6533b7d6fe1ef96bd1267234

RESEARCH PRODUCT

Thermal annealing of radiation damage produced by swift 132Xe ions in MgO single crystals

Eugene A. KotominEvgeni Vasil'chenkoMaxim V. ZdorovetsAbdirash AkilbekovAnatoli I. PopovAleksandr LushchikV. N. KuzovkovE. ShabloninG. BaubekovaG. Baubekova

subject

010302 applied physicsNuclear and High Energy PhysicsMaterials sciencePhysics::Instrumentation and DetectorsMagnesiumAnnealing (metallurgy)KineticsAnalytical chemistrychemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnologyKinetic energy01 natural sciencesIonchemistry0103 physical sciencesOxygen ionsRadiation damageIrradiation0210 nano-technologyInstrumentation

description

Abstract The annealing kinetics of the electron-type F+ and F color centers in highly pure MgO single crystals irradiated by 0.23-GeV 132Xe ions with fluences covering three orders of magnitude (Φ = 5 × 1011 –3.3 × 1014 ions/cm2) are studied experimentally via dependence of the optical absorption on preheating temperature. The annealing data are analyzed in terms of the diffusion-controlled bimolecular reactions between F-type centers and complementary interstitial oxygen ions. The behavior of the main kinetic parameters – the migration energies and pre-exponential factors – for different irradiation fluences is discussed and compared with that for other wide-gap binary materials from previous studies.

10.1016/j.nimb.2019.11.013http://dx.doi.org/10.1016/j.nimb.2019.11.013