAM[SPI.TRON]Engineering Sciences [physics]/ElectronicsRAMRadiation testingMicrocontrollerMCUNuclear Energy and EngineeringSEU clusterData miningbusinesscomputerDynamic testing
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SEE on Different Layers of Stacked-SRAMs

2015

International audience; This paper presents heavy-ion and proton radiation test results of a 90 nm COTS SRAM with stacked structure. Radiation tests were made using high penetration heavy-ion cocktails at the HIF (Belgium) and at RADEF (Finland) as well as low energy protons at RADEF. The heavy-ion SEU cross-section showed an unusual profile with a peak at the lowest LET (heavy-ion with the highest penetration range). The discrepancy is due to the fact that the SRAM is constituted of two vertically stacked dice. The impact of proton testing on the response of both stacked dice is presented. The results are discussed and the SEU cross-sections of the upper and lower layers are compared. The …

Nuclear and High Energy PhysicsSEE rateMaterials scienceProtonDiceRadiationLow energyProton radiation90 nmElectronic engineering90 nmStatic random-access memoryElectrical and Electronic Engineeringradiation testingstacked dice[PHYS]Physics [physics]single event upset (SEU)ta213ta114business.industrymultiple cell upset (MCU)SRAM[SPI.TRON]Engineering Sciences [physics]/ElectronicsRadiation testingNuclear Energy and EngineeringOptoelectronicsbusinessstatic and dynamic mode testingIEEE Transactions on Nuclear Science
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Analysis of the Photoneutron Field Near the THz Dump of the CLEAR Accelerator at CERN With SEU Measurements and Simulations

2022

We study the radiation environment near the terahertz (THz) dump of the CERN Linear Electron Accelerator for Research (CLEAR) electron accelerator at CERN, using FLUktuierende KAskade in German (FLUKA) simulations and single-event upset (SEU) measurements taken with 32-Mbit Integrated Silicon Solution Inc. (ISSI) static random access memories (SRAMs). The main focus is on the characterization of the neutron field to evaluate its suitability for radiation tests of electronics in comparison with other irradiation facilities. Neutrons at CLEAR are produced via photonuclear reactions, mostly initiated by photons from the electromagnetic cascades that occur when the beam is absorbed by the dump …

Nuclear and High Energy Physicsphotonuclear reactionsSEUsfotonitacceleratorCLEARelectronsneutronsneutronitsäteilylaitteethiukkaskiihdyttimetAccelerators and Storage RingsNuclear Energy and EngineeringsäteilyfysiikkaCERNPhysics::Accelerator PhysicsphotonsR2ESRAMsElectrical and Electronic Engineeringradiation testing
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