6533b863fe1ef96bd12c78ea
RESEARCH PRODUCT
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
Alexandre Louis BosserLuigi DililloHeikki KettunenGeorgios TsiligiannisViyas GuptaFrédéric WrobelAri VirtanenHelmut PuchnerArto JavanainenFrédéric Saignésubject
Nuclear and High Energy PhysicsEngineeringcomputer.software_genreUpsetCross section (physics)Static testingCluster of bit flipsStatic random-access memoryElectrical and Electronic Engineeringradiation testingstatic testCluster analysisdynamic test[PHYS]Physics [physics]single event upset (SEU)ta213ta114Cross sectionbusiness.industrySEFImultiple cell upset (MCU)SRAM[SPI.TRON]Engineering Sciences [physics]/ElectronicsRAMRadiation testingMicrocontrollerMCUNuclear Energy and EngineeringSEU clusterData miningbusinesscomputerDynamic testingdescription
International audience; Various failure scenarios may occur during irradiation testing of SRAMs, which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
year | journal | country | edition | language |
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2015-12-17 |