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RESEARCH PRODUCT
Effect of electron cyclotron resonance ion source frequency tuning on ion beam intensity and quality at Department of Physics, University of Jyväskylä.
Santo GamminoH. KoivistoDavid MascaliLuigi CelonaO. TarvainenO. SteczkiewiczT. RopponenVille ToivanenG. Ciavolasubject
PhysicsIon beamCyclotron resonanceHighly charged ionParticle acceleratorIon sourceElectron cyclotron resonancelaw.inventionlawPhysics::Accelerator PhysicsAtomic physicsInstrumentationIon cyclotron resonanceBeam (structure)description
Ion beam intensity and quality have a crucial effect on the operation efficiency of the accelerator facilities. This paper presents the investigations on the ion beam intensity and quality after the mass separation performed with the Department of Physics, University of Jyvaskyla 14 GHz electron cyclotron resonance ion source by sweeping the microwave in the 14.05–14.13 GHz range. In many cases a clear variation in the ion beam intensity and quality as a function of the frequency was observed. The effect of frequency tuning increased with the charge state. In addition, clear changes in the beam structure seen with the beam viewer were observed. The results confirmed that frequency tuning can have a remarkable effect on ion beam intensity and quality especially in the case of highly charged ion beams. The examples presented here represent the typical charge state behavior observed during the measurements.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2010-03-03 | The Review of scientific instruments |