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RESEARCH PRODUCT

Digital pulse-shape analysis with a TRACE early silicon prototype

R. M. Perez-vidalAlberto PulliaS. CapraRamón J. AliagaA. GadeaM. AssiéD. BeaumelIsmael MartelEnrique SanchisC. BoianoV. V. ParkarJ. J. Valiente DobonD. MengoniT. HoudyV. Herrero-boschP. R. JohnJ.a. DueñasA. TriossiV. GonzálesL. GrassiA. Gottardo

subject

PhysicsNuclear and High Energy PhysicsSilicon detectorSiliconPhysics::Instrumentation and Detectorsbusiness.industryLight-charged particlesDetectorchemistry.chemical_element[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]Particle detectorParticle identificationSemiconductor detectorParticle identificationTECNOLOGIA ELECTRONICAOpticschemistryMeasuring instrumentGamma-ray spectroscopyCoaxialbusinessDigital pulse shape analysisInstrumentationElectronic circuit

description

[EN] A highly segmented silicon-pad detector prototype has been tested to explore the performance of the digital pulse shape analysis in the discrimination of the particles reaching the silicon detector. For the first time a 200 tun thin silicon detector, grown using an ordinary floating zone technique, has been shown to exhibit a level discrimination thanks to the fine segmentation. Light-charged particles down to few MeV have been separated, including their punch-through. A coaxial HPGe detector in time coincidence has further confirmed the quality of the particle discrimination. K.; 2014 Elsevier B.V. All rights reserved

yearjournalcountryeditionlanguage
2014-01-01
10.1016/j.nima.2014.07.054http://hdl.handle.net/11577/3169192