6533b7d0fe1ef96bd125a3d3
RESEARCH PRODUCT
Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing
Leona GilbertNitipon PuttaraksaMikko LaitinenPeter M. JonesK. RanttilaRattanaporn NoraratHarry J. WhitlowVarpu MarjomäkiMikko RossiVäinö HänninenP. HeikkinenTimo SajavaaraHenri Kivistösubject
Materials scienceIon beamta221Analytical chemistryHardware_PERFORMANCEANDRELIABILITYIon beam lithographyProton beam writingFront and back endsComputer Science::Hardware ArchitectureData acquisitionOpticsMicroscopyHardware_INTEGRATEDCIRCUITSElectrical and Electronic EngineeringField-programmable gate arrayHardware_REGISTER-TRANSFER-LEVELIMPLEMENTATIONta114business.industryta1182MicrobeamCondensed Matter PhysicsAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsPhysics::Accelerator Physicsbusinessdescription
Many ion-matter interactions exhibit [email protected] time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s^-^1 for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2013-02-01 | Microelectronic Engineering |